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Matos RS, Pinto EP, Pires MA, Ramos GQ, Ţălu Ş, Lima LS, da Fonseca Filho HD. Evaluating the roughness dynamics of kefir biofilms grown on Amazon cupuaçu juice: a monofractal and multifractal approach. Microscopy (Oxf) 2024; 73:55-65. [PMID: 37540558 DOI: 10.1093/jmicro/dfad040] [Citation(s) in RCA: 3] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/03/2023] [Revised: 05/22/2023] [Accepted: 07/17/2023] [Indexed: 08/05/2023] Open
Abstract
We conducted a comprehensive analysis of the surface microtexture of kefir biofilms grown on Theobroma grandiflorum Shum (cupuaçu) juice using atomic force microscopy. Our goal was to investigate the unique monofractal and multifractal spatial patterns of these biofilms to complement the existing limited literature. The biofilms were prepared dispersing four different concentrations of kefir grains in cupuaçu juice. Our morphological analysis showed that the surface of the obtained biofilms is essentially formed by the presence of cupuaçu fibers and microorganisms like lactobacilli and yeast. The topographic height-based parameter analysis reveals that there is a dependence between surface roughness and the concentration of kefir grains used. The strongly anisotropic well-centralized topographical height distribution of the biofilms also exhibited a quasi-symmetrical and platykurtic pattern. The biofilms exhibit comparable levels of spatial complexity, surface percolation and surface homogeneity, which can be attributed to their similar topographic uniformity. This aspect was further supported by the presence of similar multifractality in the biofilms, suggesting that despite their varying topographic roughness, their vertical growth dynamics follow a similar pattern. Our findings demonstrate that the surface roughness of kefir biofilms cultivated on cupuaçu juice is influenced by the concentration of kefir grains in the precursor solution. However, this dependence follows a consistent pattern across different concentrations. Graphical Abstract.
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Affiliation(s)
- Robert S Matos
- Amazonian Materials Group, Department of Physics, Federal University of Amapá-UNIFAP, Rod. Juscelino Kubitscheck, km 02 - Jardim Marco Zero, Macapá, Amapá 68.903-419, Brazil
| | - Erveton P Pinto
- Amazonian Materials Group, Department of Physics, Federal University of Amapá-UNIFAP, Rod. Juscelino Kubitscheck, km 02 - Jardim Marco Zero, Macapá, Amapá 68.903-419, Brazil
| | - Marcelo A Pires
- Department of Physiscs, Federal University of Alagoas-UFAL, Rodovia AL 145, Km 3, 3849 - Cidade Universitária, Delmiro Gouveia, Alagoas 57.480-000, Brazil
| | - Glenda Q Ramos
- Centro Multiusuário para Análise de Fenômenos Biomédicos da Universidade do Estado do Amazonas, Universidade do Estado do Amazonas-UEA, Av. Carvalho Leal, 1777 - Cachoeirinha, Amazonas 69.065-001, Brazil
| | - Ştefan Ţălu
- Technical University of Cluj-Napoca, The Directorate of Research, Development and Innovation Management (DMCDI), Constantin Daicoviciu St., no. 15, Cluj-Napoca, Cluj County 400020, Romania
| | - Lucas S Lima
- Laboratory of Corrosion and Nanotechnology (LCNT), Federal University of Sergipe-UFS, Cidade Universitária Prof. "José Aloísio de Campos" Av. Marechal Rondom, S/N - Jardim Rosa Elze, São Cristovão, Sergipe 49.100-000, Brazil
| | - Henrique D da Fonseca Filho
- Laboratory of Synthesis of Nanomaterials and Nanoscopy, Department of Physics, Federal University of Amazonas-UFAM, Av. General Rodrigo Octavio Jordão Ramos, 1200 - Coroado I, Manaus, Amazonas 69.067-005, Brazil
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Dalouji V, Goudarzi S. Three-Dimensional Surface Stereometric Analysis of Ni-Cu Films with Different Cu Contents. ACS OMEGA 2024; 9:4339-4346. [PMID: 38313472 PMCID: PMC10831855 DOI: 10.1021/acsomega.3c06181] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 08/20/2023] [Revised: 01/02/2024] [Accepted: 01/08/2024] [Indexed: 02/06/2024]
Abstract
The purpose of this work is a stereometric analysis of Ni-Cu thin films to obtain the three-dimensional (3D) microtexture surface based on atomic force microscopy (AFM). Four Ni-Cu thin films on glass and silicon substrates were prepared by a capacitively coupled RF-PECVD system with a 13.56 MHz power supply. The AFM data of the samples were stereometrically analyzed, and the surface microtexture was determined according to the definition of relevant parameters in the standards ISO 25178-2:2012 and ASME B46.1-2009. All microtexture features can be implemented in numerical programs to simulate advanced microtexture models under specific microstructure and composition conditions. The results can be used to validate theoretical models for predicting or correlating the surface parameters of nanostructures. The Ni-Cu films with 40% Cu have a more irregular surface; hence, the maximum Sq value of the as-deposited Ni-Cu films is about 81.24 μm. The core roughness height Sk is calculated as a difference between two extreme levels (maximal and minimal) of the surface core, for which Ni-Cu films with 40% Cu have a maximum value of 183.4 μm. Since the surface kurtosis (Sku) of all sample films was lower than 7, there are very small peaks or valleys on the film surface and for Ni-Cu films with 5% Cu with a value of 3.568. With increasing Cu content, the height distribution histograms of films show more uniform distributions.
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Affiliation(s)
- Vali Dalouji
- Department of Physics, Faculty
of Science, Malayer University, Malayer, Iran
| | - Samira Goudarzi
- Department of Physics, Faculty
of Science, Malayer University, Malayer, Iran
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Pandey RK, Yadav RP, Kumar T, Kumar A, Pathak S, Awasthi S, Singh UB, Pandey AC. Fractal characterizations of MeV ion treated CaF 2 thin films. CHAOS (WOODBURY, N.Y.) 2023; 33:033110. [PMID: 37003822 DOI: 10.1063/5.0135127] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/16/2022] [Accepted: 02/13/2023] [Indexed: 06/19/2023]
Abstract
We present the morphological evolution and fractal characterizations of CaF2 thin-film surfaces modified by bombardment with 100 MeV Au+8 ions at various fluences. Atomic force microscopy (AFM) combined with line profile and two-dimensional power spectral density (2D-PSD) analysis was utilized to investigate the evolution of surface morphology as a function of fluence. The AFM images were utilized to investigate the relationship between fractal dimension, roughness exponent, lateral correlation length, and ion fluence. The surface erosion owing to sputtering was depicted using Rutherford backscattering spectrometry. The structural characteristics' dependency on fluence was explored with the help of glancing angle x-ray diffraction measurements on virgin and irradiated samples. Tensile stress calculated using a peak shift in the glancing angle x-ray diffractogram showed an increase in tensile stress with fluence that caused the surface to crack after the fracture strength of the surface was crossed. 2D-PSD analysis signified the role of sputtering over surface diffusion for the observed surface modifications. Fractal dimensions first increased and then decreased with ion fluence. The lateral correlation length decreased, while the roughness exponent increased with fluence after the threshold value.
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Affiliation(s)
- Ratnesh K Pandey
- Department of Physics, School of Engineering, University of Petroleum and Energy Studies, Dehradun 248007, Uttarakhand, India
| | - Ram Pratap Yadav
- Department of Physics, Deen Dayal Upadhyay Govt. P.G. College, Saidabad, Allahabad 221508, India
| | - Tanuj Kumar
- Department of Nanosciences and Materials, Central University of Jammu, Rahya-Suchani, Bagla 181143, Jammu, India
| | - Ashish Kumar
- Department of Physics, School of Engineering, University of Petroleum and Energy Studies, Dehradun 248007, Uttarakhand, India
| | - Sachin Pathak
- Department of Physics, School of Engineering, University of Petroleum and Energy Studies, Dehradun 248007, Uttarakhand, India
| | - Shikha Awasthi
- Department of Physics, MM Mahila Mahavidyalaya, Ara 802301, India
| | - Udai B Singh
- Department of Physics, Deen Dayal Upadhyaya Gorakhpur University, 273009 Gorakhpur, India
| | - Avinash C Pandey
- Inter University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi 110067, India
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Matos RS, da Costa ÍC, Yasumura HD, de Azevedo SG, Sanches EA, da Fonseca Filho HD. Nanoscale surface dynamics of spatial patterns of polymeric bilayered particles loaded with essential oil. Microsc Res Tech 2022; 85:3633-3641. [PMID: 35916245 DOI: 10.1002/jemt.24216] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/21/2022] [Revised: 07/04/2022] [Accepted: 07/18/2022] [Indexed: 11/10/2022]
Abstract
Gelatin/PCL bilayered particles loaded with Piper nigrum essential oil was synthesized aiming to access their morphological and surface dynamic patterns. Atomic force microscopy (AFM) was applied to investigate the 3D morphology and multifractal aspects of the particles surface. The AFM maps revealed spherical surfaces and well dispersed particles, besides a rougher surface on the loaded system. Minkowski functionals showed that shape of the rough peaks was similar in the unloaded and loaded systems; however, the presence of deep valleys on the loaded particles revealed their rougher pattern. Multifractal analysis revealed that unloaded and loaded particles presented multifractal behavior with different surface dynamics. The loaded surface presented a greater width of the multifractal spectrum and smaller difference of fractal dimensions, confirming their more vertically growing. These results can be useful in the development of novel polymeric-based particles loaded with essential oil. Their unique surface dynamics can provide enhanced physical properties and performance in emerging biotechnological applications.
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Affiliation(s)
- Robert Saraiva Matos
- Departamento de Física, Universidade Federal do Amapá (UNIFAP), Amazonian Materials Group, Macapá, Amapá, Brazil
| | - Ítalo Carvalho da Costa
- Programa de Pós-graduação em Ciência e Engenharia de Materiais (PPGCEM), Universidade Federal do Amazonas (UFAM), Manaus, Amazonas, Brazil
| | - Heloisa David Yasumura
- Laboratório de Síntese de Nanomateriais e Nanoscopia (LSNN), Universidade Federal do Amazonas (UFAM), Manaus, Amazonas, Brazil
| | - Sidney Gomes de Azevedo
- Laboratório de Polímeros Nanoestruturados (NANOPOL - @nanopol_ufam), Universidade Federal do Amazonas (UFAM), Manaus, Amazonas, Brazil
| | - Edgar Aparecido Sanches
- Laboratório de Polímeros Nanoestruturados (NANOPOL - @nanopol_ufam), Universidade Federal do Amazonas (UFAM), Manaus, Amazonas, Brazil
| | - Henrique Duarte da Fonseca Filho
- Programa de Pós-graduação em Ciência e Engenharia de Materiais (PPGCEM), Universidade Federal do Amazonas (UFAM), Manaus, Amazonas, Brazil.,Laboratório de Síntese de Nanomateriais e Nanoscopia (LSNN), Universidade Federal do Amazonas (UFAM), Manaus, Amazonas, Brazil
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Abstract
The development and efficient production of effective bioplastics is a hot topic, required to face up to the issue of the difficult disposal of plastics derived from oil. Among the different natural sources of bioplastics, starch is one of the most promising. However, for most applications, the proper mastering of the surface properties of bioplastic is necessary. We report about the surface modification of extruded corn starch films by means of cold plasma based on helium (He) and hexamethyldisiloxane (HMDSO). The differently treated surfaces were functionally characterized in wettability and water absorption. The nanoscale morphology was assessed by scanning electron microscopy and atomic force microscopy. The obtained images were analyzed by advanced figures describing both texture and amplitude parameters, including fractal behavior. The combined treatment (He/HMDSO) resulted in more homogeneous films with smaller, better-distributed grains compared to the case wherein He was not used. Despite the different morphologies observed, starch coated by HMDSO alone and by He/HMDSO presented similar hydrophobic character, with contact angles higher than 110°. Plasma treatment with HMDSO and He/HMDSO resulted in a significant reduction of absorbed water content without reduction of water vapor permeability. The nanotexture of the films did not present statistically significant differences, in terms of spatial complexities, dominant spatial frequencies, homogeneous void distribution, and surface percolation.
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Abstract
The topographies of various surfaces have been studied in many fields due to the significant influence that surfaces have on the practical performance of a given sample. A comprehensive evaluation requires the assistance of fractal analysis, which is of significant importance for modern science and technology. Due to the deep insights of fractal theory, fractal analysis on surface topographies has been widely applied and recommended. In this paper, the remarkable uprising in recent decades of fractal analysis on the surfaces of thin films, an essential domain of surface engineering, is reviewed. By summarizing the methods used to calculate fractal dimension and the deposition techniques of thin films, the results and trends of fractal analysis are associated with the microstructure, deposition parameters, etc. and this contributes profoundly to exploring the mechanism of film growth under different conditions. Choosing appropriate methods of surface characterization and calculation methods to study diverse surfaces is the main challenge of current research on thin film surface topography by using fractal theory. Prospective developing trends are proposed based on the data extraction and statistics of the published literature in this field.
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Yadav M, Yadav RP, Priya PK, Bhasker HP, Ţălu Ş, Mittal AK, Matos RS. Effect of Fe Doping on the Surface Morphology and Supercapacitor Properties of Sr(OH) 2 Thin Films: A Fractal Approach. THE JOURNAL OF PHYSICAL CHEMISTRY C 2021. [DOI: 10.1021/acs.jpcc.1c06668] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
Affiliation(s)
- Madhavi Yadav
- Department of Physics (MMV), Banaras Hindu University, Varanasi 221005, India
| | - Ram P. Yadav
- Department of Physics, Deen Dayal Upadhyay Govt. P. G. College, Saidabad, Prayagraj 221508, India
| | - Pradip K. Priya
- Department of Physics, Ewing Christian College, University of Allahabad, Prayagraj 211 003, India
| | - Hari P. Bhasker
- Department of Physics, Chaudhary Mahadeo Prasad Degree College, University of Allahabad, Prayagraj 211002, India
| | - Ştefan Ţălu
- The Directorate of Research, Development and Innovation Management (DMCDI), Technical University of Cluj-Napoca,, Constantin Daicoviciu St., no. 15, Cluj-Napoca 400020, Cluj County, Romania
| | - Ashok K. Mittal
- Department of Physics, University of Allahabad, Prayagraj 211002, India
| | - Robert Saraiva Matos
- Amazonian Materials Group, Physics Department, Federal University of Amapá, 68903-419 Amapá, Brazil
- Materials Engineering Department, Federal University of Sergipe, Sergipe 49100-000, Brazil
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Rezaee S. The effect of deposition times in DC-magnetron sputtering on micromorphology of TiO 2 thin films. Microsc Res Tech 2021; 84:1475-1483. [PMID: 33491242 DOI: 10.1002/jemt.23703] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/07/2020] [Revised: 12/30/2020] [Accepted: 01/04/2021] [Indexed: 11/11/2022]
Abstract
TiO2 thin films have been prepared by DC-magnetron sputtering process with various deposition times (8, 14, 16, and 20 min) and the micromorphology of their surface has been investigated by means of multifractal analysis. As the main purpose of the manuscript, the topography of all samples are examined by atomic force microscopy (AFM) through the Mountains Map® Premium software which characterizes motifs of significant peaks and pits through stereometric data by the watershed segmentation algorithm. In addition, multifractal features of samples provide deeper insight into texture characteristics and used as the supplementary of the results.
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Affiliation(s)
- Sahar Rezaee
- Department of Physics, Kermanshah Branch, Islamic Azad University, Kermanshah, Iran
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Yadav RP, Baranwal V, Kumar S, Pandey AC, Mittal AK. Multifractal analysis of SiO2 surface embedded with Ge nanocrystal. APPLIED NANOSCIENCE 2020. [DOI: 10.1007/s13204-020-01626-1] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
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10
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Averaged power spectrum density, fractal and multifractal spectra of Au nano-particles deposited onto annealed TiO2 thin films. OPTICAL AND QUANTUM ELECTRONICS 2020. [DOI: 10.1007/s11082-020-02584-2] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
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Ito RM, de Souza CC, Gandarilla AMD, de Oliveira LM, Brito WR, Sanches EA, Matos RS, da Fonseca Filho HD. Micromorphology and microtexture evaluation of poly(o-ethoxyaniline) films using atomic force microscopy and fractal analysis. JOURNAL OF POLYMER RESEARCH 2020. [DOI: 10.1007/s10965-020-02262-7] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
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Robustness of Surface Roughness against Low Number of Picture Elements and Its Benefit for Scaling Analysis. COATINGS 2020. [DOI: 10.3390/coatings10080776] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
Abstract
Surface roughness is widely used in the research of topography, and the scaling characteristics of roughness have been noticed in many fields. To rapidly obtain the relationship between root-mean-squared roughness (Rq) and measurement scale (L) could be helpful to achieve more understandings of the surface property, particularly the Rq-L curve could be fitted to calculate the fractal dimension (D). In this study, the robustness of Rq against low number of picture elements was investigated. Artificial surfaces and the surfaces of two actual samples (a silver thin film and a milled workpiece) were selected. When the number of picture elements was lowered, Rq was found to be stable within a large portion of the concerned scope. Such a robustness property could validate the feasibility of Rq-L curve obtained by segmenting a single morphological picture with roughness scaling extraction (RSE) method, which was proposed in our previous study. Since the traditional roughness (TR) method to obtain Rq-L curves was based on multiple pictures, which used a fixed number of picture elements at various L, RSE method could be significantly more rapid than TR method. Moreover, a direct comparison was carried out between RSE method and TR method in calculating the Rq-L curve and D, and the credibility and accuracy of RSE method with flatten order 1 and 2 was verified.
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Stereometric analysis of TiO2 thin films deposited by electron beam ion assisted. OPTICAL AND QUANTUM ELECTRONICS 2020. [DOI: 10.1007/s11082-020-02388-4] [Citation(s) in RCA: 12] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
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Panigrahy C, Seal A, Mahato NK. Image texture surface analysis using an improved differential box counting based fractal dimension. POWDER TECHNOL 2020. [DOI: 10.1016/j.powtec.2020.01.053] [Citation(s) in RCA: 19] [Impact Index Per Article: 4.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/16/2022]
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Multifractal and optical bandgap characterization of Ta2O5 thin films deposited by electron gun method. OPTICAL AND QUANTUM ELECTRONICS 2020. [DOI: 10.1007/s11082-019-2173-5] [Citation(s) in RCA: 17] [Impact Index Per Article: 4.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
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Sadeghi M, Rezaee S, Arman A, Ţălu Ş, Luna C, Shakoury R. Study of the formation of tungsten powder by hydrogen reduction of ammonium paratungstate and stereometric analyses of the powder texture. MATERIALS RESEARCH EXPRESS 2020. [DOI: 10.1088/2053-1591/ab6763] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
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Abstract
Abstract
The purpose of this work is the study of the correlation between the thickness of tantalum pentoxide thin films and their three-dimensional (3D) micromorphology. The samples were prepared on silicon substrates by electron beam evaporation. The differences in surface structure of the processed and reference samples were investigated. Compositional studies were performed by energy-dispersive X-ray spectroscopy. Stereometric analysis was carried out on the basis of atomic force microscopy (AFM) data, for tantalum pentoxide samples with 20 nm, 40 nm, 60 nm, 80 nm and 100 nm thicknesses. These methods are frequently used in describing experimental data of surface nanomorphology of Ta2O5. The results can be used to validate theoretical models for prediction or correlation of nanotexture surface parameters.
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Stach S, Ţălu Ş, Dallaev R, Arman A, Sobola D, Salerno M. Evaluation of the Topographical Surface Changes of Silicon Wafers after Annealing and Plasma Cleaning. SILICON 2019. [DOI: 10.1007/s12633-019-00351-x] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
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Țălu Ș, Ghaderi A, Stępień K, Mwema FM. Advanced Micromorphology Analysis of Cu/Fe NPs Thin Films. ACTA ACUST UNITED AC 2019. [DOI: 10.1088/1757-899x/611/1/012016] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
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Shakoury R, Grayeli Korpi A, Ghosh K, Ţălu Ş, Rezaee S, Mwema F, Mardani M, Arman A. Stereometric and scaling law analysis of surface morphology of stainless steel type AISI 304 coated with Mn: a conventional and fractal evaluation. MATERIALS RESEARCH EXPRESS 2019. [DOI: 10.1088/2053-1591/ab4aa6] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
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Maity G, Ojha S, Sulania I, Devrani K, Patel SP. Fractal characterizations of energetic Si ions irradiated amorphized‐Si surfaces. SURF INTERFACE ANAL 2019. [DOI: 10.1002/sia.6655] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/06/2023]
Affiliation(s)
- G. Maity
- Department of Pure and Applied PhysicsGuru Ghasidas Vishwavidyalaya (A Central University) Bilaspur India
| | - Sunil Ojha
- Inter‐University Accelerator Centre, Aruna Asaf Ali Marg New Delhi India
| | - I. Sulania
- Inter‐University Accelerator Centre, Aruna Asaf Ali Marg New Delhi India
| | - K. Devrani
- Inter‐University Accelerator Centre, Aruna Asaf Ali Marg New Delhi India
| | - Shiv P. Patel
- Department of Pure and Applied PhysicsGuru Ghasidas Vishwavidyalaya (A Central University) Bilaspur India
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Grayeli Korpi A, Ţălu Ş, Bramowicz M, Arman A, Kulesza S, Pszczolkowski B, Jurečka S, Mardani M, Luna C, Balashabadi P, Rezaee S, Gopikishan S. Minkowski functional characterization and fractal analysis of surfaces of titanium nitride films. MATERIALS RESEARCH EXPRESS 2019. [DOI: 10.1088/2053-1591/ab26be] [Citation(s) in RCA: 20] [Impact Index Per Article: 4.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
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Ţălu Ş, Yadav RP, Arman A, Korpi AG, Sobola D, Ţălu M, Rezaee S, Achour A, Jurečka S, Mardani M. Analyzing the fractal feature of nickel thin films surfaces modified by low energy nitrogen ion. VAKUUM IN FORSCHUNG UND PRAXIS 2019. [DOI: 10.1002/vipr.201900703] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/05/2023]
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Rashid D, Stach S, Ţălu Ş, Sobola D, Méndez-Albores A, Córdova GT, Grmela L. Stereometric Analysis of Effects of Heat Stressing on Micromorphology of Si Single Crystals. SILICON 2019. [DOI: 10.1007/s12633-019-0085-4] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
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26
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Ţălu Ş, Yadav RP, Šik O, Sobola D, Dallaev R, Solaymani S, Man O. How topographical surface parameters are correlated with CdTe monocrystal surface oxidation. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING 2018. [DOI: 10.1016/j.mssp.2018.05.030] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
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Ţălu Ş, Yadav RP, Lainović T, Méndez-Albores A, Trejo G, Kukuruzović D, Nezafat NB, Shafiekhani A, Solaymani S. The effect of dental LED light-curing unit photoactivation mode on 3D surface morphology of dental nanocomposites evaluated by two-dimensional multifractal detrended fluctuation analysis. Microsc Res Tech 2018; 81:1223-1230. [PMID: 30351526 DOI: 10.1002/jemt.23123] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/03/2018] [Revised: 08/04/2018] [Accepted: 08/07/2018] [Indexed: 02/05/2023]
Abstract
The objective of this study was to evaluate the effect of two photoactivation modes of dental LED light-curing unit (LCUs) (conventional and "Soft Start" mode) on surface texture parameters of two dental resin-based nanocomposites. LED LCUs were considered as standard light-curing devices in contemporary dental practice. Atomic force microscopy (AFM) was applied to investigate surface morphology on 90 × 90 μm2 scanning area through 2D multifractal detrended fluctuation analysis with computational algorithms basis. In order to compare 3D surface roughness at nanometer scale, singularity spectrum f[α] was used which characterize local scale properties of multifractal nature of samples. The results confirmed that larger spectrum width Δα (Δα = αmax - αmin ) of f(α) is associated with non-uniform surface morphology. Moreover, materials whose polymerization was photoactivated by the "soft start" polymerization mode, showed better quality of the surface microstructure with lower values of AFM surface texture parameters.
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Affiliation(s)
- Ştefan Ţălu
- The Directorate of Research, Development and Innovation Management (DMCDI), Technical University of Cluj-Napoca, Cluj-Napoca, Cluj County, Romania
| | | | - Tijana Lainović
- Faculty of Medicine, School of Dentistry, University of Novi Sad, Novi Sad, Serbia
| | - Alia Méndez-Albores
- Institute of Sciences-ICUAP Benemérita Universidad Autónoma de Puebla, Ciudad Universitaria Puebla, Puebla, Mexico
| | - Gabriel Trejo
- Center of Research and Technological Development in Electrochemistry (CIDETEQ), Parque Tecnológico Sanfandila, Querétaro, Mexico
| | | | - Negin Beryani Nezafat
- Young Researchers and Elite Club, West Tehran Branch, Islamic Azad University, Tehran, Iran
| | | | - Shahram Solaymani
- Young Researchers and Elite Club, West Tehran Branch, Islamic Azad University, Tehran, Iran
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Das PK, Biswal R, Choudhary RJ, Ganesan V, Mallick P. Evolution of surface topography and optical band gap of ZnO film deposited on NiO/Si(100). SURF INTERFACE ANAL 2017. [DOI: 10.1002/sia.6365] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
Affiliation(s)
- P. K. Das
- Department of Physics; North Orissa University; Baripada 757003 India
| | - R. Biswal
- Department of Applied Physics and Ballistics; Fakir Mohan University; Balasore 756019 India
| | - R. J. Choudhary
- UGC-DAE Consortium for Scientific Research; Khandwa Road Indore 452 017 India
| | - V. Ganesan
- UGC-DAE Consortium for Scientific Research; Khandwa Road Indore 452 017 India
| | - P. Mallick
- Department of Physics; North Orissa University; Baripada 757003 India
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Țălu Ș, Yadav RP, Mittal AK, Achour A, Luna C, Mardani M, Solaymani S, Arman A, Hafezi F, Ahmadpourian A, Naderi S, Saghi K, Méndez A, Trejo G. Application of Mie theory and fractal models to determine the optical and surface roughness of Ag–Cu thin films. OPTICAL AND QUANTUM ELECTRONICS 2017. [DOI: 10.1007/s11082-017-1079-3] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
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Oksengendler B, Ashurov N, Maksimov S, Karpova O, Rashidova S. Role of Fractals in Perovskite Solar Cells. EURASIAN CHEMICO-TECHNOLOGICAL JOURNAL 2017. [DOI: 10.18321/ectj471] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022] Open
Abstract
The interface engineering plays important role in fabrication of the tandem and perovskite based solar cells. Recent experiments show that the interface effects caused by the coupling of the electron bands and the pairing of geometry of contacting surfaces. In particular, it has been experimentally revealed that the transition from planar to the rough interface improves many photoelectric parameters of the<br />device. It means that the value of the fractal dimension of the interface may be key factor in device performance. It is possible to formulate two problems: firstly, the understanding on simple models why the electrical properties at fractal interfaces are improved, and, secondly, to discuss one of the most promising approaches in modern electronics, namely technology of radiation applications in the creation of rough interfaces. Thirdly, the problem of photodegradation is analyzed in detail in the structures containing the fractal interfaces. On the basis of the constructed models, it was found: i) increase of roughness (fractal) of interface structure can enhance the role of total internal light reflection effect, thereby increasing the effective light path, and therefore, the number of generated e-h-pairs; ii) the curvature of the surface leads to the shift of Tamm levels both to the borders of allowed bands, and to the middle of the band gap; it opens the way of the control of carrier recombination on the interface; iii) surface Tamm orbitals interact differently each with other on the convex and concave areas; it leads to the different probability of defect formation and, consequently, reduces the fractal interface, inhibiting the effect of increasing of the photocurrent associated with the fractal interface (new channel of photodegradation).
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Ţălu Ş, Bramowicz M, Kulesza S, Ghaderi A, Dalouji V, Solaymani S, Khalaj Z. Microstructure and micromorphology of Cu/Co nanoparticles: Surface texture analysis. ELECTRONIC MATERIALS LETTERS 2016. [DOI: 10.1007/s13391-016-6036-y] [Citation(s) in RCA: 17] [Impact Index Per Article: 2.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
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Micromorphology and fractal analysis of nickel–carbon composite thin films. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 2016. [DOI: 10.1007/s10854-016-5268-9] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
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Li JH, Wang F, Li JW, Zou RB, Liao GP. Multifractal methods for rapeseed nitrogen nutrition qualitative diagnosis modeling. INT J BIOMATH 2016. [DOI: 10.1142/s1793524516500649] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/18/2022]
Abstract
Nutrition diagnosis plays a key role in the crop’s growth, which has mainly been carried out in the field by agricultural workers. Currently, automatic nutrition recognition technologies have been widely used in this field. A procedure is proposed in this paper to diagnose nitrogen nutrition non-destructively for rapeseed qualitatively based on the multifractal theory. Twelve texture parameters are given by the method of multifractal detrended fluctuation (MF-DFA), which contains six generalized Hurst exponents and six relative multifractal parameters that are used as features of the rapeseed leaf images for identifying the two nitrogen levels, namely, the [Formula: see text]-mezzo and the [Formula: see text]-wane. For the base leaves, central leaves and top leaves of the rapeseed plant and the three-section mixed samples, three parameters combinations are selected to conduct the work. Five classifiers of Fisher’s linear discriminant algorithm (LDA), extreme learning machine (ELM), support vector machine and kernel method (SVMKM), random decision forests (RF) and [Formula: see text]-nearest neighbor algorithm (KNN) are employed to calculate the diagnosis accuracy. An interesting finding is that the best diagnose accuracy is from the base leaves of the rapeseed plant. It is explained that the base leaf is the most sensitive to the nitrogen deficiency. The diagnose effect by the base leaves samples is outshining the existing result significantly for the same leaves samples. For the mixed samples, the averaged discriminant accuracy reaches 97.12% and 97.56% by SVMKM and RF methods with the [Formula: see text]-fold cross-validation respectively. The resulting high accuracy on [Formula: see text]-levels identification shows the feasibility and efficiency of our method.
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Affiliation(s)
- Jian-Hui Li
- Agricultural Information Institute, Hunan Agricultural University, Changsha 410128, P. R. China
- Southern Regional Collaborative Innovation Center for Grain and Oil Crops in China, Changsha 410128, P. R. China
| | - Fang Wang
- Agricultural Information Institute, Hunan Agricultural University, Changsha 410128, P. R. China
- Southern Regional Collaborative Innovation Center for Grain and Oil Crops in China, Changsha 410128, P. R. China
- College of Science, Hunan Agricultural University, Changsha 410128, P. R. China
| | - Jin-Wei Li
- Agricultural Information Institute, Hunan Agricultural University, Changsha 410128, P. R. China
- Southern Regional Collaborative Innovation Center for Grain and Oil Crops in China, Changsha 410128, P. R. China
| | - Rui-Biao Zou
- College of Science, Hunan Agricultural University, Changsha 410128, P. R. China
| | - Gui-Ping Liao
- Agricultural Information Institute, Hunan Agricultural University, Changsha 410128, P. R. China
- Southern Regional Collaborative Innovation Center for Grain and Oil Crops in China, Changsha 410128, P. R. China
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