THREE-DIMENSIONAL ELECTRICAL RESISTANCE TOMOGRAPHY IN A STIRRED MIXING VESSEL

Review of applications of electrical resistance tomography to chemical engineering

In spite of decades of study and investigation, the research on tomography and electrical resistance tomography (ERT) in particular, remains to be focus of immense scientific significance. ERT provides the ability to measure conductivity distribution inside a process plant and delivers time evolving multidimensional information. Such important and otherwise inaccessible information enhances critical process knowledge whilst improving the design and function of the process equipment. ERT has been employed in a variety of fields including chemical engineering. This paper reviews previous research carried out on the application of ERT within the chemical engineering arena. The applications are classified based on the objective of ERT measurements, the unit operations ERT has been utilized on, the media under examination, and also other technologies and data processing techniques used in combination with ERT. The objective of this taxonomy is to offer the reader with a broad insight into the current situation of ERT related research and developed applications in the chemical engineering field and to assist in the identification of research gaps for future investigation.

An efficient forward solver in electrical impedance tomography by spectral element method

In electrical impedance tomography (EIT), a forward solver capable of predicting the voltages on electrodes for a given conductivity distribution is essential for reconstruction. The EIT forward solver is normally based on the conventional finite element method (FEM). One of the major problems of three-dimensional (3-D) EIT is its high demand in computing power and memory since high precision is required for obtaining a small secondary field which is typical for a small anomaly. This accuracy requirement is also set by the level of noise in the real data; although currently the noise level is still an issue, future EIT systems should significantly reduce the noise level to be capable of detecting very small anomalies. To accurately simulate the forward solution with the FEM, a mesh with large number of nodes and elements is usually needed. To overcome this problem, we proposed the spectral element method (SEM) for EIT forward problem. With the introduction of SEM, a smaller number of nodes and hence less computational time and memory are needed to achieve the same or better accuracy in the forward solution than the FEM. Numerical results demonstrate the efficiency of the SEM in 3-D EIT simulation.