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Hatayama S, Makino K, Saito Y. Phase-change behavior of RuSbTe thin film for photonic applications with amplitude-only modulation. Sci Rep 2024; 14:8839. [PMID: 38632394 PMCID: PMC11024172 DOI: 10.1038/s41598-024-59235-9] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/04/2024] [Accepted: 04/08/2024] [Indexed: 04/19/2024] Open
Abstract
Ge2Sb2Te5 (GST), the most mature phase-change materials (PCM), functions as a recoding layer in nonvolatile memory and optical discs by contrasting the physical properties upon phase transition between amorphous and crystalline phases. However, GST faces challenges such as a large extinction coefficient (k) and low thermal stability of the amorphous phase. In this study, we introduce RuSbTe as a new PCM to address the GST concerns. Notably, the crystallization temperature of the amorphous RuSbTe is approximately 350 °C, significantly higher than GST. A one-order-of-magnitude increase in the resistivity contrast was observed upon phase transition. The crystalline (0.35-0.50 eV) and amorphous (0.26-0.37 eV) phases exhibit relatively small band gap values, resulting in substantial k. Although RuSbTe demonstrates a k difference of approximately 1 upon crystallization at the telecommunications C-band, the refractive index (n) difference is negligible. Unlike GST, which induces both phase retardation and amplitude modulation in its optical switch device, RuSbTe exhibits amplitude-only modulation. This study suggests that RuSbTe has the potential to enable new photonic computing devices that can independently control the phase and amplitude. Combining RuSbTe with phase-only modulators could open avenues for advanced applications.
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Affiliation(s)
- Shogo Hatayama
- Semiconductor Frontier Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, Umezono 1-1-1, Tsukuba, 305-8568, Japan.
| | - Kotaro Makino
- Semiconductor Frontier Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, Umezono 1-1-1, Tsukuba, 305-8568, Japan
| | - Yuta Saito
- Semiconductor Frontier Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 2, Umezono 1-1-1, Tsukuba, 305-8568, Japan.
- Research Center for Green X-Tech, Tohoku University, 6-6-11, Aoba-yama, Aoba-ku, Sendai, 980-8579, Japan.
- Department of Materials Science, Graduate School of Engineering, Tohoku University, 6-6-11, Aoba-yama, Aoba-ku, Sendai, 980-8579, Japan.
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Kölzer J, Jalil AR, Rosenbach D, Arndt L, Mussler G, Schüffelgen P, Grützmacher D, Lüth H, Schäpers T. Supercurrent in Bi 4Te 3 Topological Material-Based Three-Terminal Junctions. NANOMATERIALS (BASEL, SWITZERLAND) 2023; 13:293. [PMID: 36678045 PMCID: PMC9867302 DOI: 10.3390/nano13020293] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 12/18/2022] [Revised: 01/03/2023] [Accepted: 01/04/2023] [Indexed: 06/17/2023]
Abstract
In this paper, in an in situ prepared three-terminal Josephson junction based on the topological insulator Bi4Te3 and the superconductor Nb the transport properties are studied. The differential resistance maps as a function of two bias currents reveal extended areas of Josephson supercurrent, including coupling effects between adjacent superconducting electrodes. The observed dynamics for the coupling of the junctions is interpreted using a numerical simulation of a similar geometry based on a resistively and capacitively shunted Josephson junction model. The temperature dependency indicates that the device behaves similar to prior experiments with single Josephson junctions comprising topological insulators' weak links. Irradiating radio frequencies to the junction, we find a spectrum of integer Shapiro steps and an additional fractional step, which is interpreted with a skewed current-phase relationship. In a perpendicular magnetic field, we observe Fraunhofer-like interference patterns in the switching currents.
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Affiliation(s)
- Jonas Kölzer
- Peter Grünberg Institute (PGI-9), Forschungszentrum Jülich, Wilhelm-Johnen-Straße, 52425 Jülich, Germany
- JARA-Fundamentals of Future Information Technology, Jülich-Aachen Research Alliance, Forschungszentrum Jülich and RWTH Aachen University, 52425 Jülich, Germany
| | - Abdur Rehman Jalil
- Peter Grünberg Institute (PGI-9), Forschungszentrum Jülich, Wilhelm-Johnen-Straße, 52425 Jülich, Germany
- JARA-Fundamentals of Future Information Technology, Jülich-Aachen Research Alliance, Forschungszentrum Jülich and RWTH Aachen University, 52425 Jülich, Germany
| | - Daniel Rosenbach
- Peter Grünberg Institute (PGI-9), Forschungszentrum Jülich, Wilhelm-Johnen-Straße, 52425 Jülich, Germany
- JARA-Fundamentals of Future Information Technology, Jülich-Aachen Research Alliance, Forschungszentrum Jülich and RWTH Aachen University, 52425 Jülich, Germany
| | - Lisa Arndt
- JARA Institute for Quantum Information, RWTH Aachen University, 52056 Aachen, Germany
| | - Gregor Mussler
- Peter Grünberg Institute (PGI-9), Forschungszentrum Jülich, Wilhelm-Johnen-Straße, 52425 Jülich, Germany
- JARA-Fundamentals of Future Information Technology, Jülich-Aachen Research Alliance, Forschungszentrum Jülich and RWTH Aachen University, 52425 Jülich, Germany
| | - Peter Schüffelgen
- Peter Grünberg Institute (PGI-9), Forschungszentrum Jülich, Wilhelm-Johnen-Straße, 52425 Jülich, Germany
- JARA-Fundamentals of Future Information Technology, Jülich-Aachen Research Alliance, Forschungszentrum Jülich and RWTH Aachen University, 52425 Jülich, Germany
| | - Detlev Grützmacher
- Peter Grünberg Institute (PGI-9), Forschungszentrum Jülich, Wilhelm-Johnen-Straße, 52425 Jülich, Germany
- JARA-Fundamentals of Future Information Technology, Jülich-Aachen Research Alliance, Forschungszentrum Jülich and RWTH Aachen University, 52425 Jülich, Germany
| | - Hans Lüth
- Peter Grünberg Institute (PGI-9), Forschungszentrum Jülich, Wilhelm-Johnen-Straße, 52425 Jülich, Germany
- JARA-Fundamentals of Future Information Technology, Jülich-Aachen Research Alliance, Forschungszentrum Jülich and RWTH Aachen University, 52425 Jülich, Germany
| | - Thomas Schäpers
- Peter Grünberg Institute (PGI-9), Forschungszentrum Jülich, Wilhelm-Johnen-Straße, 52425 Jülich, Germany
- JARA-Fundamentals of Future Information Technology, Jülich-Aachen Research Alliance, Forschungszentrum Jülich and RWTH Aachen University, 52425 Jülich, Germany
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Bergeron H, Lebedev D, Hersam MC. Polymorphism in Post-Dichalcogenide Two-Dimensional Materials. Chem Rev 2021; 121:2713-2775. [PMID: 33555868 DOI: 10.1021/acs.chemrev.0c00933] [Citation(s) in RCA: 40] [Impact Index Per Article: 13.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/21/2022]
Abstract
Two-dimensional (2D) materials exhibit a wide range of atomic structures, compositions, and associated versatility of properties. Furthermore, for a given composition, a variety of different crystal structures (i.e., polymorphs) can be observed. Polymorphism in 2D materials presents a fertile landscape for designing novel architectures and imparting new functionalities. The objective of this Review is to identify the polymorphs of emerging 2D materials, describe their polymorph-dependent properties, and outline methods used for polymorph control. Since traditional 2D materials (e.g., graphene, hexagonal boron nitride, and transition metal dichalcogenides) have already been studied extensively, the focus here is on polymorphism in post-dichalcogenide 2D materials including group III, IV, and V elemental 2D materials, layered group III, IV, and V metal chalcogenides, and 2D transition metal halides. In addition to providing a comprehensive survey of recent experimental and theoretical literature, this Review identifies the most promising opportunities for future research including how 2D polymorph engineering can provide a pathway to materials by design.
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Affiliation(s)
- Hadallia Bergeron
- Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, United States
| | - Dmitry Lebedev
- Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, United States
| | - Mark C Hersam
- Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, United States.,Department of Chemistry, Northwestern University, Evanston, Illinois 60208, United States.,Department of Electrical and Computer Engineering, Northwestern University, Evanston, Illinois 60208, United States
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Concepción O, Galván-Arellano M, Torres-Costa V, Climent-Font A, Bahena D, Manso Silván M, Escobosa A, de Melo O. Controlling the Epitaxial Growth of Bi2Te3, BiTe, and Bi4Te3 Pure Phases by Physical Vapor Transport. Inorg Chem 2018; 57:10090-10099. [DOI: 10.1021/acs.inorgchem.8b01235] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
Affiliation(s)
- Omar Concepción
- Nanoscience and Nanotechnology PhD Program, CINVESTAV-IPN, 07360 Mexico City, Mexico
| | - Miguel Galván-Arellano
- Solid State Electronics Section, Electrical Engineering Department, CINVESTAV-IPN, 07360 Mexico City, Mexico
| | - Vicente Torres-Costa
- Departamento de Física Aplicada, Instituto de Ciencia de Materiales Nicolás Cabrera and Centro de Micro Análisis de Materiales (CMAM), Universidad Autónoma de Madrid, 28049 Madrid, Spain
| | - Aurelio Climent-Font
- Departamento de Física Aplicada, Instituto de Ciencia de Materiales Nicolás Cabrera and Centro de Micro Análisis de Materiales (CMAM), Universidad Autónoma de Madrid, 28049 Madrid, Spain
| | - Daniel Bahena
- Advanced Laboratory of Electron Nanoscopy, CINVESTAV-IPN, 07360 Mexico City, Mexico
| | - Miguel Manso Silván
- Departamento de Física Aplicada, Instituto de Ciencia de Materiales Nicolás Cabrera and Centro de Micro Análisis de Materiales (CMAM), Universidad Autónoma de Madrid, 28049 Madrid, Spain
| | - Arturo Escobosa
- Solid State Electronics Section, Electrical Engineering Department, CINVESTAV-IPN, 07360 Mexico City, Mexico
| | - Osvaldo de Melo
- Departamento de Física Aplicada, Universidad Autónoma de Madrid, 28049 Madrid, Spain
- Physics Faculty, University of Havana, 10400 Havana, Cuba
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