Time-of-flight electron energy loss spectroscopy by longitudinal phase space manipulation with microwave cavities

High-repetition-rate ultrafast electron diffraction with direct electron detection

Ultrafast electron diffraction (UED) instruments typically operate at kHz or lower repetition rates and rely on indirect detection of electrons. However, these experiments encounter limitations because they are required to use electron beams containing a relatively large number of electrons (≫100 electrons/pulse), leading to severe space-charge effects. Consequently, electron pulses with long durations and large transverse diameters are used to interrogate the sample. Here, we introduce a novel UED instrument operating at a high repetition rate and employing direct electron detection. We operate significantly below the severe space-charge regime by using electron beams containing 1-140 electrons per pulse at 30 kHz. We demonstrate the ability to detect time-resolved signals from thin film solid samples with a difference contrast signal, Δ I / I 0 , and an instrument response function as low as 10-5 and 184-fs (FWHM), respectively, without temporal compression. Overall, our findings underscore the importance of increasing the repetition rate of UED experiments and adopting a direct electron detection scheme, which will be particularly impactful for gas-phase UED. Our newly developed scheme enables more efficient and sensitive investigations of ultrafast dynamics in photoexcited samples using ultrashort electron beams.

Time-resolved transmission electron microscopy for nanoscale chemical dynamics

The ability of transmission electron microscopy (TEM) to image a structure ranging from millimetres to Ångströms has made it an indispensable component of the toolkit of modern chemists. TEM has enabled unprecedented understanding of the atomic structures of materials and how structure relates to properties and functions. Recent developments in TEM have advanced the technique beyond static material characterization to probing structural evolution on the nanoscale in real time. Accompanying advances in data collection have pushed the temporal resolution into the microsecond regime with the use of direct-electron detectors and down to the femtosecond regime with pump-probe microscopy. Consequently, studies have deftly applied TEM for understanding nanoscale dynamics, often in operando. In this Review, time-resolved in situ TEM techniques and their applications for probing chemical and physical processes are discussed, along with emerging directions in the TEM field.

Electron energy analysis by phase-space shaping with THz field cycles

Time-resolved electron energy analysis and loss spectroscopy can reveal a wealth of information about material properties and dynamical light-matter interactions. Here, we report an all-optical concept for measuring energy spectra of femtosecond electron pulses with sub-eV resolution. Laser-generated terahertz radiation is used to measure arrival time differences within electron pulses with few-femtosecond precision. Controlled dispersion and subsequent compression of the electron pulses provide almost any desired compromise of energy resolution, signal strength, and time resolution. A proof-of-concept experiment on aluminum reveals an energy resolution of <3.5 eV (rms) at 70-keV after a drift distance of only 0.5 m. Simulations of a two-stage scheme reveal that pre-stretched pulses can be used to achieve <10 meV resolution, independent of the source's initial energy spread and limited only by the achievable THz field strength and measuring time.