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For: Schulz M, Klausmann E, Hurrle A. Correlation of surface states with impurities. ACTA ACUST UNITED AC 1975. [DOI: 10.1080/10408437508243490] [Citation(s) in RCA: 14] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/23/2022]
Number Cited by Other Article(s)
1
Goetzberger A, Klausmann E, Schulz MJ. Interface states on semiconductor/insulator surfaces. ACTA ACUST UNITED AC 2006. [DOI: 10.1080/10408437608243548] [Citation(s) in RCA: 103] [Impact Index Per Article: 5.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/23/2022]
2
Bársony I, Giber J. SIMS depth profiling for the characterization of Si-SiO2 structures. ACTA ACUST UNITED AC 1980. [DOI: 10.1016/0378-5963(80)90002-1] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
3
Schulz M, Klausmann E. Transient capacitance measurements of interface states on the intentionally contaminated Si-SiO2 interface. ACTA ACUST UNITED AC 1979. [DOI: 10.1007/bf00934412] [Citation(s) in RCA: 85] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/25/2022]
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