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Zheng Q, Zhang Y, Montazerian M, Gulbiten O, Mauro JC, Zanotto ED, Yue Y. Understanding Glass through Differential Scanning Calorimetry. Chem Rev 2019; 119:7848-7939. [DOI: 10.1021/acs.chemrev.8b00510] [Citation(s) in RCA: 154] [Impact Index Per Article: 30.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
Affiliation(s)
- Qiuju Zheng
- School of Materials Science and Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan 250353, China
| | - Yanfei Zhang
- School of Materials Science and Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan 250353, China
| | - Maziar Montazerian
- Vitreous Materials Laboratory (LaMaV), Department of Materials Engineering (DEMa), Federal University of São Carlos (UFSCar), 13.565-905 São Carlos, SP, Brazil
| | - Ozgur Gulbiten
- Science and Technology Division, Corning Incorporated, Corning, New York 14831, United States
| | - John C. Mauro
- School of Materials Science and Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan 250353, China
- Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, United States
| | - Edgar D. Zanotto
- Vitreous Materials Laboratory (LaMaV), Department of Materials Engineering (DEMa), Federal University of São Carlos (UFSCar), 13.565-905 São Carlos, SP, Brazil
| | - Yuanzheng Yue
- School of Materials Science and Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan 250353, China
- State Key Laboratory of Silicate Materials for Architectures, Wuhan University of Technology, Wuhan 430070, China
- Department of Chemistry and Bioscience, Aalborg University, DK-9220 Aalborg, Denmark
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Dash S, Chen P, Boolchand P. Response to “Comment on ‘Molecular origin of aging of pure Se glass: Growth of inter-chain structural correlations, network compaction, and partial ordering’” [J. Chem. Phys. 148, 157101 (2018)]. J Chem Phys 2018; 148:157102. [DOI: 10.1063/1.5018309] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022] Open
Affiliation(s)
- S. Dash
- Department of Electrical Engineering and Computer Science, University of Cincinnati, Cincinnati, Ohio 45221-0030, USA
| | - P. Chen
- Department of Electrical Engineering and Computer Science, University of Cincinnati, Cincinnati, Ohio 45221-0030, USA
| | - P. Boolchand
- Department of Electrical Engineering and Computer Science, University of Cincinnati, Cincinnati, Ohio 45221-0030, USA
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