Controlling electron transfer processes on insulating surfaces with the non-contact atomic force microscope

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

Surfaces of thin oxide films were investigated by means of a dual mode NC-AFM/STM. Apart from imaging the surface termination by NC-AFM with atomic resolution, point defects in magnesium oxide on Ag(001) and line defects in aluminum oxide on NiAl(110), respectively, were thoroughly studied. The contact potential was determined by Kelvin probe force microscopy (KPFM) and the electronic structure by scanning tunneling spectroscopy (STS). On magnesium oxide, different color centers, i.e., F(0), F(+), F(2+) and divacancies, have different effects on the contact potential. These differences enabled classification and unambiguous differentiation by KPFM. True atomic resolution shows the topography at line defects in aluminum oxide. At these domain boundaries, STS and KPFM verify F(2+)-like centers, which have been predicted by density functional theory calculations. Thus, by determining the contact potential and the electronic structure with a spatial resolution in the nanometer range, NC-AFM and STM can be successfully applied on thin oxide films beyond imaging the topography of the surface atoms.

Direct measurement of the attractive interaction forces on F0 color centers on MgO(001) by dynamic force microscopy

Defect sites on oxide surfaces play a dominant role in surface chemistry. The direct atomistic study of these sites is important but very difficult. We have mimicked the adsorbate-defect interaction by a dynamic force microscope tip measuring the interaction with a color center (F(0)) on the MgO(001) surface. The experimental findings, complemented by density functional theory calculations, show a highly attractive adsorbate-defect interaction and a charge transfer at a critical distance.

Modelling components of future molecular devices

We discuss challenges involved in modelling different components of molecular devices and give several examples that demonstrate how computer modelling evolved over the last few years to become a comprehensive tool for designing molecules, predicting their adsorption and diffusion at surfaces, simulating atomic force microscopy imaging and manipulation of atoms and molecules at insulating surfaces and studying electron conduction in prototype molecular devices. We describe some of the computational techniques used for modelling adsorption, diffusion, imaging and manipulation of organic molecules at surfaces and challenges pertaining to these studies, give several examples of applications and discuss further prospects for theoretical modelling of complex organic molecules at surfaces.