Lu HC, Peng YC, Lin MY, Chou SL, Lo JI, Cheng BM. Analysis of Nickel Defect in Diamond with Photoluminescence upon Excitation near 200 nm.
Anal Chem 2015;
87:7340-4. [PMID:
26118839 DOI:
10.1021/acs.analchem.5b01493]
[Citation(s) in RCA: 5] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
Abstract
Photoluminescent (PL) spectra of synthetic diamond powders at temperatures between 10 and 300 K were excited with synchrotron radiation in the wavelength range 125-375 nm. Prominent spectral PL features were detected at 484.6 and 489.0 nm (2.559 and 2.535 eV), associated with nickel defect. During our measurement of PL excitation (PLE) spectra of Ni defect in diamond, we observed a distinct PLE line at 215 nm for the first time. We thereby suggest the use of UV-PL spectra excited in the region 200-220 nm to analyze and to identify nickel defect in diamonds.
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