General theory of the Raman scattering close to a plane surface. Evanescent Raman spectra

The evolution of total internal reflection Raman spectroscopy for the chemical characterization of thin films and interfaces

Total internal reflection (TIR) optical spectroscopies have been widely used for decades as non-destructive and surface-sensitive measurements of thin films and interfaces. Under TIR conditions, an evanescent wave propagates into the sample layer within a region approximately 50 nm to 2 μm from the interface, which limits the spatial extent of the optical signal. The most common TIR optical spectroscopies are fluorescence (i.e., TIRF) and infrared spectroscopy (i.e., attenuated total reflection infrared). Despite the first report of TIR Raman spectroscopy appearing in 1973, this method has not received the same attention to date. While TIR Raman methods can provide chemical specific information, it has been outshined in many respects by surface-enhanced Raman spectroscopy (SERS). TIR Raman spectroscopy, however, is garnering more interest for analyzing the chemical and physical properties of thin polymer films, self-assembled monolayers (SAMs), multilayered systems, and adsorption at an interface. Herein, we discuss the early experimental and computational work that laid the foundation for recent developments in the use of TIR Raman techniques. Recent applications of TIR Raman spectroscopy as well as modern TIR Raman instruments capable of measuring monolayer-sensitive vibrational modes on smooth metallic surfaces are also discussed. The use of TIR Raman spectroscopy has been on a rise and will continue to push the limits for chemical specific interfacial and thin film measurements. Graphical abstract Total internal reflection (TIR) Raman spectroscopy can extract the chemical and physical information from thin films and adsorbates.

Development of a scanning angle total internal reflection Raman spectrometer

A scanning angle total internal reflection (SATIR) Raman spectrometer has been developed for measuring interfacial phenomena with chemical specificity and high axial resolution perpendicular to the interface. The instrument platform is an inverted optical microscope with added automated variable angle optics to control the angle of an incident laser on a prism/sample interface. These optics include two motorized translation stages, the first containing a focusing lens and the second a variable angle galvanometer mirror. The movement of all instrument components is coordinated to ensure that the same sample location and area are probed at each angle. At angles greater than the critical angle, an evanescent wave capable of producing Raman scatter is generated in the sample. The Raman scatter is collected by a microscope objective and directed to a dispersive spectrometer and charge-coupled device detector. In addition to the collected Raman scatter, light reflected from the prism/sample interface is collected to provide calibration parameters that enable modeling the distance over which the Raman scatter is collected for depth profiling measurements. The developed instrument has an incident angle range of 25.5 degrees-75.5 degrees, with a 0.05 degrees angle resolution. Raman scatter can be collected from a ZnSe/organic interface over a range of roughly 35-180 nm. Far from the critical angle, the achieved axial resolution perpendicular to the focal plane is approximately 34 nm. This is roughly a 30-fold improvement relative to confocal Raman microscopy.

General principles of scanning tunneling optical microscopy

A homogeneous propagating wave falling onto submicrometer objects is partially diffracted into evanescent waves. The use of a scattering probe of subwavelength size can convert the evanescent waves into homogeneous ones and make their detection possible. The resulting propagating waves can then provide information about the subwavelength object. Relations with preliminary experiments are discussed.