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Wakisaka Y, Hu B, Kido D, Al Rashid MH, Chen W, Dong K, Wada T, Bharate B, Yuan Q, Mukai S, Takeichi Y, Takakusagi S, Asakura K. Bent crystal Laue analyser combined with total reflection fluorescence X-ray absorption fine structure (BCLA + TRF-XAFS) and its application to surface studies. JOURNAL OF SYNCHROTRON RADIATION 2020; 27:1618-1625. [PMID: 33147187 DOI: 10.1107/s1600577520011170] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/02/2020] [Accepted: 08/14/2020] [Indexed: 06/11/2023]
Abstract
A bent crystal Laue analyser (BCLA) is an X-ray energy analyser used for fluorescence X-ray absorption fine-structure (XAFS) spectroscopy to separate the fluorescence X-ray emission line of a target atom from the elastic scattering X-rays and other fluorescence emission lines. Here, the feasibility of the BCLA for total reflection fluorescence XAFS (TRF-XAFS), which has a long X-ray footprint on the substrate surface owing to grazing incidence, was tested. The focal line of the BCLA was adjusted on the X-ray footprint and the XAFS signal for one monolayer of Pt deposited on a 60 nm Au film with high sensitivity was obtained. Although range-extended XAFS was expected by the rejection of Au fluorescence arising from the Au substrate, a small glitch was found in the Au L3 edge because of the sudden change of the complex refraction index of the Au substrate at the Au edge. This abnormal spectrum feature can be removed by reflectivity correction using Au foil absorption data. BCLA combined with TRF-XAFS spectroscopy (BCLA + TRF-XAFS) is a new technique for the in situ surface analysis of highly dispersed systems even in the presence of a liquid overlayer.
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Affiliation(s)
- Yuki Wakisaka
- Institute for Catalysis, Hokkaido University, Kita 21-10, Sapporo, Hokkaido 001-0021, Japan
| | - Bing Hu
- Institute for Catalysis, Hokkaido University, Kita 21-10, Sapporo, Hokkaido 001-0021, Japan
| | - Daiki Kido
- Institute for Catalysis, Hokkaido University, Kita 21-10, Sapporo, Hokkaido 001-0021, Japan
| | - Md Harun Al Rashid
- Institute for Catalysis, Hokkaido University, Kita 21-10, Sapporo, Hokkaido 001-0021, Japan
| | - Wenhan Chen
- Institute for Catalysis, Hokkaido University, Kita 21-10, Sapporo, Hokkaido 001-0021, Japan
| | - Kaiyue Dong
- Institute for Catalysis, Hokkaido University, Kita 21-10, Sapporo, Hokkaido 001-0021, Japan
| | - Takahiro Wada
- Tokyo Medical and Dental University, Yushima, Bunkyo-ku, Tokyo 113-8549, Japan
| | - Bapurao Bharate
- Institute for Catalysis, Hokkaido University, Kita 21-10, Sapporo, Hokkaido 001-0021, Japan
| | - Quiyi Yuan
- Institute for Catalysis, Hokkaido University, Kita 21-10, Sapporo, Hokkaido 001-0021, Japan
| | - Shingo Mukai
- Institute for Catalysis, Hokkaido University, Kita 21-10, Sapporo, Hokkaido 001-0021, Japan
| | - Yasuo Takeichi
- Institute for Materials Structure Science, High Energy Accelerator Research Organization, Oho 1-1, Tsukuba 305-0801, Japan
| | - Satoru Takakusagi
- Institute for Catalysis, Hokkaido University, Kita 21-10, Sapporo, Hokkaido 001-0021, Japan
| | - Kiyotaka Asakura
- Institute for Catalysis, Hokkaido University, Kita 21-10, Sapporo, Hokkaido 001-0021, Japan
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A Demonstration of Pt L3-Edge EXAFS Free from Au L3-Edge Using Log–Spiral Bent Crystal Laue Analyzers. Catalysts 2018. [DOI: 10.3390/catal8050204] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/16/2022] Open
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Murata N, Kobayashi M, Okada Y, Suzuki T, Nitani H, Niwa Y, Abe H, Wada T, Mukai S, Uehara H, Ariga H, Takakusagi S, Asakura K. A high-temperature in situ cell with a large solid angle for fluorescence X-ray absorption fine structure measurement. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2015; 86:034102. [PMID: 25832248 DOI: 10.1063/1.4914459] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
We present the design and performance of a high-temperature in situ cell with a large solid angle for fluorescence X-ray absorption fine structure (XAFS) spectra. The cell has a large fluorescence XAFS window (116 mm(ϕ)) near the sample in the cell, realizing a large half-cone angle of 56°. We use a small heater (25 × 35 mm(2)) to heat the sample locally to 873 K. We measured a Pt-SnO2 thin layer on a Si substrate at reaction conditions having a high activity. In situ measurement enables the analysis of the difference XAFS spectra between before and during the reaction to reveal the structure change during the operation.
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Affiliation(s)
- Naoyoshi Murata
- Corporate R & D Headquarters, Fuji Electric Co., Ltd., Tokyo 191-8502, Japan
| | - Makoto Kobayashi
- Corporate R & D Headquarters, Fuji Electric Co., Ltd., Tokyo 191-8502, Japan
| | - Yukari Okada
- Corporate R & D Headquarters, Fuji Electric Co., Ltd., Tokyo 191-8502, Japan
| | - Takuya Suzuki
- Corporate R & D Headquarters, Fuji Electric Co., Ltd., Tokyo 191-8502, Japan
| | - Hiroaki Nitani
- Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK-PF), Tsukuba 305-0811, Japan
| | - Yasuhiro Niwa
- Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK-PF), Tsukuba 305-0811, Japan
| | - Hitoshi Abe
- Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK-PF), Tsukuba 305-0811, Japan
| | - Takahiro Wada
- Department of Advanced Biomaterials, Graduate School of Medical and Dental Sciences, Tokyo Medical and Dental University, Tokyo 113-8549, Japan
| | - Shingo Mukai
- Catalysis Research Center, Hokkaido University, Sapporo 001-0021, Japan
| | - Hiromitsu Uehara
- Catalysis Research Center, Hokkaido University, Sapporo 001-0021, Japan
| | - Hiroko Ariga
- Catalysis Research Center, Hokkaido University, Sapporo 001-0021, Japan
| | - Satoru Takakusagi
- Catalysis Research Center, Hokkaido University, Sapporo 001-0021, Japan
| | - Kiyotaka Asakura
- Catalysis Research Center, Hokkaido University, Sapporo 001-0021, Japan
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Kujala N, Marathe S, Shu D, Shi B, Qian J, Maxey E, Finney L, Macrander A, Assoufid L. Kirkpatrick-Baez mirrors to focus hard X-rays in two dimensions as fabricated, tested and installed at the Advanced Photon Source. JOURNAL OF SYNCHROTRON RADIATION 2014; 21:662-668. [PMID: 24971959 DOI: 10.1107/s1600577514006493] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/06/2013] [Accepted: 03/24/2014] [Indexed: 06/03/2023]
Abstract
The micro-focusing performance for hard X-rays of a fixed-geometry elliptical Kirkpatrick-Baez (K-B) mirrors assembly fabricated, tested and finally implemented at the micro-probe beamline 8-BM of the Advanced Photon Source is reported. Testing of the K-B mirror system was performed at the optics and detector test beamline 1-BM. K-B mirrors of length 80 mm and 60 mm were fabricated by profile coating with Pt metal to produce focal lengths of 250 mm and 155 mm for 3 mrad incident angle. For the critical angle of Pt, a broad bandwidth of energies up to 20 keV applies. The classical K-B sequential mirror geometry was used, and mirrors were mounted on micro-translation stages. The beam intensity profiles were measured by differentiating the curves of intensity data measured using a wire-scanning method. A beam size of 1.3 µm (V) and 1.2 µm (H) was measured with monochromatic X-rays of 18 keV at 1-BM. After installation at 8-BM the measured focus met the design requirements. In this paper the fabrication and metrology of the K-B mirrors are reported, as well as the focusing performances of the full mirrors-plus-mount set-up at both beamlines.
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Affiliation(s)
- Naresh Kujala
- Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Lemont, IL 60439, USA
| | - Shashidhara Marathe
- Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Lemont, IL 60439, USA
| | - Deming Shu
- Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Lemont, IL 60439, USA
| | - Bing Shi
- Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Lemont, IL 60439, USA
| | - Jun Qian
- Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Lemont, IL 60439, USA
| | - Evan Maxey
- Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Lemont, IL 60439, USA
| | - Lydia Finney
- Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Lemont, IL 60439, USA
| | - Albert Macrander
- Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Lemont, IL 60439, USA
| | - Lahsen Assoufid
- Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Lemont, IL 60439, USA
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Szlachetko M, Berset M, Dousse JC, Hoszowska J, Szlachetko J. High-resolution Laue-type DuMond curved crystal spectrometer. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2013; 84:093104. [PMID: 24089813 DOI: 10.1063/1.4821621] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/02/2023]
Abstract
We report on a high-resolution transmission-type curved crystal spectrometer based on the modified DuMond slit geometry. The spectrometer was developed at the University of Fribourg for the study of photoinduced X-ray spectra. K and L X-ray transitions with energies above about 10 keV can be measured with an instrumental resolution comparable to their natural linewidths. Construction details and operational characteristics of the spectrometer are presented. The variation of the energy resolution as a function of the focal distance and diffraction order is discussed. The high sensitivity of the spectrometer is demonstrated via the 2s-1s dipole-forbidden X-ray transition of Gd which could be observed despite its extremely low intensity. The precision of the instrument is illustrated by comparing the sum of the energies of the Au K-L2 and L2-M3 cascading transitions with the energy of the crossover K-M3 transition as well as by considering the energy differences of the Gd Kα1 X-ray line measured at five different diffraction orders. Finally, to demonstrate the versatility of the spectrometer, it is shown that the latter can also be used for in-house extended X-ray absorption fine structure measurements.
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Affiliation(s)
- M Szlachetko
- Department of Physics, University of Fribourg, CH-1700 Fribourg, Switzerland
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Wu Y, Xiao S, Lu J, Liu L, Yang Q, Huang X. Research on a logarithmically bent Laue crystal analyzer for X-ray monochromatic backlight imaging. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2013; 84:073507. [PMID: 23902063 DOI: 10.1063/1.4815549] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/02/2023]
Abstract
A new logarithmically bent Laue imaging crystal analyzer (LBLICA) was proposed to obtain the monochromatic image of plasmas and exhibited a great potential for application in the Inertial Confinement Fusion experiment over a large field of view (FOV) and with a high spatial resolution. The imaging geometry of the LBLICA has been discussed. According to the Bragg condition and the equation of the logarithmic spiral, the key image parameters of the crystal analyzer, including the system magnification, the spatial resolution, and the FOV, have been analyzed theoretically. An experiment has been performed with a Cu target X-ray tube as a backlighter to backlight a mesh grid consisting of 50-μm Cu wires, and the monochromatic image of the grid has been obtained with a spatial resolution of approximately 30 μm.
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Affiliation(s)
- Yufen Wu
- Key Laboratory of Optoelectronic Technology and System of the Ministry of Education, College of Optoelectronic Engineering, Chongqing University, Chongqing 400030, China.
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Llorens I, Lahera E, Delnet W, Proux O, Braillard A, Hazemann JL, Prat A, Testemale D, Dermigny Q, Gelebart F, Morand M, Shukla A, Bardou N, Ulrich O, Arnaud S, Berar JF, Boudet N, Caillot B, Chaurand P, Rose J, Doelsch E, Martin P, Solari PL. High energy resolution five-crystal spectrometer for high quality fluorescence and absorption measurements on an x-ray absorption spectroscopy beamline. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2012; 83:063104. [PMID: 22755612 DOI: 10.1063/1.4728414] [Citation(s) in RCA: 20] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]
Abstract
Fluorescence detection is classically achieved with a solid state detector (SSD) on x-ray absorption spectroscopy (XAS) beamlines. This kind of detection however presents some limitations related to the limited energy resolution and saturation. Crystal analyzer spectrometers (CAS) based on a Johann-type geometry have been developed to overcome these limitations. We have tested and installed such a system on the BM30B/CRG-FAME XAS beamline at the ESRF dedicated to the structural investigation of very dilute systems in environmental, material and biological sciences. The spectrometer has been designed to be a mobile device for easy integration in multi-purpose hard x-ray synchrotron beamlines or even with a laboratory x-ray source. The CAS allows to collect x-ray photons from a large solid angle with five spherically bent crystals. It will cover a large energy range allowing to probe fluorescence lines characteristic of all the elements from Ca (Z = 20) to U (Z = 92). It provides an energy resolution of 1-2 eV. XAS spectroscopy is the main application of this device even if other spectroscopic techniques (RIXS, XES, XRS, etc.) can be also achieved with it. The performances of the CAS are illustrated by two experiments that are difficult or impossible to perform with SSD and the complementarity of the CAS vs SSD detectors is discussed.
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Karanfil C, Bunker G, Newville M, Segre CU, Chapman D. Quantitative performance measurements of bent crystal Laue analyzers for X-ray fluorescence spectroscopy. JOURNAL OF SYNCHROTRON RADIATION 2012; 19:375-380. [PMID: 22514172 PMCID: PMC3329957 DOI: 10.1107/s0909049512003937] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/21/2011] [Accepted: 01/30/2012] [Indexed: 05/31/2023]
Abstract
Third-generation synchrotron radiation sources pose difficult challenges for energy-dispersive detectors for XAFS because of their count rate limitations. One solution to this problem is the bent crystal Laue analyzer (BCLA), which removes most of the undesired scatter and fluorescence before it reaches the detector, effectively eliminating detector saturation due to background. In this paper experimental measurements of BCLA performance in conjunction with a 13-element germanium detector, and a quantitative analysis of the signal-to-noise improvement of BCLAs are presented. The performance of BCLAs are compared with filters and slits.
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Affiliation(s)
- C Karanfil
- Department of Physics, Faculty of Science, University of Muğla, Kötekli-Muğla 48187, Turkey.
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