Thin head atomic force microscope for integration with optical microscope

Microsphere probe: combining microsphere-assisted microscopy with AFM

In recent years, microsphere-assisted microscopy (MAM) and atomic force microscope (AFM) have been rapidly developed to meet the measurement needs of microstructures. However, the positioning of microspheres, the inability of AFM to touch the underlying sample through the transparent insulating layer, and the challenge of AFM fast positioning limit their use in practical measurements. In this paper, we propose a method that combines MAM with AFM by adhering the microsphere to the cantilever. This method allows MAM and AFM to work in parallel, and their imaging positions can correspond with each other. We use this method to measure memory devices, and the results show that MAM and AFM yield complementary advantages. This approach provides a new tool for analyzing complex structures in devices and has potential for wide application.

High-speed multiparametric imaging through off-resonance tapping AFM with active probe

Off-resonance tapping (ORT) mode of atomic force microscopy (AFM), based on force-distance curve, is widely concerned due to its advantages of weak tip-sample interaction and concurrent quantitative property mapping. However, the ORT-AFM still has the disadvantage of slow scan speed caused by low modulation frequency. In this paper, we overcome this disadvantage by introducing active probe method. With active probe, the cantilever was directly actuated with the induced strain after applying voltage in the piezoceramic film. In this way, the modulation frequency could be increased to more than an order of magnitude faster than that of traditional ORT, thus improving the scan rate. We demonstrated high-speed multiparametric imaging with the active probe method in ORT-AFM.

Interfacial Coupling and Modulation of van der Waals Heterostructures for Nanodevices

In recent years, van der Waals heterostructures (vdWHs) of two-dimensional (2D) materials have attracted extensive research interest. By stacking various 2D materials together to form vdWHs, it is interesting to see that new and fascinating properties are formed beyond single 2D materials; thus, 2D heterostructures-based nanodevices, especially for potential optoelectronic applications, were successfully constructed in the past few decades. With the dramatically increased demand for well-controlled heterostructures for nanodevices with desired performance in recent years, various interfacial modulation methods have been carried out to regulate the interfacial coupling of such heterostructures. Here, the research progress in the study of interfacial coupling of vdWHs (investigated by Photoluminescence, Raman, and Pump-probe spectroscopies as well as other techniques), the modulation of interfacial coupling by applying various external fields (including electrical, optical, mechanical fields), as well as the related applications for future electrics and optoelectronics, have been briefly reviewed. By summarizing the recent progress, discussing the recent advances, and looking forward to future trends and existing challenges, this review is aimed at providing an overall picture of the importance of interfacial modulation in vdWHs for possible strategies to optimize the device's performance.