The influence of refractive index change and initial bending of cantilevers on the optical lever readout method

Scanning electrochemical microscopy monitoring in microcantilever platforms

The deflection of cantilever systems may be performed by an indirect electrochemical method that consists of measuring the local cantilever activity and deflection in a feedback generation-collection configuration of the SECM. This is illustrated during the electrochemically assisted adsorption of Br onto a gold-coated cantilever, either in its pristine state or previously coated with a thin organic barrier. It is further extended to the adsorption of an antibody in a heterogeneous immunoassay at an allergen-coated microcantilever platform. In both reactions, the cantilever deflection is qualitatively detected from the SECM tip current measurement and a quantitative estimate is obtained through modeling. This electroanalytical strategy provides an alternative approach to standard optical detection. It can overcome some limitations of the optical method by allowing electrochemical characterization of nonconductive cantilevers and appropriate use for closed systems.