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LEACH RICHARDK, BLUNT LIAM, CHETWYND DEREKG, YACOOT ANDREW. NANOSCIENCE ADVANCES IN THE UK IN SUPPORT OF NANOTECHNOLOGY. INTERNATIONAL JOURNAL OF NANOSCIENCE 2012. [DOI: 10.1142/s0219581x02000115] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/18/2022]
Abstract
There is little doubt that nanotechnology will revolutionise peoples' approaches to areas as diverse as the structure of materials, production engineering, biotechnology and medicine. Currently there are a number of companies that are exploiting micro- and nanotechnology, mainly using a top–down approach, i.e., through miniaturisation. As new products are created from the new technologies there must be methods, developing in parallel, for ensuring product reliability and quality assurance. It is asserted that this can only be achieved through the development of a metrology infrastructure. This paper will describe some of the advances that have been made in the UK in developing such an infrastructure.
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Affiliation(s)
- RICHARD K. LEACH
- Centre for Basic, Thermal & Length Metrology, National Physical Laboratory, Teddington, Middlesex, TW11 0LW, UK
| | - LIAM BLUNT
- Department of Engineering, University of Huddersfield, Queens Gate, Huddersfield, HD1 3HD, UK
| | | | - ANDREW YACOOT
- Centre for Basic, Thermal & Length Metrology, National Physical Laboratory, Teddington, Middlesex, TW11 0LW, UK
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Whitehouse DJ, Bowen DK, Chetwynd DG, Davies ST. Nano-calibration for stylus-based surface measurement. ACTA ACUST UNITED AC 2000. [DOI: 10.1088/0022-3735/21/1/005] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
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