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For: Kautek W. Electronic mobility anisotropy of layered semiconductors: transversal photoconductivity measurements at n-MoSe2. ACTA ACUST UNITED AC 2000. [DOI: 10.1088/0022-3719/15/16/002] [Citation(s) in RCA: 21] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
Number Cited by Other Article(s)
1
Lei Y, Yang X, Feng W. Synthesis of vertically-aligned large-area MoS2nanofilm and its application in MoS2/Si heterostructure photodetector. NANOTECHNOLOGY 2021;33:105709. [PMID: 34814119 DOI: 10.1088/1361-6528/ac3c7e] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/12/2021] [Accepted: 11/23/2021] [Indexed: 06/13/2023]
2
Balasubramanyam S, Bloodgood MA, van Ommeren M, Faraz T, Vandalon V, Kessels WMM, Verheijen MA, Bol AA. Probing the Origin and Suppression of Vertically Oriented Nanostructures of 2D WS2 Layers. ACS APPLIED MATERIALS & INTERFACES 2020;12:3873-3885. [PMID: 31880425 PMCID: PMC6978813 DOI: 10.1021/acsami.9b19716] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 10/31/2019] [Accepted: 12/27/2019] [Indexed: 06/10/2023]
3
Massicotte M, Schmidt P, Vialla F, Schädler KG, Reserbat-Plantey A, Watanabe K, Taniguchi T, Tielrooij KJ, Koppens FHL. Picosecond photoresponse in van der Waals heterostructures. NATURE NANOTECHNOLOGY 2016;11:42-6. [PMID: 26436565 DOI: 10.1038/nnano.2015.227] [Citation(s) in RCA: 226] [Impact Index Per Article: 28.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/04/2015] [Accepted: 09/01/2015] [Indexed: 05/07/2023]
4
Photovoltaic Properties of Solid State Junctions of Layered Semiconductors. PHYSICS AND CHEMISTRY OF MATERIALS WITH LOW-DIMENSIONAL STRUCTURES 1992. [DOI: 10.1007/978-94-015-1301-2_1] [Citation(s) in RCA: 15] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/12/2022]
5
Critical analysis of electrical contacts to layered semiconductors for use in (photo)electrochemical studies. ACTA ACUST UNITED AC 1989. [DOI: 10.1016/0022-0728(89)85148-4] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
6
Jakubowicz A, Mahalu D, Wolf M, Wold A, Tenne R. WSe2: Optical and electrical properties as related to surface passivation of recombination centers. PHYSICAL REVIEW. B, CONDENSED MATTER 1989;40:2992-3000. [PMID: 9992233 DOI: 10.1103/physrevb.40.2992] [Citation(s) in RCA: 55] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
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