Vibrational excitation of N2O by electron impact via resonant processes in the 2 eV region: an angular study

Dissociative electron attachment to N2O using velocity slice imaging

The structure and dynamics of the negative ion resonances leading to dissociative electron attachment in N2O are studied using the velocity slice imaging technique. Distinct momentum distributions are observed in the O(-) channel for the dominant resonances below 4 eV which are considerably different than those reported so far. Also the relatively weak but distinct resonances at 8.1 eV and 13.2 eV are studied for their dynamics for the first time. For each of these resonances two different channels of dissociation are observed with differing angular distributions.

Low energy (0-4 eV) electron impact to N(2)O clusters: Dissociative electron attachment, ion-molecule reactions, and vibrational Feshbach resonances

Electron attachment to clusters of N(2)O in the energy range of 0-4 eV yields the ionic complexes [(N(2)O)(n)O](-), [(N(2)O)(n)NO](-), and (N(2)O)(n) (-) . The shape of the ion yields of the three homologous series differs substantially reflecting the different formation mechanisms. While the generation of [(N(2)O)(n)O](-) can be assigned to dissociative electron attachment (DEA) of an individual N(2)O molecule in the target cluster, the formation of [(N(2)O)(n)NO](-) is interpreted via a sequence of ion molecule reactions involving the formation of O(-) via DEA in the first step. The nondecomposed complexes (N(2)O)(n) (-) are preferentially formed at very low energies (below 0.5 eV) as a result of intramolecular stabilization of a diffuse molecular anion at low energy. The ion yields of [(N(2)O)(n)O](-) and (N(2)O)(n) (-) versus electron energy show sharp peaks at the threshold region, which can be assigned to vibrational Feshbach resonances mediated by the diffuse anion state as already observed in an ultrahigh resolution electron attachment study of N(2)O clusters [E. Leber, S. Barsotti, J. Bömmels, J. M. Weber, I. I. Fabrikant, M.-W. Ruf, and H. Hotop, Chem. Phys. Lett. 325, 345 (2000)].