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Zhu XZ, Wang KL, Jin RJ, Chen JH, Hao YH, Nizamani N, Liu Y, Zhu YH, Zhang ME, Wang ZK, Liao LS. Bilateral Production Shield Enabling Highly Efficient Perovskite Photovoltaics. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2024; 20:e2401701. [PMID: 38705844 DOI: 10.1002/smll.202401701] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/04/2024] [Revised: 04/22/2024] [Indexed: 05/07/2024]
Abstract
Enhancing the intrinsic stability of perovskite and through encapsulation to isolate water, oxygen, and UV-induced decomposition are currently common and most effective strategies in perovskite solar cells. Here, the atomic layer deposition process is employed to deposit a nanoscale (≈100 nm), uniform, and dense Al2O3 film on the front side of perovskite devices, effectively isolating them from the erosion caused by water and oxygen in the humid air. Simultaneously, nanoscale (≈100 nm) TiO2 films are also deposited on the glass surface to efficiently filter out the ultraviolet (UV) light in the light source, which induces degradation in perovskite. Ultimately, throughthe collaborative effects of both aspects, the stability of the devices is significantly improved under conditions of humid air and illumination. As a result, after storing the devices in ambient air for 1000 h, the efficiency only declines to 95%, and even after 662 h of UV exposure, the efficiency remains at 88%, far surpassing the performance of comparison devices. These results strongly indicate that the adopted Al2O3 and TiO2 thin films play a significant role in enhancing the stability of perovskite solar cells, demonstrating substantial potential for widespread industrial applications.
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Affiliation(s)
- Xiao-Zhao Zhu
- Institute of Functional Nano & Soft Materials (FUNSOM), Jiangsu Key Laboratory of Advanced Negative Carbon Technologies, Soochow University, Suzhou, 215123, China
- Institute of Organic Optoelectronics, Jiangsu Industrial Technology Research Institute, Suzhou, 215215, China
| | - Kai-Li Wang
- Institute of Functional Nano & Soft Materials (FUNSOM), Jiangsu Key Laboratory of Advanced Negative Carbon Technologies, Soochow University, Suzhou, 215123, China
| | - Run-Jun Jin
- Institute of Functional Nano & Soft Materials (FUNSOM), Jiangsu Key Laboratory of Advanced Negative Carbon Technologies, Soochow University, Suzhou, 215123, China
| | - Jin-Hui Chen
- Key Laboratory of Ministry of Education for Optoelectronic Measurement Technology and Instrument, Beijing Information Science & Technology University, Beijing, 100192, China
| | - Yi-Hong Hao
- Key Laboratory of Ministry of Education for Optoelectronic Measurement Technology and Instrument, Beijing Information Science & Technology University, Beijing, 100192, China
| | - Namatullah Nizamani
- Institute of Functional Nano & Soft Materials (FUNSOM), Jiangsu Key Laboratory of Advanced Negative Carbon Technologies, Soochow University, Suzhou, 215123, China
| | - Yuan Liu
- Key Laboratory of Ministry of Education for Optoelectronic Measurement Technology and Instrument, Beijing Information Science & Technology University, Beijing, 100192, China
| | - Ying-Hui Zhu
- Institute of Organic Optoelectronics, Jiangsu Industrial Technology Research Institute, Suzhou, 215215, China
| | - Mei-E Zhang
- Institute of Organic Optoelectronics, Jiangsu Industrial Technology Research Institute, Suzhou, 215215, China
| | - Zhao-Kui Wang
- Institute of Functional Nano & Soft Materials (FUNSOM), Jiangsu Key Laboratory of Advanced Negative Carbon Technologies, Soochow University, Suzhou, 215123, China
- Institute of Organic Optoelectronics, Jiangsu Industrial Technology Research Institute, Suzhou, 215215, China
| | - Liang-Sheng Liao
- Institute of Functional Nano & Soft Materials (FUNSOM), Jiangsu Key Laboratory of Advanced Negative Carbon Technologies, Soochow University, Suzhou, 215123, China
- Institute of Organic Optoelectronics, Jiangsu Industrial Technology Research Institute, Suzhou, 215215, China
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Pellegrino AL, Lo Presti F, Smecca E, Valastro S, Greco G, Di Franco S, Roccaforte F, Alberti A, Malandrino G. A Low Temperature Growth of Cu 2O Thin Films as Hole Transporting Material for Perovskite Solar Cells. MATERIALS (BASEL, SWITZERLAND) 2022; 15:7790. [PMID: 36363379 PMCID: PMC9657906 DOI: 10.3390/ma15217790] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 10/06/2022] [Revised: 10/31/2022] [Accepted: 11/02/2022] [Indexed: 06/16/2023]
Abstract
Copper oxide thin films have been successfully synthesized through a metal-organic chemical vapor deposition (MOCVD) approach starting from the copper bis(2,2,6,6-tetramethyl-3,5-heptanedionate), Cu(tmhd)2, complex. Operative conditions of fabrication strongly affect both the composition and morphologies of the copper oxide thin films. The deposition temperature has been accurately monitored in order to stabilize and to produce, selectively and reproducibly, the two phases of cuprite Cu2O and/or tenorite CuO. The present approach has the advantages of being industrially appealing, reliable, and fast for the production of thin films over large areas with fine control of both composition and surface uniformity. Moreover, the methylammonium lead iodide (MAPI) active layer has been successfully deposited on the ITO/Cu2O substrate by the Low Vacuum Proximity Space Effusion (LV-PSE) technique. X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), and atomic force microscopy (AFM) analyses have been used to characterize the deposited films. The optical band gap (Eg), ranging from 1.99 to 2.41 eV, has been determined through UV-vis analysis, while the electrical measurements allowed to establish the p-type conductivity behavior of the deposited Cu2O thin films with resistivities from 31 to 83 Ω cm and carrier concentration in the order of 1.5-2.8 × 1016 cm-3. These results pave the way for potential applications of the present system as a hole transporting layer combined with a perovskite active layer in emergent solar cell technologies.
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Affiliation(s)
- Anna L. Pellegrino
- Dipartimento di Scienze Chimiche, Università degli Studi di Catania, INSTM UdR Catania, Viale Andrea Doria 6, 95125 Catania, Italy
| | - Francesca Lo Presti
- Dipartimento di Scienze Chimiche, Università degli Studi di Catania, INSTM UdR Catania, Viale Andrea Doria 6, 95125 Catania, Italy
| | - Emanuele Smecca
- National Research Council-Institute for Microelectronics and Microsystems (CNR-IMM), Zona Industriale Strada VIII No. 5, 95121 Catania, Italy
| | - Salvatore Valastro
- National Research Council-Institute for Microelectronics and Microsystems (CNR-IMM), Zona Industriale Strada VIII No. 5, 95121 Catania, Italy
| | - Giuseppe Greco
- National Research Council-Institute for Microelectronics and Microsystems (CNR-IMM), Zona Industriale Strada VIII No. 5, 95121 Catania, Italy
| | - Salvatore Di Franco
- National Research Council-Institute for Microelectronics and Microsystems (CNR-IMM), Zona Industriale Strada VIII No. 5, 95121 Catania, Italy
| | - Fabrizio Roccaforte
- National Research Council-Institute for Microelectronics and Microsystems (CNR-IMM), Zona Industriale Strada VIII No. 5, 95121 Catania, Italy
| | - Alessandra Alberti
- National Research Council-Institute for Microelectronics and Microsystems (CNR-IMM), Zona Industriale Strada VIII No. 5, 95121 Catania, Italy
| | - Graziella Malandrino
- Dipartimento di Scienze Chimiche, Università degli Studi di Catania, INSTM UdR Catania, Viale Andrea Doria 6, 95125 Catania, Italy
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