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For: Fedala Y, Munteanu S, Kanoufi F, Tessier G, Roger JP, Wu C, Amiot F. Calibration procedures for quantitative multiple wavelengths reflectance microscopy. Rev Sci Instrum 2016;87:013702. [PMID: 26827323 DOI: 10.1063/1.4939253] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
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Optical Nanoimpacts of Dielectric and Metallic Nanoparticles on Gold Surface by Reflectance Microscopy: Adsorption or Bouncing? JOURNAL OF ANALYSIS AND TESTING 2019. [DOI: 10.1007/s41664-019-00099-8] [Citation(s) in RCA: 18] [Impact Index Per Article: 3.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 02/02/2023]
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