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For: Ritchie A, Cao W, Dasog M, Purkait TK, Senger C, Hu YF, Xiao QF, Veinot JGC, Urquhart SG. Silicon 1s near edge X-ray absorption fine structure spectroscopy of functionalized silicon nanocrystals. J Chem Phys 2016;145:154703. [DOI: 10.1063/1.4964371] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022]  Open
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Kislitsyn DA, Mills JM, Chiu SK, Taber BN, Barnes JD, Gervasi CF, Goforth AM, Nazin GV. Creation and Annihilation of Charge Traps in Silicon Nanocrystals: Experimental Visualization and Spectroscopy. J Phys Chem Lett 2018;9:710-716. [PMID: 29365270 DOI: 10.1021/acs.jpclett.7b03299] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
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