1
|
Iram S, Mahmood A, Ehsan MF, Mumtaz A, Sohail M, Sitara E, Mushtaq S, Malik MA, Fatima SA, Shaheen R, Ahmad NM, Malik SN. Impedance Spectroscopy Analysis of PbSe Nanostructures Deposited by Aerosol Assisted Chemical Vapor Deposition Approach. NANOMATERIALS (BASEL, SWITZERLAND) 2021; 11:2817. [PMID: 34835581 PMCID: PMC8622599 DOI: 10.3390/nano11112817] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 06/28/2021] [Revised: 08/20/2021] [Accepted: 08/21/2021] [Indexed: 11/17/2022]
Abstract
This research endeavor aimed to synthesize the lead (II) diphenyldiselenophosphinate complex and its use to obtain lead selenide nanostructured depositions and further the impedance spectroscopic analysis of these obtained PbSe nanostructures, to determine their roles in the electronics industry. The aerosol-assisted chemical vapor deposition technique was used to provide lead selenide deposition by decomposition of the complex at different temperatures using the glass substrates. The obtained films were revealed to be a pure cubic phase PbSe, as confirmed by X-ray diffraction analysis. SEM and TEM micrographs demonstrated three-dimensionally grown interlocked or aggregated nanocubes of the obtained PbSe. Characteristic dielectric measurements and the impedance spectroscopy analysis at room temperature were executed to evaluate PbSe properties over the frequency range of 100 Hz-5 MHz. The dielectric constant and dielectric loss gave similar trends, along with altering frequency, which was well explained by the Koops theory and Maxwell-Wagner theory. The effective short-range translational carrier hopping gave rise to an overdue remarkable increase in ac conductivity (σac) on the frequency increase. Fitting of a complex impedance plot was carried out with an equivalent circuit model (Rg Cg) (Rgb Qgb Cgb), which proved that grains, as well as grain boundaries, are responsible for the relaxation processes. The asymmetric depressed semicircle with the center lower to the impedance real axis provided a clear explanation of non-Debye dielectric behavior.
Collapse
Affiliation(s)
- Sadia Iram
- School of Natural Sciences, National University of Sciences and Technology, Islamabad 44000, Pakistan; (S.I.); (M.F.E.); (A.M.); (M.S.); (E.S.); (S.M.)
- Department of Materials, University of Manchester, Manchester M13 9PL, UK;
| | - Azhar Mahmood
- School of Natural Sciences, National University of Sciences and Technology, Islamabad 44000, Pakistan; (S.I.); (M.F.E.); (A.M.); (M.S.); (E.S.); (S.M.)
| | - Muhammad Fahad Ehsan
- School of Natural Sciences, National University of Sciences and Technology, Islamabad 44000, Pakistan; (S.I.); (M.F.E.); (A.M.); (M.S.); (E.S.); (S.M.)
| | - Asad Mumtaz
- School of Natural Sciences, National University of Sciences and Technology, Islamabad 44000, Pakistan; (S.I.); (M.F.E.); (A.M.); (M.S.); (E.S.); (S.M.)
| | - Manzar Sohail
- School of Natural Sciences, National University of Sciences and Technology, Islamabad 44000, Pakistan; (S.I.); (M.F.E.); (A.M.); (M.S.); (E.S.); (S.M.)
| | - Effat Sitara
- School of Natural Sciences, National University of Sciences and Technology, Islamabad 44000, Pakistan; (S.I.); (M.F.E.); (A.M.); (M.S.); (E.S.); (S.M.)
| | - Shehla Mushtaq
- School of Natural Sciences, National University of Sciences and Technology, Islamabad 44000, Pakistan; (S.I.); (M.F.E.); (A.M.); (M.S.); (E.S.); (S.M.)
| | | | - Syeda Arooj Fatima
- Central Diagnostic Laboratory, Physics Division, PINSTECH, P.O. Nilore., Islamabad 45500, Pakistan; (S.A.F.); (R.S.)
| | - Rubina Shaheen
- Central Diagnostic Laboratory, Physics Division, PINSTECH, P.O. Nilore., Islamabad 45500, Pakistan; (S.A.F.); (R.S.)
| | - Nasir Mahmood Ahmad
- Department of Materials Engineering, School of Chemical and Materials Engineering (SCME)-National University of Sciences and Technology (NUST), Islamabad 44000, Pakistan; (N.M.A.); (S.N.M.)
| | - Sajid Nawaz Malik
- Department of Materials Engineering, School of Chemical and Materials Engineering (SCME)-National University of Sciences and Technology (NUST), Islamabad 44000, Pakistan; (N.M.A.); (S.N.M.)
| |
Collapse
|
2
|
Hafiz SB, Al Mahfuz MM, Lee S, Ko DK. Midwavelength Infrared p-n Heterojunction Diodes Based on Intraband Colloidal Quantum Dots. ACS APPLIED MATERIALS & INTERFACES 2021; 13:49043-49049. [PMID: 34613686 DOI: 10.1021/acsami.1c14749] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/17/2023]
Abstract
As an emerging member of the colloidal semiconductor quantum dot materials family, intraband quantum dots are being extensively studied for thermal infrared sensing applications. High-performance detectors can be realized using a traditional p-n junction device design; however, the heavily doped nature of intraband quantum dots presents a new challenge in realizing diode devices. In this work, we utilize a trait uniquely available in a colloidal quantum dot material system to overcome this challenge: the ability to blend two different types of quantum dots to control the electrical property of the resulting film. We report on the preparation of binary mixture films containing midwavelength infrared Ag2Se intraband quantum dots and the fabrication of p-n heterojunction diodes with strong rectifying characteristics. The peak specific detectivity at 4.5 μm was measured to be 107 Jones at room temperature, which is an orders of magnitude improvement compared to the previous generation of intraband quantum dot detectors.
Collapse
Affiliation(s)
- Shihab Bin Hafiz
- Department of Electrical and Computer Engineering, New Jersey Institute of Technology, Newark, New Jersey 07102, United States
| | - Mohammad M Al Mahfuz
- Department of Electrical and Computer Engineering, New Jersey Institute of Technology, Newark, New Jersey 07102, United States
| | - Sunghwan Lee
- School of Engineering Technology, Purdue University, West Lafayette, Indiana 47907, United States
| | - Dong-Kyun Ko
- Department of Electrical and Computer Engineering, New Jersey Institute of Technology, Newark, New Jersey 07102, United States
| |
Collapse
|
3
|
Dortaj H, Dolatyari M, Zarghami A, Alidoust F, Rostami A, Matloub S, Yadipour R. High-speed and high-precision PbSe/PbI 2 solution process mid-infrared camera. Sci Rep 2021; 11:1533. [PMID: 33452367 PMCID: PMC7810890 DOI: 10.1038/s41598-020-80847-4] [Citation(s) in RCA: 8] [Impact Index Per Article: 2.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/15/2020] [Accepted: 12/17/2020] [Indexed: 01/29/2023] Open
Abstract
Infrared (IR) cameras based on semiconductors grown by epitaxial methods face two main challenges, which are cost and operating at room temperature. The alternative new technologies which can tackle these two difficulties develop new and facile material and methods. Moreover, the implementation of high speed camera, which makes high resolution images with normal methods, is very expensive. In this paper, a new nanostructure based on a cost-effective solution processed technology for the implementation of the high-speed mid-infrared light camera at room temperature is proposed. To this end, the chemically synthesized PbSe-PbI2 core-shell Quantum Dots (QDs) are used. In this work, a camera including 10 × 10 pixels is fabricated and synthesized QDs spin-coated on interdigitated contact (IDC) and then the fabricated system passivated by epoxy resin. Finally, using an electronic reading circuit, all pixels are converted to an image on the monitor. To model the fabricated camera, we solved Schrodinger-Poisson equations self consistently. Then output current from each pixel is modeled based on semiconductor physics and dark and photocurrent, as well as Responsivity and Detectivity, are calculated. Then the fabricated device is examined, and dark and photocurrents are measured and compared to the theoretical results. The obtained results indicate that the obtained theoretical and measured experimental results are in good agreement together. The fabricated detector is high speed with a rise time of 100 ns. With this speed, we can get 10 million frames per second; this means we can get very high-resolution images. The speed of operation is examined experimentally using a chopper that modulates input light with 50, 100, 250, and 500 Hz. It is shown that the fabricated device operates well in these situations, and it is not limited by the speed of detector. Finally, for the demonstration of the proposed device operation, some pictures and movies taken by the camera are attached and inserted in the paper.
Collapse
Affiliation(s)
- Hannaneh Dortaj
- Photonics and Nanocrystals Research Lab (PNRL), University of Tabriz, 5166614761, Tabriz, Iran
| | - Mahboubeh Dolatyari
- SP-EPT Lab., ASEPE Company, Industrial Park of Advanced Technologies, 5364196795, Tabriz, Iran
| | - Armin Zarghami
- Photonics and Nanocrystals Research Lab (PNRL), University of Tabriz, 5166614761, Tabriz, Iran
| | - Farid Alidoust
- Photonics and Nanocrystals Research Lab (PNRL), University of Tabriz, 5166614761, Tabriz, Iran
| | - Ali Rostami
- Photonics and Nanocrystals Research Lab (PNRL), University of Tabriz, 5166614761, Tabriz, Iran.
- SP-EPT Lab., ASEPE Company, Industrial Park of Advanced Technologies, 5364196795, Tabriz, Iran.
| | - Samiye Matloub
- Quantum Photonics Research Lab (QPRL), University of Tabriz, 5166614761, Tabriz, Iran
| | - Reza Yadipour
- Faculty of Electrical and Computer Engineering, University of Tabriz, 5166614761, Tabriz, Iran
| |
Collapse
|
4
|
Qiu J, Liu Y, Zhang G, Shi K, Li Y, Luo Y. Modified vapor phase deposition technology for high-performance uncooled MIR PbSe detectors. RSC Adv 2021; 11:34908-34914. [PMID: 35494768 PMCID: PMC9042917 DOI: 10.1039/d1ra06144e] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/14/2021] [Accepted: 09/28/2021] [Indexed: 11/21/2022] Open
Abstract
The low performance of middle infrared (MIR) PbSe detectors fabricated from vapor phase deposition (VPD) technology restricts the rapid development of VPD technology and detector commercialization. A modified VPD process was proposed to duplicate the microstructural features of high-performance CBD-PbSe detectors for a breakthrough in the VPD technology. A peak detectivity D* of 1.6 × 1010 cm Hz1/2 W−1 at 298 K was achieved under the optimized sensitization, approaching the best performance of CBD-PbSe detectors. Through the contrasting various microstructures obtained from diverse methods, the nanoparticle self-assembly structure in VPD-PbSe oriented rod-like crystals is an important factor for the IR sensitivity. The microstructural evolution demonstrated that there is a large space to grow for VPD-PbSe detectivity D* via eliminating the voids formed in the iodine-sensitization process. The increased performance indicates that the modified VPD technology can provide technical support for the manufacturing of the megapixel uncooled lead-salt FPA imager and accelerate its industrialization. The low detectivity of VPD-PbSe MIR detectors was broken by duplicating the microstructural features and phase composition of high-performance CBD-PbSe detectors, providing a commercial technical solution for megapixel uncooled PbSe FPA imagers.![]()
Collapse
Affiliation(s)
- Jijun Qiu
- School of Microelectronics, Dalian University of Technology, Dalian, 116024, PR China
| | - Yun Liu
- School of Microelectronics, Dalian University of Technology, Dalian, 116024, PR China
| | - Guodong Zhang
- School of Microelectronics, Dalian University of Technology, Dalian, 116024, PR China
| | - Kanghao Shi
- School of Microelectronics, Dalian University of Technology, Dalian, 116024, PR China
| | - Yanzhen Li
- School of Microelectronics, Dalian University of Technology, Dalian, 116024, PR China
| | - Yingmin Luo
- School of Microelectronics, Dalian University of Technology, Dalian, 116024, PR China
| |
Collapse
|