The effects of adsorbed water layers on the apparent height of nanostructures in ambient amplitude modulation atomic force microscopy

Exploring surface charge dynamics: implications for AFM height measurements in 2D materials

An often observed artifact in atomic force microscopy investigations of individual monolayer flakes of 2D materials is the inaccurate height derived from topography images, often attributed to capillary or electrostatic forces. Here, we show the existence of a Joule dissipative mechanism related to charge dynamics and supplementing the dissipation due to capillary forces. This particular mechanism arises from the surface conductivity and assumes significance specially in the context of 2D materials on insulating supports. In such scenarios, the oscillating tip induces in-plane charge currents that in many circumstances constitute the main dissipative contribution to amplitude reduction and, consequently, affect the measured height. To investigate this phenomenon, we conduct measurements on monolayer flakes of co-deposited graphene oxide and reduced graphene oxide. Subsequently, we introduce a general model that elucidates our observations. This approach offers valuable insights into the dynamics of surface charges and their intricate interaction with the tip.

Reduction in Step Height Variation and Correcting Contrast Inversion in Dynamic AFM of WS2 Monolayers

A model has been developed to account for and prevent the anomalies encountered in topographic images of transition metal dichalcogenide monolayers using dynamic atomic force microscopy (dAFM). The height of WS2 monolayers measured using dAFM appeared to be increased or decreased, resulting from the interactions between the tip and the surface. The hydrophilic SiO2 substrate appeared higher than the weakly hydrophilic WS2 when the tip amplitude was low or at a high set point (high force). Large amplitudes and low set points corrected the step height inversion, but did not recover the true step height. Removing water from the sample resulted in an order of magnitude reduced variation in step height, but the WS2 appeared inverted except at low amplitudes and high set points. Our model explains the varying step heights in dAFM of TMDs as a result of varying tip-sample interactions between the sample and substrate, in the presence or absence of capillaries. To eliminate contrast inversion, high amplitudes can be used to reduce the effect of capillary forces. However, when capillaries are not present, low amplitudes and high set points produce images with proper contrast due to tool operation in the repulsive regime on both materials.

Dependence of surface aging on DNA topography investigated in attractive bimodal atomic force microscopy

Here we employ bimodal atomic force microscopy (AFM) to investigate the relevance of the aging of the surface and accumulation of adsorbates on the resolved topography of biomolecules. We produce raw bimodal images and a set of contrast channels derived from these to show that the imaging of DNA molecules on hydrophilic model substrates such as mica should be performed immediately after the sample is prepared. Days after preparation, i.e. 48 hours, the adsorbates shield the forces arising from the true substrate and molecule and the molecule might become "invisible" in the images. We employ dsDNA molecules on mica as a model system since the nominal height of dsDNA is comparable to the height of the adsorbed films. With this set up, the molecules can fully disappear under attractive imaging due to the shielding effects of the adsorbates. We further transform the images obtained immediately after cleaving the mica surface and show that the data are then suitable to be transformed into more physically meaningful maps such as Hamaker maps.

Conditions to minimize soft single biomolecule deformation when imaging with atomic force microscopy

A recurrent interrogation when imaging soft biomolecules using atomic force microscopy (AFM) is the putative deformation of molecules leading to a bias in recording true topographical surfaces. Deformation of biomolecules comes from three sources: sample instability, adsorption to the imaging substrate, and crushing under tip pressure. To disentangle these causes, we measured the maximum height of a well-known biomolecule, the tobacco mosaic virus (TMV), under eight different experimental conditions positing that the maximum height value is a specific indicator of sample deformations. Six basic AFM experimental factors were tested: imaging in air (AIR) versus in liquid (LIQ), imaging with flat minerals (MICA) versus flat organic surfaces (self-assembled monolayers, SAM), and imaging forces with oscillating tapping mode (TAP) versus PeakForce tapping (PFT). The results show that the most critical parameter in accurately measuring the height of TMV in air is the substrate. In a liquid environment, regardless of the substrate, the most critical parameter is the imaging mode. Most importantly, the expected TMV height values were obtained with both imaging with the PeakForce tapping mode either in liquid or in air at the condition of using self-assembled monolayers as substrate. This study unambiguously explains previous poor results of imaging biomolecules on mica in air and suggests alternative methodologies for depositing soft biomolecules on well organized self-assembled monolayers.

Imaging Water Thin Films in Ambient Conditions Using Atomic Force Microscopy

All surfaces exposed to ambient conditions are covered by a thin film of water. Other than at high humidity conditions, i.e., relative humidity higher than 80%, those water films have nanoscale thickness. Nevertheless, even the thinnest film can profoundly affect the physical and chemical properties of the substrate. Information on the structure of these water films can be obtained from spectroscopic techniques based on photons, but these usually have poor lateral resolution. When information with nanometer resolution in the three dimensions is needed, for example for surfaces showing heterogeneity in water affinity at the nanoscale, Atomic Force Microscopy (AFM) is the preferred tool since it can provide such resolution while being operated in ambient conditions. A complication in the interpretation of the data arises when using AFM, however, since, in most cases, direct interaction between a solid probe and a solid surface occurs. This induces strong perturbations of the liquid by the probe that should be controlled or avoided. The aim of this review is to provide an overview of different AFM methods developed to overcome this problem, measuring different interactions between the AFM probe and the water films, and to discuss the type of information about the water film that can be obtained from these interactions.

The role of ambient ice-like water adlayers formed at the interfaces of graphene on hydrophobic and hydrophilic substrates probed using scanning probe microscopy

In this work, we report the role of ice-like water adlayers (IWLs) formed under ambient conditions in between mechanically exfoliated as-prepared and patterned few layer graphene (FLG) and multi-layer graphene (MLG) on hydrophobic Si and hydrophilic SiO2/Si substrates. The growth of the IWL is probed by measuring the height changes in graphene using intermittent contact atomic force microscopy (IC-AFM) and their electrostatic effect is studied using electrostatic force microscopy (EFM) over time. It is found that more IWLs are formed within a shorter period of time, when both as-prepared graphene and underlying substrates are either hydrophobic or hydrophilic in nature. In contrast, AFM voltage nanolithographically patterned trenches on FLG and MLG on the Si substrate show quick formation of IWLs. The effect of IWL formed, on the dimensions of trenches, is correlated with the variation of the measured EFM phase shift over time. This study demonstrates the dependence of the formation of IWLs under ambient conditions on the affinity towards water, at the interface of graphene on hydrophobic and hydrophilic substrates, which has important implications for the performance of graphene-based nanoelectronic devices.

Peak forces and lateral resolution in amplitude modulation force microscopy in liquid

The peak forces exerted on soft and rigid samples by a force microscope have been modeled by performing numerical simulations of the tip motion in liquid. The forces are obtained by using two contact mechanics models, Hertz and Tatara. We present a comparison between the numerical simulations and three analytical models for a wide variety of probe and operational parameters. In general, the forces derived from analytical expressions are not in good quantitative agreement with the simulations when the Young modulus and the set-point amplitude are varied. The only exception is the parametrized approximation that matches the results given by Hertz contact mechanics for soft materials and small free amplitudes. We also study the elastic deformation of the sample as a function of the imaging conditions for materials with a Young modulus between 25 MPa and 2 GPa. High lateral resolution images are predicted by using both small free amplitudes (less than 2 nm for soft materials) and high set-point amplitudes.

Investigation of Nanoscale Interactions by Means of Subharmonic Excitation

Multifrequency atomic force microscopy holds promise as a method to provide qualitative and quantitative information about samples with high spatial resolution. Here, we provide experimental evidence of the excitation of subharmonics in ambient conditions in the regions where capillary interactions are predicted to be the mechanism of excitation. We also experimentally decouple a second mechanism for subharmonic excitation that is highly independent of environmental conditions such as relative humidity. This implies that material properties could be mapped. Subharmonic excitation could lead to experimental determination of surface water affinity in the nanoscale whenever water interactions are the mechanism of excitation.