Surface Plasmon Assisted Directional Rayleigh Scattering

The evolution of total internal reflection Raman spectroscopy for the chemical characterization of thin films and interfaces

Total internal reflection (TIR) optical spectroscopies have been widely used for decades as non-destructive and surface-sensitive measurements of thin films and interfaces. Under TIR conditions, an evanescent wave propagates into the sample layer within a region approximately 50 nm to 2 μm from the interface, which limits the spatial extent of the optical signal. The most common TIR optical spectroscopies are fluorescence (i.e., TIRF) and infrared spectroscopy (i.e., attenuated total reflection infrared). Despite the first report of TIR Raman spectroscopy appearing in 1973, this method has not received the same attention to date. While TIR Raman methods can provide chemical specific information, it has been outshined in many respects by surface-enhanced Raman spectroscopy (SERS). TIR Raman spectroscopy, however, is garnering more interest for analyzing the chemical and physical properties of thin polymer films, self-assembled monolayers (SAMs), multilayered systems, and adsorption at an interface. Herein, we discuss the early experimental and computational work that laid the foundation for recent developments in the use of TIR Raman techniques. Recent applications of TIR Raman spectroscopy as well as modern TIR Raman instruments capable of measuring monolayer-sensitive vibrational modes on smooth metallic surfaces are also discussed. The use of TIR Raman spectroscopy has been on a rise and will continue to push the limits for chemical specific interfacial and thin film measurements. Graphical abstract Total internal reflection (TIR) Raman spectroscopy can extract the chemical and physical information from thin films and adsorbates.

Optical arrangement for surface plasmon-assisted directional enhanced Raman scattering spectroscopy

We present an optical arrangement for spectroscopy of enhanced Raman scattering assisted by surface plasmon resonance in continuous planar metallic films. Optical excitation of propagating surface plasmons (PSP) is aided by the hemispherical total internal reflectance prism in the Kretschmann geometry. In this geometry, the radiation produced by Raman scattering is directionally emitted inside the prism with the angular distribution in the shape of a hollow cone (the Kretschmann cone). The proposed configuration enables entire collection of the Kretschmann cone with the use of an elliptical mirror modified for enlarging the accessible angular range for both the incident beam and the scattered light. The spectroscopic performance of this arrangement was evaluated using the Rhodamine 6G dye as a surface enhanced Raman scattering (SERS) reporter. An evident difference in magnitudes of the enhancement factor for specific spectral lines as compared to SERS excitation by localized surface plasmon resonance (LSPR-SERS) was revealed. The origin of this difference is discussed in terms of expected distinctions between the PSP-assisted directional enhanced Raman scattering and the LSPR-SERS. Besides the spectroscopic applications, the proposed arrangement is also perfectly suited for simultaneous functioning as the SPR sensor. Integration of SERS spectroscopy with the SPR analysis shows promise as a platform for evolving an innovative analytical technique with enhanced potentialities in surface research, particularly in biochemical applications.