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Garratt D, Matthews M, Marangos J. Toward ultrafast soft x-ray spectroscopy of organic photovoltaic devices. STRUCTURAL DYNAMICS (MELVILLE, N.Y.) 2024; 11:010901. [PMID: 38250136 PMCID: PMC10799687 DOI: 10.1063/4.0000214] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 08/17/2023] [Accepted: 12/17/2023] [Indexed: 01/23/2024]
Abstract
Novel ultrafast x-ray sources based on high harmonic generation and at x-ray free electron lasers are opening up new opportunities to resolve complex ultrafast processes in condensed phase systems with exceptional temporal resolution and atomic site specificity. In this perspective, we present techniques for resolving charge localization, transfer, and separation processes in organic semiconductors and organic photovoltaic devices with time-resolved soft x-ray spectroscopy. We review recent results in ultrafast soft x-ray spectroscopy of these systems and discuss routes to overcome the technical challenges in performing time-resolved x-ray experiments on photosensitive materials with poor thermal conductivity and low pump intensity thresholds for nonlinear effects.
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Staeck S, Andrle A, Hönicke P, Baumann J, Grötzsch D, Weser J, Goetzke G, Jonas A, Kayser Y, Förste F, Mantouvalou I, Viefhaus J, Soltwisch V, Stiel H, Beckhoff B, Kanngießer B. Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples. NANOMATERIALS (BASEL, SWITZERLAND) 2022; 12:3766. [PMID: 36364540 PMCID: PMC9658930 DOI: 10.3390/nano12213766] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 09/06/2022] [Revised: 10/21/2022] [Accepted: 10/21/2022] [Indexed: 06/16/2023]
Abstract
Scan-free grazing-emission X-ray fluorescence spectroscopy (GEXRF) is an established technique for the investigation of the elemental depth-profiles of various samples. Recently it has been applied to investigating structured nanosamples in the tender X-ray range. However, lighter elements such as oxygen, nitrogen or carbon cannot be efficiently investigated in this energy range, because of the ineffective excitation. Moreover, common CCD detectors are not able to discriminate between fluorescence lines below 1 keV. Oxygen and nitrogen are important components of insulation and passivation layers, for example, in silicon oxide or silicon nitride. In this work, scan-free GEXRF is applied in proof-of-concept measurements for the investigation of lateral ordered 2D nanostructures in the soft X-ray range. The sample investigated is a Si3N4 lamellar grating, which represents 2D periodic nanostructures as used in the semiconductor industry. The emerging two-dimensional fluorescence patterns are recorded with a CMOS detector. To this end, energy-dispersive spectra are obtained via single-photon event evaluation. In this way, spatial and therefore angular information is obtained, while discrimination between different photon energies is enabled. The results are compared to calculations of the sample model performed by a Maxwell solver based on the finite-elements method. A first measurement is carried out at the UE56-2 PGM-2 beamline at the BESSY II synchrotron radiation facility to demonstrate the feasibility of the method in the soft X-ray range. Furthermore, a laser-produced plasma source (LPP) is utilized to investigate the feasibility of this technique in the laboratory. The results from the BESSY II measurements are in good agreement with the simulations and prove the applicability of scan-free GEXRF in the soft X-ray range for quality control and process engineering of 2D nanostructures. The LPP results illustrate the chances and challenges concerning a transfer of the methodology to the laboratory.
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Affiliation(s)
- Steffen Staeck
- TU Berlin, Analytical X-ray Physics, 10623 Berlin, Germany
| | - Anna Andrle
- Physikalisch-Technische Bundesanstalt, 10587 Berlin, Germany
| | - Philipp Hönicke
- TU Berlin, Analytical X-ray Physics, 10623 Berlin, Germany
- Physikalisch-Technische Bundesanstalt, 10587 Berlin, Germany
| | - Jonas Baumann
- TU Berlin, Analytical X-ray Physics, 10623 Berlin, Germany
| | | | - Jan Weser
- Physikalisch-Technische Bundesanstalt, 10587 Berlin, Germany
| | - Gesa Goetzke
- TU Berlin, Analytical X-ray Physics, 10623 Berlin, Germany
| | - Adrian Jonas
- TU Berlin, Analytical X-ray Physics, 10623 Berlin, Germany
| | - Yves Kayser
- Physikalisch-Technische Bundesanstalt, 10587 Berlin, Germany
| | - Frank Förste
- TU Berlin, Analytical X-ray Physics, 10623 Berlin, Germany
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Stiel H, Braenzel J, Jonas A, Gnewkow R, Glöggler LT, Sommer D, Krist T, Erko A, Tümmler J, Mantouvalou I. Towards Understanding Excited-State Properties of Organic Molecules Using Time-Resolved Soft X-ray Absorption Spectroscopy. Int J Mol Sci 2021; 22:13463. [PMID: 34948258 PMCID: PMC8706469 DOI: 10.3390/ijms222413463] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/05/2021] [Revised: 12/01/2021] [Accepted: 12/08/2021] [Indexed: 11/16/2022] Open
Abstract
The extension of the pump-probe approach known from UV/VIS spectroscopy to very short wavelengths together with advanced simulation techniques allows a detailed analysis of excited-state dynamics in organic molecules or biomolecular structures on a nanosecond to femtosecond time level. Optical pump soft X-ray probe spectroscopy is a relatively new approach to detect and characterize optically dark states in organic molecules, exciton dynamics or transient ligand-to-metal charge transfer states. In this paper, we describe two experimental setups for transient soft X-ray absorption spectroscopy based on an LPP emitting picosecond and sub-nanosecond soft X-ray pulses in the photon energy range between 50 and 1500 eV. We apply these setups for near-edge X-ray absorption fine structure (NEXAFS) investigations of thin films of a metal-free porphyrin, an aggregate forming carbocyanine and a nickel oxide molecule. NEXAFS investigations have been carried out at the carbon, nitrogen and oxygen K-edge as well as on the Ni L-edge. From time-resolved NEXAFS carbon, K-edge measurements of the metal-free porphyrin first insights into a long-lived trap state are gained. Our findings are discussed and compared with density functional theory calculations.
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Affiliation(s)
- Holger Stiel
- Berlin Laboratory for Innovative X-ray Technologies (BLiX), D-10623 Berlin, Germany; (J.B.); (A.J.); (R.G.); (L.T.G.); (J.T.); (I.M.)
- Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie, D-12489 Berlin, Germany;
| | - Julia Braenzel
- Berlin Laboratory for Innovative X-ray Technologies (BLiX), D-10623 Berlin, Germany; (J.B.); (A.J.); (R.G.); (L.T.G.); (J.T.); (I.M.)
- Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie, D-12489 Berlin, Germany;
| | - Adrian Jonas
- Berlin Laboratory for Innovative X-ray Technologies (BLiX), D-10623 Berlin, Germany; (J.B.); (A.J.); (R.G.); (L.T.G.); (J.T.); (I.M.)
- Analytical X-ray Physics, TU Berlin, D-10623 Berlin, Germany
| | - Richard Gnewkow
- Berlin Laboratory for Innovative X-ray Technologies (BLiX), D-10623 Berlin, Germany; (J.B.); (A.J.); (R.G.); (L.T.G.); (J.T.); (I.M.)
- Analytical X-ray Physics, TU Berlin, D-10623 Berlin, Germany
- Helmholtz Zentrum Berlin, D-12489 Berlin, Germany
| | - Lisa Theresa Glöggler
- Berlin Laboratory for Innovative X-ray Technologies (BLiX), D-10623 Berlin, Germany; (J.B.); (A.J.); (R.G.); (L.T.G.); (J.T.); (I.M.)
- Analytical X-ray Physics, TU Berlin, D-10623 Berlin, Germany
| | - Denny Sommer
- Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie, D-12489 Berlin, Germany;
| | - Thomas Krist
- NOB Nano Optics Berlin GmbH, D-10627 Berlin, Germany;
| | | | - Johannes Tümmler
- Berlin Laboratory for Innovative X-ray Technologies (BLiX), D-10623 Berlin, Germany; (J.B.); (A.J.); (R.G.); (L.T.G.); (J.T.); (I.M.)
- Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie, D-12489 Berlin, Germany;
| | - Ioanna Mantouvalou
- Berlin Laboratory for Innovative X-ray Technologies (BLiX), D-10623 Berlin, Germany; (J.B.); (A.J.); (R.G.); (L.T.G.); (J.T.); (I.M.)
- Analytical X-ray Physics, TU Berlin, D-10623 Berlin, Germany
- Helmholtz Zentrum Berlin, D-12489 Berlin, Germany
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