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Ruder A, Wright B, Peev D, Feder R, Kilic U, Hilfiker M, Schubert E, Herzinger CM, Schubert M. Mueller matrix ellipsometer using dual continuously rotating anisotropic mirrors. OPTICS LETTERS 2020; 45:3541-3544. [PMID: 32630893 DOI: 10.1364/ol.398060] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/19/2020] [Accepted: 05/29/2020] [Indexed: 06/11/2023]
Abstract
We demonstrate calibration and operation of a single wavelength (660 nm) Mueller matrix ellipsometer in normal transmission configuration using dual continuously rotating anisotropic mirrors. The mirrors contain highly spatially coherent nanostructure slanted columnar titanium thin films deposited onto optically thick gold layers on glass substrates. Upon rotation around the mirror normal axis, sufficient modulation of the Stokes parameters of light reflected at oblique angle of incidence is achieved. Thereby, the mirrors can be used as a polarization state generator and polarization state analyzer in a generalized ellipsometry instrument. A Fourier expansion approach is found sufficient to render and calibrate the effects of the mirror rotations onto the polarized light train within the ellipsometer. The Mueller matrix elements of a set of anisotropic samples consisting of a linear polarizer and a linear retarder are measured and compared with model data, and very good agreement is observed.
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Verseils M, Voute A, Langerome B, Deutsch M, Brubach JB, Kalaboukhov A, Nucara A, Calvani P, Roy P. Grazing-angle reflectivity setup for the low-temperature infrared spectroscopy of two-dimensional systems. JOURNAL OF SYNCHROTRON RADIATION 2019; 26:1945-1950. [PMID: 31721739 DOI: 10.1107/s1600577519010920] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/28/2019] [Accepted: 08/04/2019] [Indexed: 06/10/2023]
Abstract
A new optical setup is described that allows the reflectivity at grazing incidence to be measured, including ultrathin films and two-dimensional electron systems (2DES) down to liquid-helium temperatures, by exploiting the Berreman effect and the high brilliance of infrared synchrotron radiation. This apparatus is well adapted to detect the absorption of a 2DES of nanometric thickness, namely that which forms spontaneously at the interface between a thin film of LaAlO3 and its SrTiO3 substrate, and to determine its Drude parameters.
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Affiliation(s)
| | | | | | - Maxime Deutsch
- Synchrotron SOLEIL, St Aubin, 91192 Gif-sur-Yvette, France
| | | | - Alexei Kalaboukhov
- Department of Microtechnology and Nanoscience, Chalmers University, S-41296 Gothenburg, Sweden
| | - Alessandro Nucara
- CNR-SPIN and Dipartimento di Fisica, Università di Roma La Sapienza, 00185 Roma, Italy
| | - Paolo Calvani
- CNR-SPIN and Dipartimento di Fisica, Università di Roma La Sapienza, 00185 Roma, Italy
| | - Pascale Roy
- Synchrotron SOLEIL, St Aubin, 91192 Gif-sur-Yvette, France
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Szaller D, Shuvaev A, Mukhin AA, Kuzmenko AM, Pimenov A. Controlling of light with electromagnons. PHYSICAL SCIENCES REVIEWS 2019. [DOI: 10.1515/psr-2019-0055] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/15/2022]
Abstract
Abstract
Magnetoelectric coupling in multiferroic materials opens new routes to control the propagation of light. The new effects arise due to dynamic magnetoelectric susceptibility that cross-couples the electric and magnetic fields of light and modifies the solutions of Maxwell equations in media. In this paper, two major effects will be considered in detail: optical activity and asymmetric propagation. In case of optical activity the polarization plane of the input radiation rotates by an angle proportional to the magnetoelectric susceptibility. The asymmetric propagation is a counter-intuitive phenomenon and it represents different transmission coefficients for forward and backward directions. Both effects are especially strong close to resonance frequencies of electromagnons, i. e. excitations in multiferroic materials that reveal simultaneous electric and magnetic character.
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Affiliation(s)
- D. Szaller
- Institute of Solid State Physics , Vienna University of Technology , Vienna 1040 , Austria
| | - A. Shuvaev
- Institute of Solid State Physics , Vienna University of Technology , Vienna 1040 , Austria
| | - A. A. Mukhin
- Prokhorov General Physics Institute, Russian Academy of Sciences , Moscow 119991 , Russian Federation
| | - A. M. Kuzmenko
- Prokhorov General Physics Institute, Russian Academy of Sciences , Moscow 119991 , Russian Federation
| | - A. Pimenov
- Institute of Solid State Physics , Vienna University of Technology , Vienna 1040 , Austria
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Furchner A, Kratz C, Hinrichs K. Sub-second infrared broadband-laser single-shot phase-amplitude polarimetry of thin films. OPTICS LETTERS 2019; 44:4387-4390. [PMID: 31465416 DOI: 10.1364/ol.44.004387] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/10/2019] [Accepted: 07/29/2019] [Indexed: 06/10/2023]
Abstract
We report on the first, to the best of our knowledge, sub-second, sub-mm2 infrared (IR) spectroscopic measurements of thin organic films employing a laser-based phase-amplitude polarimeter in reflection geometry. The polarimeter uses a broadband mid-IR quantum cascade laser tunable between 1318 cm-1 and 1765 cm-1, as well as a single-shot beam division scheme for simultaneous single-pulse phase and amplitude measurements. The instrument achieves 120 μm spatial and <0.5 cm-1 spectral resolution, while providing unrivaled performance in terms of acquisition times. Spectral measurements within 100 ms and single-wavelength tracking at 16 μs are now possible. Investigating the vibrational properties accessible in the mid-IR, the polarimeter was applied for monitoring changes in molecular interactions of a 150 nm thin myristic acid film during its thermal phase transition around 55°C.
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Sirenko AA, Marsik P, Bernhard C, Stanislavchuk TN, Kiryukhin V, Cheong SW. Terahertz Vortex Beam as a Spectroscopic Probe of Magnetic Excitations. PHYSICAL REVIEW LETTERS 2019; 122:237401. [PMID: 31298919 DOI: 10.1103/physrevlett.122.237401] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/20/2019] [Indexed: 06/10/2023]
Abstract
Circularly polarized light with spin angular momentum is one of the most valuable probes of magnetism. We demonstrate that light beams with orbital angular momentum (OAM), or vortex beams, can also couple to magnetism exhibiting dichroisms in a magnetized medium. Resonant optical absorption in a ferrimagnetic crystal depends strongly on both the handedness of the vortex and the direction of the beam propagation with respect to the sample magnetization. This effect exceeds the conventional dichroism for circularly polarized light. Our results demonstrate the high potential of the vortex beams with OAM as a new spectroscopic probe of magnetism in matter.
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Affiliation(s)
- A A Sirenko
- Department of Physics, New Jersey Institute of Technology, Newark, New Jersey 07102, USA
| | - P Marsik
- Department of Physics, University of Fribourg, CH-1700 Fribourg, Switzerland
| | - C Bernhard
- Department of Physics, University of Fribourg, CH-1700 Fribourg, Switzerland
| | - T N Stanislavchuk
- Department of Physics, New Jersey Institute of Technology, Newark, New Jersey 07102, USA
| | - V Kiryukhin
- Rutgers Center for Emergent Materials and Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey 08854, USA
| | - S-W Cheong
- Rutgers Center for Emergent Materials and Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey 08854, USA
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Knight S, Prabhakaran D, Binek C, Schubert M. Electromagnon excitation in cupric oxide measured by Fabry-Pérot enhanced terahertz Mueller matrix ellipsometry. Sci Rep 2019; 9:1353. [PMID: 30718629 PMCID: PMC6362027 DOI: 10.1038/s41598-018-37639-8] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/23/2018] [Accepted: 12/10/2018] [Indexed: 11/18/2022] Open
Abstract
Here we present the use of Fabry-Pérot enhanced terahertz (THz) Mueller matrix ellipsometry to measure an electromagnon excitation in monoclinic cupric oxide (CuO). As a magnetically induced ferroelectric multiferroic, CuO exhibits coupling between electric and magnetic order. This gives rise to special quasiparticle excitations at THz frequencies called electromagnons. In order to measure the electromagnons in CuO, we exploit single-crystal CuO as a THz Fabry-Pérot cavity to resonantly enhance the excitation’s signature. This enhancement technique enables the complex index of refraction to be extracted. We observe a peak in the absorption coefficient near 0.705 THz and 215 K, which corresponds to the electromagnon excitation. This absorption peak is observed along only one major polarizability axis in the monoclinic a–c plane. We show the excitation can be represented using the Lorentz oscillator model, and discuss how these Lorentz parameters evolve with temperature. Our findings are in excellent agreement with previous characterizations by THz time-domain spectroscopy (THz-TDS), which demonstrates the validity of this enhancement technique.
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Affiliation(s)
- Sean Knight
- Department of Electrical and Computer Engineering, University of Nebraska-Lincoln, Lincoln, Nebraska, 68588-0511, USA.
| | - Dharmalingam Prabhakaran
- Department of Physics, Clarendon Laboratory, University of Oxford, Parks Road, Oxford, OX1 3PU, United Kingdom
| | - Christian Binek
- Department of Physics and Astronomy, University of Nebraska-Lincoln, Lincoln, Nebraska, 68588-0511, USA
| | - Mathias Schubert
- Department of Electrical and Computer Engineering, University of Nebraska-Lincoln, Lincoln, Nebraska, 68588-0511, USA.,Terahertz Materials Analysis Center, Department of Physics, Chemistry and Biology, Linköping University, SE-58183, Linköping, Sweden.,Leibniz-Institut für Polymerforschung Dresden e.V., Dresden, 01069, Germany
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Garcia-Caurel E, Lizana A, Ndong G, Al-Bugami B, Bernon C, Al-Qahtani E, Rengnez F, de Martino A. Mid-infrared Mueller ellipsometer with pseudo-achromatic optical elements. APPLIED OPTICS 2015; 54:2776-2785. [PMID: 25967189 DOI: 10.1364/ao.54.002776] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/09/2014] [Accepted: 02/21/2015] [Indexed: 06/04/2023]
Abstract
The purpose of this article is to present a new broadband Mueller ellipsometer designed to work in the mid-infrared range, from 3 to 14 μm. The Mueller ellipsometer, which can be mounted in reflection or in transmission configuration, consists of a polarization state generator (PSG), a sample holder, and a polarization state analyzer (PSA). The PSG consists of one linear polarizer and a retarder sequentially rotated to generate a set of four optimal polarization states. The retarder consists of a biprism made of two identical Fresnel rhombs disposed symmetrically and joined by an optical contact, giving the ensemble a "V" shape. Retardation is induced by the four total internal reflections that the beam undergoes when it propagates through the biprism. Total internal reflection allows the generation of a quasi-achromatic retardation. The PSA is identical to the PSG, but with its optical elements mounted in reverse order. After a measurement run, the instrument yields a set of sixteen independent values, which is the minimum amount of data required to calculate the Mueller matrix of the sample. The design of the Mueller ellipsometer is based on the optimization of an objective criterion that allows for minimizing the propagation of errors from raw data to the Mueller matrix of the sample. The pseudo-achromatic optical elements ensure a homogeneous quality of the measurements for all wavelengths. The performance of the Mueller ellipsometer, in terms of precision and accuracy, is discussed and illustrated with a few examples.
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Kühne P, Herzinger CM, Schubert M, Woollam JA, Hofmann T. Invited article: An integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2014; 85:071301. [PMID: 25085120 DOI: 10.1063/1.4889920] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
Abstract
We report on the development of the first integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument, covering an ultra wide spectral range from 3 cm(-1) to 7000 cm(-1) (0.1-210 THz or 0.4-870 meV). The instrument comprises four sub-systems, where the magneto-cryostat-transfer sub-system enables the usage of the magneto-cryostat sub-system with the mid-infrared ellipsometer sub-system, and the far-infrared/terahertz ellipsometer sub-system. Both ellipsometer sub-systems can be used as variable angle-of-incidence spectroscopic ellipsometers in reflection or transmission mode, and are equipped with multiple light sources and detectors. The ellipsometer sub-systems are operated in polarizer-sample-rotating-analyzer configuration granting access to the upper left 3 × 3 block of the normalized 4 × 4 Mueller matrix. The closed cycle magneto-cryostat sub-system provides sample temperatures between room temperature and 1.4 K and magnetic fields up to 8 T, enabling the detection of transverse and longitudinal magnetic field-induced birefringence. We discuss theoretical background and practical realization of the integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument, as well as acquisition of optical Hall effect data and the corresponding model analysis procedures. Exemplarily, epitaxial graphene grown on 6H-SiC, a tellurium doped bulk GaAs sample and an AlGaN/GaN high electron mobility transistor structure are investigated. The selected experimental datasets display the full spectral, magnetic field and temperature range of the instrument and demonstrate data analysis strategies. Effects from free charge carriers in two dimensional confinement and in a volume material, as well as quantum mechanical effects (inter-Landau-level transitions) are observed and discussed exemplarily.
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Affiliation(s)
- P Kühne
- Department of Electrical Engineering and Center for Nanohybrid Functional Materials, University of Nebraska-Lincoln, Lincoln, Nebraska 68588, USA
| | - C M Herzinger
- J. A. Woollam Co., Inc., 645 M Street, Suite 102, Lincoln, Nebraska 68508-2243, USA
| | - M Schubert
- Department of Electrical Engineering and Center for Nanohybrid Functional Materials, University of Nebraska-Lincoln, Lincoln, Nebraska 68588, USA
| | - J A Woollam
- J. A. Woollam Co., Inc., 645 M Street, Suite 102, Lincoln, Nebraska 68508-2243, USA
| | - T Hofmann
- Department of Electrical Engineering and Center for Nanohybrid Functional Materials, University of Nebraska-Lincoln, Lincoln, Nebraska 68588, USA
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