Kinetic energy released in the vibrational autodetachment of sulfur hexafluoride anion

Thermionic Emission of Negative Ions of Molecules and Small Clusters as a Probe of Low-Energy Attachment

We have been studying the thermionic emission of negatively charged molecules and small clusters for more than a decade. The kinetic energy released distribution (KERD) of mass-selected negative ions has been measured with a velocity map imaging spectrometer. A comparison of the experimental KERD to detailed balance models provided information on the reverse process, namely, the electron attachment to the parent. The electron attachment to neutral systems (reverse process of the electron emission from anions) is usually described in a simplified way as a single electron capture in the framework of the classical Langevin model. Our measurements show that this approach is insufficient and that, in addition to the capture step, an intramolecular vibrational redistribution (IVR) step should be included. As far as multiply charged anions are concerned, the electron attachment to anions (reverse process of the electron emission from dianions) is strongly affected by the repulsive Coulomb barrier (RCB). Previous studies assumed a pure over-the-barrier process, which is in disagreement with our study. Indeed, electron emission is measured below the RCB, revealing significant thermal tunneling. In the present review, we summarize these works on singly and doubly charged anions in an attempt to present a unified view of the involved processes. It is worth noting that the detailed measurements of KERDs in the very low kinetic energy region (typically around 0.1 eV) have been made possible thanks to electron imaging methods, without which all of this work could never have been done, with time-resolution capabilities allowing the disentangling of direct and delayed electron emission.