Cao M, Wang F, Qiao ZW, Zhang HB, Nishi R. Electron tomographic resolution of microns-thick specimens in the ultrahigh voltage electron microscope.
Micron 2013;
49:71-4. [PMID:
23528481 DOI:
10.1016/j.micron.2013.02.011]
[Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/28/2013] [Revised: 02/25/2013] [Accepted: 02/25/2013] [Indexed: 11/29/2022]
Abstract
In this study, we determine the electron tomography (ET) resolution for microns-thick specimens by experiment in the ultra-high voltage electron microscope. A tilt series of projection images of a tilted 8μm thick epoxy-resin film are first acquired. Tomographic reconstructions are then calculated and the resolution is evaluated with the Fourier shell correlation method. The ET resolution of 32nm is achieved under the condition of 2MV accelerating voltage. We also demonstrate that some high tilt angle projections may be little useful for improving the final ET resolution because of the corresponding poor image qualities. These results are helpful to understand the possibility and limitation of ET applications in microns-thick specimens.
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