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For: Kohyama M, Yamamoto R, Watanabe Y, Ebata Y, Kinoshita M. The atomic and electronic structure of the Σ=3 (211) twin boundary in Si. ACTA ACUST UNITED AC 2000. [DOI: 10.1088/0022-3719/21/20/001] [Citation(s) in RCA: 41] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
Number Cited by Other Article(s)
1
Kohyama M, Ichinose H, Ishida Y, Nakanose M. Energies and Atomic Structures of Grain Boundaries in Diamond: Comparison With Grain Boundaries in Silicon. ACTA ACUST UNITED AC 2011. [DOI: 10.1557/proc-339-681] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/13/2022]
2
TEM Studies of Grain Boundary Structure in a Cast Polycrystalline Silicon. ACTA ACUST UNITED AC 2005. [DOI: 10.4028/www.scientific.net/msf.475-479.1673] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
3
Morris JR, Fu CL, Ho KM. Tight-binding study of tilt grain boundaries in diamond. PHYSICAL REVIEW. B, CONDENSED MATTER 1996;54:132-138. [PMID: 9984238 DOI: 10.1103/physrevb.54.132] [Citation(s) in RCA: 50] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
4
Kohyama M, Takeda S. Tight-binding study of the {113} planar interstitial defects in Si. PHYSICAL REVIEW. B, CONDENSED MATTER 1995;51:13111-13116. [PMID: 9978109 DOI: 10.1103/physrevb.51.13111] [Citation(s) in RCA: 12] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
5
Kohyama M, Yamamoto R. Theoretical study of grain boundaries in Si: Effects of structural disorder on the local electronic structure and the origin of band tails. PHYSICAL REVIEW. B, CONDENSED MATTER 1994;50:8502-8522. [PMID: 9974869 DOI: 10.1103/physrevb.50.8502] [Citation(s) in RCA: 15] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
6
Kohyama M, Yamamoto R. Tight-binding study of grain boundaries in Si: Energies and atomic structures of twist grain boundaries. PHYSICAL REVIEW. B, CONDENSED MATTER 1994;49:17102-17117. [PMID: 10010888 DOI: 10.1103/physrevb.49.17102] [Citation(s) in RCA: 24] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
7
Kohyama M, Takeda S. Atomic structure and energy of the {113} planar interstitial defects in Si. PHYSICAL REVIEW. B, CONDENSED MATTER 1992;46:12305-12315. [PMID: 10003143 DOI: 10.1103/physrevb.46.12305] [Citation(s) in RCA: 30] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
8
Grain Boundaries in Elemental and Compound Semiconductors. ACTA ACUST UNITED AC 1991. [DOI: 10.1007/978-3-642-76385-4_17] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register]
9
Tarnow E, Dallot P, Bristowe PD, Joannopoulos JD, Francis GP, Payne MC. Structural complexity in grain boundaries with covalent bonding. PHYSICAL REVIEW. B, CONDENSED MATTER 1990;42:3644-3657. [PMID: 9995879 DOI: 10.1103/physrevb.42.3644] [Citation(s) in RCA: 27] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
10
Ackland G. Semiempirical model of covalent bonding in silicon. PHYSICAL REVIEW. B, CONDENSED MATTER 1989;40:10351-10355. [PMID: 9991580 DOI: 10.1103/physrevb.40.10351] [Citation(s) in RCA: 17] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
11
Paxton A, Sutton A. A tight-binding study of grain boundaries in silicon. ACTA ACUST UNITED AC 1989. [DOI: 10.1016/0001-6160(89)90056-4] [Citation(s) in RCA: 42] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
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