Measurement of molecular mixing at a conjugated polymer interface by specular and off-specular neutron scattering

Hysteresis in phase volumes, compositions and interfacial roughness in model OPV-small-molecule/polymer thin-films

Domain morphology and composition, and the structure of interfaces between domains are key factors in the performance and stability of organic photovoltaics (OPVs) fabricated from polymer/small-molecule blends. In this study, we investigate the evolution of composition, phase-volume and interfacial roughness in model polymer/small-molecule bilayers, in response to thermal annealing. Polystyrene/fullerene mixing is studied as a function of annealing temperature, using in situ neutron reflectivity, in thin-film bilayer samples comprising pure component or mixed layers. Remarkably, we discover that thermal annealing at temperatures around or above the reported glass transition temperatures, Tg, of the components can result in extensive mass-transfer between layers, that has the superficial appearance of equilibration, but leaves the layer compositions, thicknesses, and/or the interfacial composition profile in a non-equilibrium state. This is not merely a case of slow kinetics near Tg, as subsequent heating to higher temperatures, followed by cooling, reveals pronounced hysteresis in these systems. This has important implications for the measurement of equilibrium compositions in polymer/small-molecule mixtures for OPV applications, and for device stability during operation.

2D reflectometry for the investigation of polymer interfaces: off-specular neutron scattering

Specular and off-specular neutron reflectometry have been used in a combined approach to study thin polymer films. Our goal in this work is to illustrate the power of the off-specular scattering technique to probe the properties of the buried interface of immiscible polymer bilayers of deuterated polystyrene and protonated poly(methyl methacrylate) (h-PMMA). The diffuse scattering stemming from these systems is discussed in relation to thermal fluctuations at the polymer/polymer interface, providing a means to extract in-plane correlation lengths from buried interfaces. In addition the onset of hole formation in the top layer is evidenced by the diffuse scattering, not easily detectable by specular reflection alone.

Combined specular and off-specular reflectometry: elucidating the complex structure of soft buried interfaces

Neutron specular reflectometry (SR) and off-specular scattering (OSS) are nondestructive techniques which, through deuteration, give a high contrast even among chemically identical species and are therefore highly suitable for investigations of soft-matter thin films. Through a combination of these two techniques, the former yielding a density profile in the direction normal to the sample surface and the latter yielding a depth-resolved in-plane lateral structure, one can obtain quite detailed information on buried morphology on length scales ranging from the order of ångströms to ∼10 µm. This is illustrated via quantitative evaluation of data on SR and OSS collected in time-of-flight (ToF) measurements of a set of films composed of immiscible polymer layers, protonated poly(methyl methacrylate) and deuterated polystyrene, undergoing a decomposition process upon annealing. Joint SR and OSS data analysis was performed by the use of a quick and robust originally developed algorithm including a common absolute-scale normalization of both types of scattering, which are intricately linked, constraining the model to a high degree. This, particularly, makes it possible to distinguish readily between different dewetting scenarios driven either by the nucleation and growth of defects (holes, protrusions etc.) or by thermal fluctuations in the buried interface between layers. Finally, the 2D OSS maps of particular cases are presented in different spaces and qualitative differences are explained, allowing also the qualitative differentiation of the in-plane structure of long-range order, the correlated roughness and bulk defects by a simple inspection of the scattering maps prior to quantitative fits.

The Search for Nanobubbles by Using Specular and Off-Specular Neutron Reflectometry

We apply specular and off-specular neutron reflection at the hydrophobic silicon/water interface to check for evidence of nanoscopic air bubbles whose presence is claimed after an ad hoc procedure of solvent exchange. Nanobubbles and/or a depletion layer at the hydrophobic/water interface have long been discussed and generated a plethora of controversial scientific results. By combining neutron reflectometry (NR), off-specular reflectometry (OSS), and grazing incidence small angle neutron scattering (GISANS), we studied the interface between hydrophobized silicon and heavy water before and after saturation with nitrogen gas. Our specular reflectometry results can be interpreted by assuming a submolecular sized depletion layer and the off-specular measurements show no change with nitrogen super saturated water. This picture is consistent with the assumption that, following the solvent exchange, no additional nanobubbles are introduced at significant concentrations (if present at all). Furthermore, we discuss the results in terms of the maximum surface coverage of nanobubbles that could be present on the hydrophobic surface compatibly with the sensitivity limit of these techniques.