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Ren J, Liu T, He B, Wu G, Gu H, Wang B, Li J, Mao Y, Chen S, Xing G. Passivating Defects at the Bottom Interface of Perovskite by Ethylammonium to Improve the Performance of Perovskite Solar Cells. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2022; 18:e2203536. [PMID: 36229405 DOI: 10.1002/smll.202203536] [Citation(s) in RCA: 7] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/07/2022] [Revised: 09/23/2022] [Indexed: 06/16/2023]
Abstract
The interface of perovskite solar cells (PSCs) plays a significant role in influencing their performance, yet there is still scarce research focusing on their difficult-to-expose bottom interfaces. Herein, ethylammonium bromide (EABr) is introduced into the bottom interface and its passivation effects are studied directly. First, EABr can improve substrate wettability, which is beneficial for the perovskite-film deposition. By lifting off the perovskite film spontaneously from the substrate, it is found that EABr can significantly reduce the amount of unreacted PbI2 at the bottom interface. These PbI2 crystals have been recently identified as a major defect source and degradation site for perovskite film. Meanwhile, EABr also lifts the valence band maximum at the bottom side of perovskite from -5.38 to -5.09 eV, facilitating better hole transfer. Such a improvement is also verified by the study of charge carrier dynamics. Through introducing EABr, all photovoltaic parameters of the inverted PSCs are improved, and their power conversion efficiency (PCE) increases from 20.41% to 21.06%. The study highlights the importance of direct characterization of the bottom interface for a better passivation effect.
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Affiliation(s)
- Jiahao Ren
- Department of Physics and Chemistry, Faculty of Science and Technology, University of Macau, Avenida da Universidade, Taipa, Macau, 999078, China
- Joint Key Laboratory of the Ministry of Education, Institute of Applied Physics and Materials Engineering, University of Macau, Avenida da Universidade, Taipa, Macau, 999078, China
| | - Tanghao Liu
- Joint Key Laboratory of the Ministry of Education, Institute of Applied Physics and Materials Engineering, University of Macau, Avenida da Universidade, Taipa, Macau, 999078, China
- Department of Physics, Hong Kong Baptist University, 224 Waterloo Road, Kowloon, Hong Kong SAR, 999077, China
| | - Bingchen He
- Joint Key Laboratory of the Ministry of Education, Institute of Applied Physics and Materials Engineering, University of Macau, Avenida da Universidade, Taipa, Macau, 999078, China
| | - Guangbao Wu
- Joint Key Laboratory of the Ministry of Education, Institute of Applied Physics and Materials Engineering, University of Macau, Avenida da Universidade, Taipa, Macau, 999078, China
| | - Hao Gu
- Joint Key Laboratory of the Ministry of Education, Institute of Applied Physics and Materials Engineering, University of Macau, Avenida da Universidade, Taipa, Macau, 999078, China
| | - Bingzhe Wang
- Joint Key Laboratory of the Ministry of Education, Institute of Applied Physics and Materials Engineering, University of Macau, Avenida da Universidade, Taipa, Macau, 999078, China
| | - Jielei Li
- Joint Key Laboratory of the Ministry of Education, Institute of Applied Physics and Materials Engineering, University of Macau, Avenida da Universidade, Taipa, Macau, 999078, China
| | - Yulin Mao
- Joint Key Laboratory of the Ministry of Education, Institute of Applied Physics and Materials Engineering, University of Macau, Avenida da Universidade, Taipa, Macau, 999078, China
| | - Shi Chen
- Department of Physics and Chemistry, Faculty of Science and Technology, University of Macau, Avenida da Universidade, Taipa, Macau, 999078, China
- Joint Key Laboratory of the Ministry of Education, Institute of Applied Physics and Materials Engineering, University of Macau, Avenida da Universidade, Taipa, Macau, 999078, China
| | - Guichuan Xing
- Department of Physics and Chemistry, Faculty of Science and Technology, University of Macau, Avenida da Universidade, Taipa, Macau, 999078, China
- Joint Key Laboratory of the Ministry of Education, Institute of Applied Physics and Materials Engineering, University of Macau, Avenida da Universidade, Taipa, Macau, 999078, China
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Lynall D, Tseng AC, Nair SV, Savelyev IG, Blumin M, Wang S, Wang ZM, Ruda HE. Nonlinear Chemical Sensitivity Enhancement of Nanowires in the Ultralow Concentration Regime. ACS NANO 2020; 14:964-973. [PMID: 31904218 DOI: 10.1021/acsnano.9b08253] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
Much recent attention has been focused on the development of field-effect transistors based on low-dimensional nanostructures for the detection and manipulation of molecules. Because of their extraordinarily high charge sensitivity, InAs nanowires present an excellent material system in which to probe and study the behavior of molecules on their surfaces and elucidate the underlying mechanisms dictating the sensor response. So far, chemical sensors have relied on slow, activated processes restricting their applicability to high temperatures and macroscopic adsorbate coverages. Here, we identify the transition into a highly sensitive regime of chemical sensing at ultralow concentrations (<1 ppm) via physisorption at room temperature using field-effect transistors with channels composed of several thousand InAs nanowires and ethanol as a simple analyte molecule. In this regime, the nanowire conductivity is dictated by a local gating effect from individual dipoles, leading to a nonlinear enhancement of the sensitivity. At higher concentrations (>1 ppm), the nanowire channel is globally gated by a uniform dipole layer at the nanowire surface. The former leads to a dramatic increase in sensitivity due to weakened screening and the one-dimensional geometry of the nanowire. In this regime, we detect concentrations of ethanol vapor as low as 10 ppb, 100 times below the lowest concentrations previously reported. Furthermore, we demonstrate electrostatic control of the sensitivity and dynamic range of the InAs nanowire-based sensor and construct a unified model that accurately describes and predicts the sensor response over the tested concentration range (10 ppb to 10 ppm).
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Affiliation(s)
- David Lynall
- Institute of Fundamental and Frontier Sciences , University of Electronic Science and Technology of China , Chengdu 610054 , China
- Centre for Advanced Nanotechnology , University of Toronto , 170 College Street , Toronto , Ontario M5S 3E3 , Canada
- Department of Materials Science and Engineering , University of Toronto , 184 College Street , Toronto , Ontario M5S 3E4 , Canada
| | - Alex C Tseng
- Centre for Advanced Nanotechnology , University of Toronto , 170 College Street , Toronto , Ontario M5S 3E3 , Canada
- Department of Materials Science and Engineering , University of Toronto , 184 College Street , Toronto , Ontario M5S 3E4 , Canada
| | - Selvakumar V Nair
- Centre for Advanced Nanotechnology , University of Toronto , 170 College Street , Toronto , Ontario M5S 3E3 , Canada
- Department of Materials Science and Engineering , University of Toronto , 184 College Street , Toronto , Ontario M5S 3E4 , Canada
| | - Igor G Savelyev
- Centre for Advanced Nanotechnology , University of Toronto , 170 College Street , Toronto , Ontario M5S 3E3 , Canada
- Department of Materials Science and Engineering , University of Toronto , 184 College Street , Toronto , Ontario M5S 3E4 , Canada
| | - Marina Blumin
- Centre for Advanced Nanotechnology , University of Toronto , 170 College Street , Toronto , Ontario M5S 3E3 , Canada
- Department of Materials Science and Engineering , University of Toronto , 184 College Street , Toronto , Ontario M5S 3E4 , Canada
| | - Shiliang Wang
- Defence Research and Development Canada Suffield , Medicine Hat , Alberta T1A 8K6 , Canada
| | - Zhiming M Wang
- Institute of Fundamental and Frontier Sciences , University of Electronic Science and Technology of China , Chengdu 610054 , China
| | - Harry E Ruda
- Institute of Fundamental and Frontier Sciences , University of Electronic Science and Technology of China , Chengdu 610054 , China
- Centre for Advanced Nanotechnology , University of Toronto , 170 College Street , Toronto , Ontario M5S 3E3 , Canada
- Department of Materials Science and Engineering , University of Toronto , 184 College Street , Toronto , Ontario M5S 3E4 , Canada
- Department of Electrical and Computer Engineering , University of Toronto , 10 Kings College Road , Toronto , Ontario M5S 3G4 , Canada
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