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For: Yadav RP, Kumar M, Mittal AK, Pandey AC. Fractal and multifractal characteristics of swift heavy ion induced self-affine nanostructured BaF2 thin film surfaces. Chaos 2015;25:083115. [PMID: 26328566 DOI: 10.1063/1.4928695] [Citation(s) in RCA: 33] [Impact Index Per Article: 3.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Number Cited by Other Article(s)
1
Matos RS, Pinto EP, Pires MA, Ramos GQ, Ţălu Ş, Lima LS, da Fonseca Filho HD. Evaluating the roughness dynamics of kefir biofilms grown on Amazon cupuaçu juice: a monofractal and multifractal approach. Microscopy (Oxf) 2024;73:55-65. [PMID: 37540558 DOI: 10.1093/jmicro/dfad040] [Citation(s) in RCA: 3] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/03/2023] [Revised: 05/22/2023] [Accepted: 07/17/2023] [Indexed: 08/05/2023]  Open
2
Dalouji V, Goudarzi S. Three-Dimensional Surface Stereometric Analysis of Ni-Cu Films with Different Cu Contents. ACS OMEGA 2024;9:4339-4346. [PMID: 38313472 PMCID: PMC10831855 DOI: 10.1021/acsomega.3c06181] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 08/20/2023] [Revised: 01/02/2024] [Accepted: 01/08/2024] [Indexed: 02/06/2024]
3
Pandey RK, Yadav RP, Kumar T, Kumar A, Pathak S, Awasthi S, Singh UB, Pandey AC. Fractal characterizations of MeV ion treated CaF2 thin films. CHAOS (WOODBURY, N.Y.) 2023;33:033110. [PMID: 37003822 DOI: 10.1063/5.0135127] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/16/2022] [Accepted: 02/13/2023] [Indexed: 06/19/2023]
4
Matos RS, da Costa ÍC, Yasumura HD, de Azevedo SG, Sanches EA, da Fonseca Filho HD. Nanoscale surface dynamics of spatial patterns of polymeric bilayered particles loaded with essential oil. Microsc Res Tech 2022;85:3633-3641. [PMID: 35916245 DOI: 10.1002/jemt.24216] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/21/2022] [Revised: 07/04/2022] [Accepted: 07/18/2022] [Indexed: 11/10/2022]
5
Vapor Barrier Properties of Cold Plasma Treated Corn Starch Films. COATINGS 2022. [DOI: 10.3390/coatings12071006] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/10/2022]
6
Fractal Analysis on Surface Topography of Thin Films: A Review. FRACTAL AND FRACTIONAL 2022. [DOI: 10.3390/fractalfract6030135] [Citation(s) in RCA: 4] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/04/2023]
7
Yadav M, Yadav RP, Priya PK, Bhasker HP, Ţălu Ş, Mittal AK, Matos RS. Effect of Fe Doping on the Surface Morphology and Supercapacitor Properties of Sr(OH)2 Thin Films: A Fractal Approach. THE JOURNAL OF PHYSICAL CHEMISTRY C 2021. [DOI: 10.1021/acs.jpcc.1c06668] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
8
Rezaee S. The effect of deposition times in DC-magnetron sputtering on micromorphology of TiO2 thin films. Microsc Res Tech 2021;84:1475-1483. [PMID: 33491242 DOI: 10.1002/jemt.23703] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/07/2020] [Revised: 12/30/2020] [Accepted: 01/04/2021] [Indexed: 11/11/2022]
9
Yadav RP, Baranwal V, Kumar S, Pandey AC, Mittal AK. Multifractal analysis of SiO2 surface embedded with Ge nanocrystal. APPLIED NANOSCIENCE 2020. [DOI: 10.1007/s13204-020-01626-1] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
10
Averaged power spectrum density, fractal and multifractal spectra of Au nano-particles deposited onto annealed TiO2 thin films. OPTICAL AND QUANTUM ELECTRONICS 2020. [DOI: 10.1007/s11082-020-02584-2] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
11
Ito RM, de Souza CC, Gandarilla AMD, de Oliveira LM, Brito WR, Sanches EA, Matos RS, da Fonseca Filho HD. Micromorphology and microtexture evaluation of poly(o-ethoxyaniline) films using atomic force microscopy and fractal analysis. JOURNAL OF POLYMER RESEARCH 2020. [DOI: 10.1007/s10965-020-02262-7] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
12
Robustness of Surface Roughness against Low Number of Picture Elements and Its Benefit for Scaling Analysis. COATINGS 2020. [DOI: 10.3390/coatings10080776] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
13
Stereometric analysis of TiO2 thin films deposited by electron beam ion assisted. OPTICAL AND QUANTUM ELECTRONICS 2020. [DOI: 10.1007/s11082-020-02388-4] [Citation(s) in RCA: 12] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
14
Panigrahy C, Seal A, Mahato NK. Image texture surface analysis using an improved differential box counting based fractal dimension. POWDER TECHNOL 2020. [DOI: 10.1016/j.powtec.2020.01.053] [Citation(s) in RCA: 19] [Impact Index Per Article: 4.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/16/2022]
15
Multifractal and optical bandgap characterization of Ta2O5 thin films deposited by electron gun method. OPTICAL AND QUANTUM ELECTRONICS 2020. [DOI: 10.1007/s11082-019-2173-5] [Citation(s) in RCA: 17] [Impact Index Per Article: 4.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
16
Sadeghi M, Rezaee S, Arman A, Ţălu Ş, Luna C, Shakoury R. Study of the formation of tungsten powder by hydrogen reduction of ammonium paratungstate and stereometric analyses of the powder texture. MATERIALS RESEARCH EXPRESS 2020. [DOI: 10.1088/2053-1591/ab6763] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
17
Stereometric analysis of Ta2O5 thin films. MATERIALS SCIENCE-POLAND 2020. [DOI: 10.2478/msp-2019-0083] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
18
Stach S, Ţălu Ş, Dallaev R, Arman A, Sobola D, Salerno M. Evaluation of the Topographical Surface Changes of Silicon Wafers after Annealing and Plasma Cleaning. SILICON 2019. [DOI: 10.1007/s12633-019-00351-x] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
19
Țălu Ș, Ghaderi A, Stępień K, Mwema FM. Advanced Micromorphology Analysis of Cu/Fe NPs Thin Films. ACTA ACUST UNITED AC 2019. [DOI: 10.1088/1757-899x/611/1/012016] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
20
Shakoury R, Grayeli Korpi A, Ghosh K, Ţălu Ş, Rezaee S, Mwema F, Mardani M, Arman A. Stereometric and scaling law analysis of surface morphology of stainless steel type AISI 304 coated with Mn: a conventional and fractal evaluation. MATERIALS RESEARCH EXPRESS 2019. [DOI: 10.1088/2053-1591/ab4aa6] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
21
Fractal Analysis of Thin Films Surfaces: A Brief Overview. ACTA ACUST UNITED AC 2019. [DOI: 10.1007/978-981-13-8297-0_28] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 03/15/2023]
22
Maity G, Ojha S, Sulania I, Devrani K, Patel SP. Fractal characterizations of energetic Si ions irradiated amorphized‐Si surfaces. SURF INTERFACE ANAL 2019. [DOI: 10.1002/sia.6655] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/06/2023]
23
Grayeli Korpi A, Ţălu Ş, Bramowicz M, Arman A, Kulesza S, Pszczolkowski B, Jurečka S, Mardani M, Luna C, Balashabadi P, Rezaee S, Gopikishan S. Minkowski functional characterization and fractal analysis of surfaces of titanium nitride films. MATERIALS RESEARCH EXPRESS 2019. [DOI: 10.1088/2053-1591/ab26be] [Citation(s) in RCA: 20] [Impact Index Per Article: 4.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
24
Ţălu Ş, Yadav RP, Arman A, Korpi AG, Sobola D, Ţălu M, Rezaee S, Achour A, Jurečka S, Mardani M. Analyzing the fractal feature of nickel thin films surfaces modified by low energy nitrogen ion. VAKUUM IN FORSCHUNG UND PRAXIS 2019. [DOI: 10.1002/vipr.201900703] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/05/2023]
25
Rashid D, Stach S, Ţălu Ş, Sobola D, Méndez-Albores A, Córdova GT, Grmela L. Stereometric Analysis of Effects of Heat Stressing on Micromorphology of Si Single Crystals. SILICON 2019. [DOI: 10.1007/s12633-019-0085-4] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
26
Ţălu Ş, Yadav RP, Šik O, Sobola D, Dallaev R, Solaymani S, Man O. How topographical surface parameters are correlated with CdTe monocrystal surface oxidation. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING 2018. [DOI: 10.1016/j.mssp.2018.05.030] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
27
Ţălu Ş, Yadav RP, Lainović T, Méndez-Albores A, Trejo G, Kukuruzović D, Nezafat NB, Shafiekhani A, Solaymani S. The effect of dental LED light-curing unit photoactivation mode on 3D surface morphology of dental nanocomposites evaluated by two-dimensional multifractal detrended fluctuation analysis. Microsc Res Tech 2018;81:1223-1230. [PMID: 30351526 DOI: 10.1002/jemt.23123] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/03/2018] [Revised: 08/04/2018] [Accepted: 08/07/2018] [Indexed: 02/05/2023]
28
Das PK, Biswal R, Choudhary RJ, Ganesan V, Mallick P. Evolution of surface topography and optical band gap of ZnO film deposited on NiO/Si(100). SURF INTERFACE ANAL 2017. [DOI: 10.1002/sia.6365] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
29
Țălu Ș, Yadav RP, Mittal AK, Achour A, Luna C, Mardani M, Solaymani S, Arman A, Hafezi F, Ahmadpourian A, Naderi S, Saghi K, Méndez A, Trejo G. Application of Mie theory and fractal models to determine the optical and surface roughness of Ag–Cu thin films. OPTICAL AND QUANTUM ELECTRONICS 2017. [DOI: 10.1007/s11082-017-1079-3] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
30
Oksengendler B, Ashurov N, Maksimov S, Karpova O, Rashidova S. Role of Fractals in Perovskite Solar Cells. EURASIAN CHEMICO-TECHNOLOGICAL JOURNAL 2017. [DOI: 10.18321/ectj471] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]  Open
31
Ţălu Ş, Bramowicz M, Kulesza S, Ghaderi A, Dalouji V, Solaymani S, Khalaj Z. Microstructure and micromorphology of Cu/Co nanoparticles: Surface texture analysis. ELECTRONIC MATERIALS LETTERS 2016. [DOI: 10.1007/s13391-016-6036-y] [Citation(s) in RCA: 17] [Impact Index Per Article: 2.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
32
Micromorphology and fractal analysis of nickel–carbon composite thin films. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 2016. [DOI: 10.1007/s10854-016-5268-9] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/07/2023]
33
Li JH, Wang F, Li JW, Zou RB, Liao GP. Multifractal methods for rapeseed nitrogen nutrition qualitative diagnosis modeling. INT J BIOMATH 2016. [DOI: 10.1142/s1793524516500649] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/18/2022]
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