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Liu Y, Liu X, Su A, Gong C, Chen S, Xia L, Zhang C, Tao X, Li Y, Li Y, Sun T, Bu M, Shao W, Zhao J, Li X, Peng Y, Guo P, Han Y, Zhu Y. Revolutionizing the structural design and determination of covalent-organic frameworks: principles, methods, and techniques. Chem Soc Rev 2024; 53:502-544. [PMID: 38099340 DOI: 10.1039/d3cs00287j] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/03/2024]
Abstract
Covalent organic frameworks (COFs) represent an important class of crystalline porous materials with designable structures and functions. The interconnected organic monomers, featuring pre-designed symmetries and connectivities, dictate the structures of COFs, endowing them with high thermal and chemical stability, large surface area, and tunable micropores. Furthermore, by utilizing pre-functionalization or post-synthetic functionalization strategies, COFs can acquire multifunctionalities, leading to their versatile applications in gas separation/storage, catalysis, and optoelectronic devices. Our review provides a comprehensive account of the latest advancements in the principles, methods, and techniques for structural design and determination of COFs. These cutting-edge approaches enable the rational design and precise elucidation of COF structures, addressing fundamental physicochemical challenges associated with host-guest interactions, topological transformations, network interpenetration, and defect-mediated catalysis.
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Affiliation(s)
- Yikuan Liu
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Xiaona Liu
- National Engineering Research Center of Lower-Carbon Catalysis Technology, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian 116023, China.
| | - An Su
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Chengtao Gong
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Shenwei Chen
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Liwei Xia
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Chengwei Zhang
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Xiaohuan Tao
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Yue Li
- Institute of Intelligent Computing, Zhejiang Lab, Hangzhou 311121, China
| | - Yonghe Li
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Tulai Sun
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Mengru Bu
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Wei Shao
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Jia Zhao
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Xiaonian Li
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Yongwu Peng
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
| | - Peng Guo
- National Engineering Research Center of Lower-Carbon Catalysis Technology, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, Dalian 116023, China.
- University of Chinese Academy of Sciences, Beijing 100049, China.
| | - Yu Han
- School of Emergent Soft Matter, South China University of Technology, Guangzhou, China.
- King Abdullah University of Science and Technology (KAUST), Thuwal, 23955-6900, Saudi Arabia.
| | - Yihan Zhu
- Center for Electron Microscopy, Institute for Frontier and Interdisciplinary Sciences, State Key Laboratory Breeding Base of Green Chemistry Synthesis Technology, College of Materials Science and Engineering and College of Chemical Engineering, Zhejiang University of Technology, Hangzhou 310014, Zhejiang, China.
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Guner B, Laflamme S, Dagdeviren OE. Customization of an atomic force microscope for multidimensional measurements under environmental conditions. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2023; 94:063704. [PMID: 37862538 DOI: 10.1063/5.0147331] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/21/2023] [Accepted: 06/09/2023] [Indexed: 10/22/2023]
Abstract
Atomic force microscopy (AFM) is an analytical surface characterization tool that reveals the surface topography at a nanometer length scale while probing local chemical, mechanical, and even electronic sample properties. Both contact (performed with a constant deflection of the cantilever probe) and dynamic operation modes (enabled by demodulation of the oscillation signal under tip-sample interaction) can be employed to conduct AFM-based measurements. Although surface topography is accessible regardless of the operation mode, the resolution and the availability of the quantified surface properties depend on the mode of operation. However, advanced imaging techniques, such as frequency modulation, to achieve high resolution, quantitative surface properties are not implemented in many commercial systems. Here, we show the step-by-step customization of an atomic force microscope. The original system was capable of surface topography and basic force spectroscopy measurements while employing environmental control, such as temperature variation of the sample/tip, etc. We upgraded this original setup with additional hardware (e.g., a lock-in amplifier with phase-locked loop capacity, a high-voltage amplifier, and a new controller) and software integration while utilizing its environmental control features. We show the capabilities of the customized system with frequency modulation-based topography experiments and automated voltage and/or distance spectroscopy, time-resolved AFM, and two-dimensional force spectroscopy measurements under ambient conditions. We also illustrate the enhanced stability of the setup with active topography and frequency drift corrections. We believe that our methodology can be useful for the customization and automation of other scanning probe systems.
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Affiliation(s)
- Bugrahan Guner
- Department of Mechanical Engineering, École de Technologie Supérieure, University of Quebec, Montreal, Quebec H3C 1K3, Canada
| | - Simon Laflamme
- Department of Mechanical Engineering, École de Technologie Supérieure, University of Quebec, Montreal, Quebec H3C 1K3, Canada
| | - Omur E Dagdeviren
- Department of Mechanical Engineering, École de Technologie Supérieure, University of Quebec, Montreal, Quebec H3C 1K3, Canada
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