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Dalecky L, Sottile F, Hung L, Cazals L, Desolneux A, Chevalier A, Rueff JP, Bertrand L. Non-resonant inelastic X-ray scattering for discrimination of pigments. Phys Chem Chem Phys 2024; 26:4363-4371. [PMID: 38235804 DOI: 10.1039/d3cp04753a] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/19/2024]
Abstract
Inelastic X-ray scattering (IXS) spectroscopy has been used in many fields of solid-state physics and theoretical chemistry as an accurate and quantitative probe of elementary excitations. We show that non-resonant IXS spectra in the energy loss range below 100 eV exhibit a strong contrast across a wide range of commercially available pigments, opening new routes for their discrimination. These signatures combine plasmonic transitions, collective excitations and low energy absorption edges. We have performed IXS to discriminate different artists' pigments within complex mixtures and to quantitatively determine rutile and anatase polymorphs of TiO2. The integration of experimental data on pigment powders with suitable ab initio simulations shows a precise fit of the spectroscopic data both in the position of the resonances and in their relative intensity.
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Affiliation(s)
- Lauren Dalecky
- Université Paris-Saclay, ENS Paris-Saclay, CNRS, Photophysique et Photochimie Supramoléculaires et Macromoléculaires, 91190 Gif-sur-Yvette, France.
| | - Francesco Sottile
- ETSF and LSI, CNRS, CEA/DRF/IRAMIS, École Polytechnique, Institut Polytechnique de Paris, F-91120 Palaiseau, France
| | - Linda Hung
- Energy and Materials Division, Toyota Research Institute, Los Altos, CA 94022, USA
| | - Laure Cazals
- Université Paris-Saclay, ENS Paris-Saclay, CNRS, Photophysique et Photochimie Supramoléculaires et Macromoléculaires, 91190 Gif-sur-Yvette, France.
| | - Agnès Desolneux
- Université Paris-Saclay, ENS Paris-Saclay, CNRS, Centre Borelli, 91190 Gif-sur-Yvette, France
| | - Aurélia Chevalier
- Conservation of Cultural Heritage - Aurélia Chevalier Sàrl, Route des Jeunes 4bis, 1227 Les Acacias, Genève, Switzerland
| | - Jean-Pascal Rueff
- Synchrotron SOLEIL, L'Orme des Merisiers, BP 48 Saint-Aubin, 91192 Gif-sur-Yvette, France
- Laboratoire de Chimie Physique - Matière et Rayonnement (LCPMR), Sorbonne Université, CNRS, 75005 Paris, France
| | - Loïc Bertrand
- Université Paris-Saclay, ENS Paris-Saclay, CNRS, Photophysique et Photochimie Supramoléculaires et Macromoléculaires, 91190 Gif-sur-Yvette, France.
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Georgiou R, Sahle CJ, Sokaras D, Bernard S, Bergmann U, Rueff JP, Bertrand L. X-ray Raman Scattering: A Hard X-ray Probe of Complex Organic Systems. Chem Rev 2022; 122:12977-13005. [PMID: 35737888 DOI: 10.1021/acs.chemrev.1c00953] [Citation(s) in RCA: 2] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/22/2022]
Abstract
This paper provides a review of the characterization of organic systems via X-ray Raman scattering (XRS) and a step-by-step guidance for its application. We present the fundamentals of XRS required to use the technique and discuss the main parameters of the experimental set-ups to optimize spectral and spatial resolution while maximizing signal-to-background ratio. We review applications that target the analysis of mixtures of organic compounds, the identification of minor spectral features, and the spatial discrimination in heterogeneous systems. We discuss the recent development of the direct tomography technique, which utilizes the XRS process as a contrast mechanism for assessing the three-dimensional spatially resolved carbon chemistry of complex organic materials. We conclude by exposing the current limitations and provide an outlook on how to overcome some of the existing challenges and advance future developments and applications of this powerful technique for complex organic systems.
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Affiliation(s)
- Rafaella Georgiou
- Université Paris-Saclay, CNRS, Ministère de la Culture, UVSQ, MNHN, IPANEMA, F-91192 Saint-Aubin, France.,Synchrotron SOLEIL, L'Orme des Merisiers, Saint Aubin BP 48, 91192, Gif-sur-Yvette, France
| | | | - Dimosthenis Sokaras
- SLAC National Accelerator Laboratory, Stanford Synchrotron Radiation Lightsource, Menlo Park, California 94025, United States
| | - Sylvain Bernard
- Muséum National d'Histoire Naturelle, Sorbonne Université, CNRS, UMR 7590, Institut de Minéralogie, Physique des Matériaux et Cosmochimie, 75005 Paris, France
| | - Uwe Bergmann
- Department of Physics, University of Wisconsin-Madison, Madison, Wisconsin 53706, United States
| | - Jean-Pascal Rueff
- Synchrotron SOLEIL, L'Orme des Merisiers, Saint Aubin BP 48, 91192, Gif-sur-Yvette, France.,Laboratoire de Chimie Physique-Matière et Rayonnement, Sorbonne Université, CNRS, 75005 Paris, France
| | - Loïc Bertrand
- Photophysique et Photochimie Supramoléculaires et Macromoléculaires, Université Paris-Saclay, ENS Paris-Saclay, CNRS, 91190 Gif-sur-Yvette, France
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