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For:	Johanson RE, Scansen D, Kasap SO. 1/f conductance noise in n-type amorphous silicon. ACTA ACUST UNITED AC 2006. [DOI: 10.1080/13642819608239146] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/23/2022]

Number	Cited by Other Article(s)
1	Peled A, Johanson R, Zloof Y, Kasap S. 1/f noise in bismuth ruthenate based thick-film resistors. ACTA ACUST UNITED AC 1997. [DOI: 10.1109/95.623030] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse

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Cited by Other Article(s)

Peled A, Johanson R, Zloof Y, Kasap S. 1/f noise in bismuth ruthenate based thick-film resistors. ACTA ACUST UNITED AC 1997. [DOI: 10.1109/95.623030] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]