Pan D, Liu C, Liu GB, Feng S, Yao Y. Physical Fingerprints of the 2O-tαP Phase in Phosphorene Stacking.
J Phys Chem Lett 2019;
10:3190-3196. [PMID:
31144818 DOI:
10.1021/acs.jpclett.9b01323]
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Abstract
The 2O-tαP phase is a bilayer phosphorene stacking twisted by ∼70.5° standing out from all the potential candidates predicted by our previous work. Here, by linear response theory, we directly verified that the 2O-tαP phase preserves the intrinsic features of phonon spectrum of the existing AB phase, reflecting a stable thermodynamic behavior. Then we provided three distinct fingerprints to help finding this new phase: upon comparison to the existing shifting bilayer phosphorene, the in-plane elastic constants showed a much weaker anisotropic response, providing a characteristic mechanical criterion; the calculated Raman spectrum revealed for the low frequency rang the layer-breathing mode and the out-of-plane twisted mode, L-A1 and L-A2, both of which together stabilize the twisted structure; in particular, the simulated scanning tunneling microscope image presented recognizable cross stripes, which should withstand an examination of exfoliated bilayer and few-layer black phosphorus.
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