Adsorption at the liquid-vapor surface of a binary liquid mixture

Off-Critical Wetting Layer Divergence at the Liquid / Vapor Interface of Binary Liquid Mixtures

Surface wetting phenomena impact chemistry, physics, biology, and engineering. The wetting behaviors of partially-miscible binary liquid systems are especially complex. Here we report evidence of universal behavior in the divergence of wetting layer growth at liquid-vapor interfaces of the cyclohexane + aniline, hexane + o-toluidine, and methanol + carbon disulfide systems. Layer growth on the micron scale was followed using visible light scattering from stirred samples. Layer thicknesses diverged with decreasing temperature when coexistence was approached from the one-phase region, but only for solutions richer in the higher density / higher surface tension component. The onset of divergence was <1 K above the bulk coexistence temperature; nearer the critical composition, the onset temperature was the critical temperature itself. All three systems showed identical divergent wetting properties after variable normalization. In contrast, no divergent wetting layer formation was seen in the benzene + 1,2-propanediol or water + phenol systems. The mathematical sign of the Hamaker constant correlates with the contrasting behaviors. Collectively, these results have implications for theoretical descriptions of adsorption layer growth and crossover behavior, for measurements of complete wetting temperatures, and for practical applications.

Critical-point universality in adsorption: the effect of charcoal on a mixture of isobutyric acid and water near the consolute point

The mixture of isobutyric acid and water has a consolute point at a temperature of 25.75 °C and mole fraction 0.1148 isobutyric acid. When charcoal is added to this mixture, the concentration of isobutyric acid is reduced by adsorption. We have measured the action of charcoal on solutions of isobutyric acid and water as a function of isobutyric acid mole fraction at temperatures of 25.85 and 32.50 °C. At the higher temperature, the specific adsorption density (y(2)(α)/m) satisfies the Freundlich equation (y(2)(α)/m)=KX(2)(1/n), where y(2)(α) is the mass of isobutyric acid adsorbed, m is the mass of charcoal, X(2) is the equilibrium mole fraction of isobutyric acid, n is the Freundlich index, and K=K(T) is an amplitude that depends upon the temperature T. At 25.85 °C, a critical endpoint is located at an isobutyric acid mole fraction X(2)(ce)=0.09. When compared with the Freundlich equation at this temperature, a plot of the specific adsorption density as a function of X(2) in the vicinity of the critical-endpoint composition assumes a shape which is reminiscent of the derivative of a Dirac delta function. Using critical-point scaling theory, we show that this divergent pattern is consistent with the principle of critical point universality.

X-ray and ellipsometric study of strong critical adsorption

Carpenter [Phys. Rev. E 61, 532 (2000)] succeeded in determining a single universal model, called the P1 model, that could describe the ellipsometric critical adsorption data from the liquid-vapor interface of four different critical binary liquid mixtures near their critical demixing temperatures. The P1 model also recently has been used to describe neutron reflectometry data from a critical liquid mixture/crystalline quartz interface. However, in another recent study, the P1 model failed to simultaneously describe x-ray reflectometry and ellipsometry data from the liquid-vapor surface of the critical mixture n -dodecane + tetrabromoethane (DT). In this paper, we resolve this discrepancy between x-ray and ellipsometric data for the DT system. At large length scales (far from the interface) the local concentration is described by the P1 model in order to correctly reproduce the temperature dependence of the ellipsometric data. Close to the interface, however, the molecular structure must be correctly accounted for in order to quantitatively explain the x-ray data. An important conclusion that arises from this study is that neutron or x-ray reflectometry is most sensitive to short-range interfacial structure, but may provide misleading information about long-range interfacial structure. Ellipsometry provides a more accurate measure of this long-range interfacial structure. Complex interfacial structures, possessing both short- and long-range structure, are therefore best studied using multiple techniques.

Comparison of critical adsorption scaling functions obtained from neutron reflectometry and ellipsometry

Carpenter et al. [Phys. Rev. E 59, 5655 (1999); 61, 532 (2000)] managed to explain ellipsometric critical adsorption data collected from the liquid-vapor interface of four different critical binary liquid mixtures near their demixing critical temperature using a single model. This was the first time a single universal function had been found which could quantitatively describe the surface critical behavior of many different mixtures. There have also been various attempts to investigate this surface critical behavior using neutron and x-ray reflectometries. Results have been mixed and have often been at variance with Carpenter et al. In this paper, the authors show that neutron reflectometry data collected from a crystalline quartz-critical mixture interface, specifically deuterated water plus 3-methylpyridine, can be quantitatively explained using the model of Carpenter et al. derived from ellipsometric data.