• Reference Citation Analysis
  • v
  • v
  • Find an Article
Find an Article PDF (4600962)   Today's Articles (6131)   Subscriber (49361)
For: Kaneko M, Hashimoto S, Hayakawa M, Aso K. Measuring the magnetostriction of thin films using an optical displacement meter. ACTA ACUST UNITED AC 2000. [DOI: 10.1088/0022-3735/21/5/013] [Citation(s) in RCA: 20] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
Number Cited by Other Article(s)
1
Wang X, Knapp P, Vaynman S, Graham ME, Cao J, Ulmer MP. Experimental study and analytical model of deformation of magnetostrictive films as applied to mirrors for x-ray space telescopes. APPLIED OPTICS 2014;53:6256-6267. [PMID: 25322105 DOI: 10.1364/ao.53.006256] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/12/2014] [Accepted: 08/16/2014] [Indexed: 06/04/2023]
2
Adhikari R, Sarkar A, Das AK. A versatile cantilever beam magnetometer for ex situ characterization of magnetic materials. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2012;83:013903. [PMID: 22299966 DOI: 10.1063/1.3680108] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/24/2023]
3
Marcus PM. Magnetostrictive bending of a film-substrate system. PHYSICAL REVIEW. B, CONDENSED MATTER 1996;53:2481-2486. [PMID: 9983751 DOI: 10.1103/physrevb.53.2481] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
PrevPage 1 of 1 1Next
© 2004-2024 Baishideng Publishing Group Inc. All rights reserved. 7041 Koll Center Parkway, Suite 160, Pleasanton, CA 94566, USA