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Zhang Y, Zhang W, Dong Z, Shu S, Dong J, Xing C. Calibration and measurement performance analysis for a spectral band charge-coupled-device-based pyrometer. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2020; 91:064904. [PMID: 32611010 DOI: 10.1063/1.5129758] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/01/2019] [Accepted: 05/20/2020] [Indexed: 06/11/2023]
Abstract
Commercial charge-coupled device (CCD) cameras are used widely in industrial applications. This paper uses a commercial CCD camera to develop a spectral band CCD-based pyrometer. To improve the calibration accuracy, a thermometry model based on the extended effective wavelength is introduced to describe the pyrometer. The Tikhonov regularization method is employed to acquire the stabilized solutions for the model parameters considering their sensitivities to the perturbations in the calibration data. Therefore, the relationships between the temperature measurement performances and the system parameters, namely, the electron gain and F-number, are analyzed in terms of the temperature measurement range and sensitivity. Meanwhile, the error and uniformity of the temperature measurements are also investigated using a blackbody furnace. The experimental results show that the temperature measurement range for the designed pyrometer is 800-1203 °C, in which the sensitivity is 0.4906-35.64 °C-1 and the average relative error and non-uniformity of the temperature measurements are 2.5‰ and 1.36%, respectively.
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Affiliation(s)
- Yuzhong Zhang
- School of Instrument Science and Opto-Electronics Engineering, Hefei University of Technology, Hefei 230009, Anhui, China
| | - Wuqiong Zhang
- School of Instrument Science and Opto-Electronics Engineering, Hefei University of Technology, Hefei 230009, Anhui, China
| | - Zhe Dong
- School of Instrument Science and Opto-Electronics Engineering, Hefei University of Technology, Hefei 230009, Anhui, China
| | - Shuangbao Shu
- School of Instrument Science and Opto-Electronics Engineering, Hefei University of Technology, Hefei 230009, Anhui, China
| | - Jingtao Dong
- School of Instrument Science and Opto-Electronics Engineering, Hefei University of Technology, Hefei 230009, Anhui, China
| | - Chenyao Xing
- School of Instrument Science and Opto-Electronics Engineering, Hefei University of Technology, Hefei 230009, Anhui, China
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Wu CR, Huang J, Chang JF, Zhang J, Zhou RJ, Xu Z, Gao W, Isobe M, Ogawa K, Lin SY, Hu LQ, Li JG. Performance of fast-ion loss diagnostic on EAST. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2018; 89:10I144. [PMID: 30399726 DOI: 10.1063/1.5038782] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/05/2018] [Accepted: 09/05/2018] [Indexed: 06/08/2023]
Abstract
The scintillator-based detector for fast-ion loss measurements has been installed on EAST. To obtain high temporal resolution for fast-ion loss diagnostics, fast photomultiplier tube systems have been developed which can supply the complementary measurements to the previous image system with good energy and pitch resolution by using a CCD camera. By applying the rotatable platform, the prompt losses of beam-ions can be measured in normal and reverse magnetic field. The thick-target bremsstrahlung occurring in the stainless steel shield with energetic electrons can produce X-rays, which will strike on the scintillator based detector. To understand this interference on fast-ion loss signals, the effects of energetic electrons on the scintillator-based detector are studied, including runaway electrons in the plasma ramping-up phase and fast electrons accelerated by the lower hybrid wave.
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Affiliation(s)
- C R Wu
- Institute of Plasma Physics, Chinese Academy of Sciences, P.O. Box 1126, 230031 Hefei, Anhui, China
| | - J Huang
- Institute of Plasma Physics, Chinese Academy of Sciences, P.O. Box 1126, 230031 Hefei, Anhui, China
| | - J F Chang
- Institute of Plasma Physics, Chinese Academy of Sciences, P.O. Box 1126, 230031 Hefei, Anhui, China
| | - J Zhang
- Institute of Plasma Physics, Chinese Academy of Sciences, P.O. Box 1126, 230031 Hefei, Anhui, China
| | - R J Zhou
- Institute of Plasma Physics, Chinese Academy of Sciences, P.O. Box 1126, 230031 Hefei, Anhui, China
| | - Z Xu
- Advanced Energy Research Center, Shenzhen University, Shenzhen 518060, People's Republic of China
| | - W Gao
- Institute of Plasma Physics, Chinese Academy of Sciences, P.O. Box 1126, 230031 Hefei, Anhui, China
| | - M Isobe
- National Institute for Fusion Science, 322-6 Oroshi-cho, Toki 509-5259, Japan
| | - K Ogawa
- National Institute for Fusion Science, 322-6 Oroshi-cho, Toki 509-5259, Japan
| | - S Y Lin
- Institute of Plasma Physics, Chinese Academy of Sciences, P.O. Box 1126, 230031 Hefei, Anhui, China
| | - L Q Hu
- Institute of Plasma Physics, Chinese Academy of Sciences, P.O. Box 1126, 230031 Hefei, Anhui, China
| | - J G Li
- Institute of Plasma Physics, Chinese Academy of Sciences, P.O. Box 1126, 230031 Hefei, Anhui, China
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