Jakob R, Nilius N. A fiber scanning tunneling microscope for optical analysis at the nanoscale.
THE REVIEW OF SCIENTIFIC INSTRUMENTS 2020;
91:073110. [PMID:
32752868 DOI:
10.1063/5.0009182]
[Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/28/2020] [Accepted: 07/05/2020] [Indexed: 06/11/2023]
Abstract
A hybrid scanning tunneling/optical near-field microscope is presented, in which an optical fiber tip coated with 100 nm thick Ag/Cr films scans the surface. The tip metallization enables operating the instrument via a current-based distance control and guarantees sub-nanometer spatial resolution in the topographic channel. The fiber tip simultaneously serves as nanoscale light source, given the optical transparency of the metal coating. The emission response of the tip-sample junction is collected with two parabolic mirrors and probed with a far-field detector. To test the capabilities of the new setup, the evolution of the optical signal is monitored when the tip approaches a gold surface. The intensity rise and frequency shift of the emission provide evidence for the development of coupled plasmon modes in the tip-sample cavity. Photon mapping is employed to probe the optical inhomogeneity of Ru(0001) and TiO2(110) surfaces covered with silver deposits. While the 2D Ag flakes on Ru give rise to a near-field enhancement, the 3D particles on titania locally damp the gap plasmons and lower the emitted intensity. The lateral resolution in the optical channel has been estimated to be ∼1 nm, and optical and topographic signals are well correlated. Our fiber microscope thus appears to be suitable for probing optical surface properties at the nanoscale.
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