A fuzzy control for high-speed and low-overshoot hopping probe ion conductance microscopy

Scanning Ion Conductance Microscopy

Scanning ion conductance microscopy (SICM) has emerged as a versatile tool for studies of interfaces in biology and materials science with notable utility in biophysical and electrochemical measurements. The heart of the SICM is a nanometer-scale electrolyte filled glass pipette that serves as a scanning probe. In the initial conception, manipulations of ion currents through the tip of the pipette and appropriate positioning hardware provided a route to recording micro- and nanoscopic mapping of the topography of surfaces. Subsequent advances in instrumentation, probe design, and methods significantly increased opportunities for SICM beyond recording topography. Hybridization of SICM with coincident characterization techniques such as optical microscopy and faradaic electrodes have brought SICM to the forefront as a tool for nanoscale chemical measurement for a wide range of applications. Modern approaches to SICM realize an important tool in analytical, bioanalytical, biophysical, and materials measurements, where significant opportunities remain for further exploration. In this review, we chronicle the development of SICM from the perspective of both the development of instrumentation and methods and the breadth of measurements performed.

Research on the Adaptive Sensitivity Scanning Method for Ion Conductance Microscopy with High Efficiency and Reliability

Scanning ion conductance microscopy (SICM) is a type of in situ measurement technology for noncontact detection of samples in electrolytes with nanoscale resolution and has been used increasingly in biomedical and electrochemical fields in recent years. However, there is an inherent contradiction in the technique that makes SICM's sensitivity and accuracy difficult to balance. Higher sensitivity allows for faster probe speeds and higher scanning reliability but leads to lower accuracy, and vice versa. To resolve this problem, an adaptive sensitivity scanning method is proposed here that is designed to increase SICM's imaging efficiency without reducing its scanning reliability and accuracy. In the proposed scanning method, the sensitivity is automatically switched via the bias voltage based on the probe-sample distance. When the probe is located far away from the sample, the probe then predetects the sample position rapidly with high sensitivity. When the sample has been sensed in the high-sensitivity phase, the probe then detects the sample with low sensitivity. The basic theory and the feasibility of the alterable sensitivity detection strategy is also studied using the finite element method (FEM) and by performing experiments in this work. Finally, through testing of the standard silicon and polydimethylsiloxane (PDMS) samples, the proposed method is shown to increase SICM imaging efficiency significantly by up to 5 times relative to the conventional hopping mode without sacrificing the scanning accuracy and reliability.

Scanning ion conductance microscopy of live human glomerulus

Podocyte damage is a hallmark of glomerular diseases, such as focal segmental glomerulosclerosis, typically associated with marked albuminuria and progression of renal pathology. Podocyte structural abnormalities and loss are also linked to minimal change disease and more common diabetic kidney disease. Here we applied the first‐time scanning ion conductance microscopy (SICM) technique to assess the freshly isolated human glomerulus's topology. SICM provides a unique opportunity to evaluate glomerulus podocytes as well as other nephron structural segments with electron microscopy resolution but in live samples. Shown here is the application of the SICM method in the live human glomerulus, which provides proof of principle for future dynamic analysis of membrane morphology and various functional parameters in living cells.

Simultaneous mapping of nanoscale topography and surface potential of charged surfaces by scanning ion conductance microscopy

Scanning ion conductance microscopy (SICM) offers the ability to obtain nanoscale resolution images of the membranes of living cells. Here, we show that a dual-barrel nanopipette probe based potentiometric SICM (P-SICM) can simultaneously map the topography and surface potential of soft, rough and heterogeneously charged surfaces under physiological conditions. This technique was validated and tested by systematic studies on model samples, and the finite element method (FEM) based simulations confirmed its surface potential sensing capability. Using the P-SICM method, we compared both the topography and extracellular potential distributions of the membranes of normal (Mela-A) and cancerous (B16) skin cells. We further monitored the structural and electrical changes of the membranes of both types of cells after exposing them to the elevated potassium ion concentration in extracellular solution, known to depolarize and damage the cell. From surface potential imaging, we revealed the dynamic appearance of heterogeneity of the surface potential of the individual cell membrane. This P-SICM method provides new opportunities to study the structural and electrical properties of cell membrane at the nanoscale.