• Reference Citation Analysis
  • v
  • v
  • Find an Article
Find an Article PDF (4661586)   Today's Articles (5)   Subscriber (51516)
For: Kusunoki I, Takaoka T, Igari Y, Ohtsuka K. Nitridation of a Si(100) surface by 100–1000 eV N+2 ion beams. J Chem Phys 1994. [DOI: 10.1063/1.468194] [Citation(s) in RCA: 25] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022]  Open
Number Cited by Other Article(s)
1
Ching JY, Huang BJ, Hsu YT, Khung YL. Anti-Adhesion Behavior from Ring-Strain Amine Cyclic Monolayers Grafted on Silicon (111) Surfaces. Sci Rep 2020;10:8758. [PMID: 32472042 PMCID: PMC7260185 DOI: 10.1038/s41598-020-65710-w] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/09/2019] [Accepted: 05/07/2020] [Indexed: 01/09/2023]  Open
2
Sobierajski R, Bruijn S, Khorsand AR, Louis E, van de Kruijs RWE, Burian T, Chalupsky J, Cihelka J, Gleeson A, Grzonka J, Gullikson EM, Hajkova V, Hau-Riege S, Juha L, Jurek M, Klinger D, Krzywinski J, London R, Pelka JB, Płociński T, Rasiński M, Tiedtke K, Toleikis S, Vysin L, Wabnitz H, Bijkerk F. Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources. OPTICS EXPRESS 2011;19:193-205. [PMID: 21263557 DOI: 10.1364/oe.19.000193] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/30/2023]
3
Palacio C, Arranz A. Chemical Structure of Ultrathin Silicon Nitride Films Grown by Low-Energy (0.25−5 keV) Nitrogen Implantation:  An Angle-Resolved X-ray Photoelectron Spectroscopy Si 2p Study. J Phys Chem B 2002. [DOI: 10.1021/jp025520q] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
4
Arranz A, Palacio C. Tantalum nitride formation by low-energy (0.5-5 keV) nitrogen implantation. SURF INTERFACE ANAL 2000. [DOI: 10.1002/1096-9918(200010)29:10<653::aid-sia913>3.0.co;2-t] [Citation(s) in RCA: 23] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
PrevPage 1 of 1 1Next
© 2004-2025 Baishideng Publishing Group Inc. All rights reserved. 7041 Koll Center Parkway, Suite 160, Pleasanton, CA 94566, USA