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Dresselhaus JL, Zakharova M, Ivanov N, Fleckenstein H, Prasciolu M, Yefanov O, Li C, Zhang W, Middendorf P, Egorov D, De Gennaro Aquino I, Chapman HN, Bajt S. X-ray focusing below 3 nm with aberration-corrected multilayer Laue lenses. OPTICS EXPRESS 2024; 32:16004-16015. [PMID: 38859238 DOI: 10.1364/oe.518964] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/15/2024] [Accepted: 04/02/2024] [Indexed: 06/12/2024]
Abstract
Multilayer Laue lenses are volume diffractive optical elements for hard X-rays with the potential to focus beams to sizes as small as 1 nm. This ability is limited by the precision of the manufacturing process, whereby systematic errors that arise during fabrication contribute to wavefront aberrations even after calibration of the deposition process based on wavefront metrology. Such aberrations can be compensated by using a phase plate. However, current high numerical aperture lenses for nanometer resolution exhibit errors that exceed those that can be corrected by a single phase plate. To address this, we accumulate a large wavefront correction by propagation through a linear array of 3D-printed phase correcting elements. With such a compound refractive corrector, we report on a point spread function with a full-width at half maximum area of 2.9 × 2.8 nm2 at a photon energy of 17.5 keV.
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Li T, Dresselhaus JL, Ivanov N, Prasciolu M, Fleckenstein H, Yefanov O, Zhang W, Pennicard D, Dippel AC, Gutowski O, Villanueva-Perez P, Chapman HN, Bajt S. Dose-efficient scanning Compton X-ray microscopy. LIGHT, SCIENCE & APPLICATIONS 2023; 12:130. [PMID: 37248250 DOI: 10.1038/s41377-023-01176-5] [Citation(s) in RCA: 2] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Grants] [Subscribe] [Scholar Register] [Received: 03/02/2023] [Revised: 04/28/2023] [Accepted: 05/05/2023] [Indexed: 05/31/2023]
Abstract
The highest resolution of images of soft matter and biological materials is ultimately limited by modification of the structure, induced by the necessarily high energy of short-wavelength radiation. Imaging the inelastically scattered X-rays at a photon energy of 60 keV (0.02 nm wavelength) offers greater signal per energy transferred to the sample than coherent-scattering techniques such as phase-contrast microscopy and projection holography. We present images of dried, unstained, and unfixed biological objects obtained by scanning Compton X-ray microscopy, at a resolution of about 70 nm. This microscope was realised using novel wedged multilayer Laue lenses that were fabricated to sub-ångström precision, a new wavefront measurement scheme for hard X rays, and efficient pixel-array detectors. The doses required to form these images were as little as 0.02% of the tolerable dose and 0.05% of that needed for phase-contrast imaging at similar resolution using 17 keV photon energy. The images obtained provide a quantitative map of the projected mass density in the sample, as confirmed by imaging a silicon wedge. Based on these results, we find that it should be possible to obtain radiation damage-free images of biological samples at a resolution below 10 nm.
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Affiliation(s)
- Tang Li
- The Hamburg Centre for Ultrafast Imaging, 22761, Hamburg, Germany
| | | | - Nikolay Ivanov
- Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, 22607, Hamburg, Germany
| | - Mauro Prasciolu
- Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, 22607, Hamburg, Germany
| | - Holger Fleckenstein
- Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, 22607, Hamburg, Germany
| | - Oleksandr Yefanov
- Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, 22607, Hamburg, Germany
| | - Wenhui Zhang
- Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, 22607, Hamburg, Germany
| | - David Pennicard
- Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, 22607, Hamburg, Germany
| | | | - Olof Gutowski
- Deutsches Elektronen Synchrotron DESY, 22607, Hamburg, Germany
| | | | - Henry N Chapman
- The Hamburg Centre for Ultrafast Imaging, 22761, Hamburg, Germany.
- Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, 22607, Hamburg, Germany.
- Department of Physics, Universität Hamburg, 22761, Hamburg, Germany.
| | - Saša Bajt
- The Hamburg Centre for Ultrafast Imaging, 22761, Hamburg, Germany.
- Center for Free-Electron Laser Science CFEL, Deutsches Elektronen-Synchrotron DESY, 22607, Hamburg, Germany.
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