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Plank H, Winkler R, Schwalb CH, Hütner J, Fowlkes JD, Rack PD, Utke I, Huth M. Focused Electron Beam-Based 3D Nanoprinting for Scanning Probe Microscopy: A Review. MICROMACHINES 2019; 11:E48. [PMID: 31906005 PMCID: PMC7019982 DOI: 10.3390/mi11010048] [Citation(s) in RCA: 42] [Impact Index Per Article: 8.4] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/29/2019] [Revised: 12/20/2019] [Accepted: 12/20/2019] [Indexed: 11/17/2022]
Abstract
Scanning probe microscopy (SPM) has become an essential surface characterization technique in research and development. By concept, SPM performance crucially depends on the quality of the nano-probe element, in particular, the apex radius. Now, with the development of advanced SPM modes beyond morphology mapping, new challenges have emerged regarding the design, morphology, function, and reliability of nano-probes. To tackle these challenges, versatile fabrication methods for precise nano-fabrication are needed. Aside from well-established technologies for SPM nano-probe fabrication, focused electron beam-induced deposition (FEBID) has become increasingly relevant in recent years, with the demonstration of controlled 3D nanoscale deposition and tailored deposit chemistry. Moreover, FEBID is compatible with practically any given surface morphology. In this review article, we introduce the technology, with a focus on the most relevant demands (shapes, feature size, materials and functionalities, substrate demands, and scalability), discuss the opportunities and challenges, and rationalize how those can be useful for advanced SPM applications. As will be shown, FEBID is an ideal tool for fabrication / modification and rapid prototyping of SPM-tipswith the potential to scale up industrially relevant manufacturing.
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Affiliation(s)
- Harald Plank
- Christian Doppler Laboratory for Direct–Write Fabrication of 3D Nano–Probes (DEFINE), Institute of Electron Microscopy and Nanoanalysis, Graz University of Technology, 8010 Graz, Austria;
- Institute of Electron Microscopy and Nanoanalysis, Graz University of Technology, 8010 Graz, Austria
- Graz Centre for Electron Microscopy, 8010 Graz, Austria
| | - Robert Winkler
- Christian Doppler Laboratory for Direct–Write Fabrication of 3D Nano–Probes (DEFINE), Institute of Electron Microscopy and Nanoanalysis, Graz University of Technology, 8010 Graz, Austria;
| | | | - Johanna Hütner
- GETec Microscopy GmbH, 1220 Vienna, Austria; (C.H.S.); (J.H.)
| | - Jason D. Fowlkes
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA; (J.D.F.); (P.D.R.)
- Materials Science and Engineering, The University of Tennessee, Knoxville, Knoxville, TN 37996, USA
| | - Philip D. Rack
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA; (J.D.F.); (P.D.R.)
- Materials Science and Engineering, The University of Tennessee, Knoxville, Knoxville, TN 37996, USA
| | - Ivo Utke
- Mechanics of Materials and Nanostructures Laboratory, Empa-Swiss Federal Laboratories for Materials Science and Technology, Feuerwerkerstrasse 39, 3602 Thun, Switzerland;
| | - Michael Huth
- Physics Institute, Goethe University Frankfurt, 60323 Frankfurt am Main, Germany;
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Strelcov E, Ahmadi M, Kalinin SV. Nanoscale Transport Imaging of Active Lateral Devices: Static and Frequency Dependent Modes. KELVIN PROBE FORCE MICROSCOPY 2018. [DOI: 10.1007/978-3-319-75687-5_10] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/17/2023]
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Stanford MG, Lewis BB, Noh JH, Fowlkes JD, Rack PD. Inert Gas Enhanced Laser-Assisted Purification of Platinum Electron-Beam-Induced Deposits. ACS APPLIED MATERIALS & INTERFACES 2015; 7:19579-88. [PMID: 26126173 DOI: 10.1021/acsami.5b02488] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/12/2023]
Abstract
Electron-beam-induced deposition patterns, with composition of PtC5, were purified using a pulsed laser-induced purification reaction to erode the amorphous carbon matrix and form pure platinum deposits. Enhanced mobility of residual H2O molecules via a localized injection of inert Ar-H2 (4%) is attributed to be the reactive gas species for purification of the deposits. Surface purification of deposits was realized at laser exposure times as low as 0.1 s. The ex situ purification reaction in the deposit interior was shown to be rate-limited by reactive gas diffusion into the deposit, and deposit contraction associated with the purification process caused some loss of shape retention. To circumvent the intrinsic flaws of the ex situ anneal process, in situ deposition and purification techniques were explored that resemble a direct write atomic layer deposition (ALD) process. First, we explored a laser-assisted electron-beam-induced deposition (LAEBID) process augmented with reactive gas that resulted in a 75% carbon reduction compared to standard EBID. A sequential deposition plus purification process was also developed and resulted in deposition of pure platinum deposits with high fidelity and shape retention.
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Affiliation(s)
- Michael G Stanford
- Materials Science and Engineering Department, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - Brett B Lewis
- Materials Science and Engineering Department, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - Joo Hyon Noh
- Materials Science and Engineering Department, University of Tennessee , Knoxville, Tennessee 37996, United States
| | - Jason D Fowlkes
- Materials Science and Engineering Department, University of Tennessee , Knoxville, Tennessee 37996, United States
- Nanofabrication Research Laboratory, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37381, United States
| | - Philip D Rack
- Materials Science and Engineering Department, University of Tennessee , Knoxville, Tennessee 37996, United States
- Nanofabrication Research Laboratory, Center for Nanophase Materials Sciences, Oak Ridge National Laboratory , Oak Ridge, Tennessee 37381, United States
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Stanford MG, Lewis BB, Noh JH, Fowlkes JD, Roberts NA, Plank H, Rack PD. Purification of nanoscale electron-beam-induced platinum deposits via a pulsed laser-induced oxidation reaction. ACS APPLIED MATERIALS & INTERFACES 2014; 6:21256-63. [PMID: 25371990 DOI: 10.1021/am506246z] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/06/2023]
Abstract
Platinum-carbon deposits made via electron-beam-induced deposition were purified via a pulsed laser-induced oxidation reaction and erosion of the amorphous carbon to form pure platinum. Purification proceeds from the top down and is likely catalytically facilitated via the evolving platinum layer. Thermal simulations suggest a temperature threshold of ∼485 K, and the purification rate is a function of the PtC5 thickness (80-360 nm) and laser pulse width (1-100 μs) in the ranges studied. The thickness dependence is attributed to the ∼235 nm penetration depth of the PtC5 composite at the laser wavelength, and the pulse-width dependence is attributed to the increased temperatures achieved at longer pulse widths. Remarkably fast purification is realized at cumulative laser exposure times of less than 1 s.
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Affiliation(s)
- Michael G Stanford
- Materials Science and Engineering Department, University of Tennessee , Knoxville, Tennessee 37996, United States
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Winkler R, Fowlkes J, Szkudlarek A, Utke I, Rack PD, Plank H. The nanoscale implications of a molecular gas beam during electron beam induced deposition. ACS APPLIED MATERIALS & INTERFACES 2014; 6:2987-95. [PMID: 24502299 DOI: 10.1021/am405591d] [Citation(s) in RCA: 17] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/27/2023]
Abstract
The gas flux direction in focused electron beam induced processes can strongly destabilize the morphology on the nanometer scale. We demonstrate how pattern parameters such as position relative to the gas nozzle, axial rotation, scanning direction, and patterning sequence result in different growth modes for identical structures. This is mainly caused by nanoscale geometric shadowing, particularly when shadowing distances are comparable to surface diffusion lengths of (CH3)3-Pt-CpCH3 adsorbates. Furthermore, two different adsorbate replenishment mechanisms exist and are governed by either surface diffusion or directional gas flux adsorption. The experimental study is complemented by calculations and dynamic growth simulations which successfully emulate the observed morphology instabilities and support the proposed growth model.
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Affiliation(s)
- Robert Winkler
- Center for Electron Microscopy, Steyrergasse 17, 8010 Graz, Austria
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Plank H, Noh JH, Fowlkes JD, Lester K, Lewis BB, Rack PD. Electron-beam-assisted oxygen purification at low temperatures for electron-beam-induced pt deposits: towards pure and high-fidelity nanostructures. ACS APPLIED MATERIALS & INTERFACES 2014; 6:1018-24. [PMID: 24377304 DOI: 10.1021/am4045458] [Citation(s) in RCA: 46] [Impact Index Per Article: 4.6] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/25/2023]
Abstract
Nanoscale metal deposits written directly by electron-beam-induced deposition, or EBID, are typically contaminated because of the incomplete removal of the original organometallic precursor. This has greatly limited the applicability of EBID materials synthesis, constraining the otherwise powerful direct-write synthesis paradigm. We demonstrate a low-temperature purification method in which platinum-carbon nanostructures deposited from MeCpPtIVMe3 are purified by the presence of oxygen gas during a post-electron exposure treatment. Deposit thickness, oxygen pressure, and oxygen temperature studies suggest that the dominant mechanism is the electron-stimulated reaction of oxygen molecules adsorbed at the defective deposit surface. Notably, pure platinum deposits with low resistivity and retain the original deposit fidelity were accomplished at an oxygen temperature of only 50 °C.
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Affiliation(s)
- Harald Plank
- Institute for Electron Microscopy and Nanoanalsis, Graz University of Technology , Steyrergasse 17, 8010 Graz, Austria
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Roberts NA, Fowlkes JD, Magel GA, Rack PD. Enhanced material purity and resolution via synchronized laser assisted electron beam induced deposition of platinum. NANOSCALE 2013. [PMID: 23184056 DOI: 10.1039/c2nr33014h] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/06/2023]
Abstract
We introduce a laser assisted electron beam induced deposition (LAEBID) process which is a nanoscale direct write synthesis method that integrates an electron beam induced deposition process with a synchronized pulsed laser step to induce thermal desorption of reaction by-products. Localized, spatially overlapping electron and photon pulses enable the thermal desorption of the reaction by-product while mitigating issues associated with bulk substrate heating, which can shorten the precursor residence time and distort pattern fidelity due to thermal drift. Current results demonstrate purification of platinum deposits (reduced carbon content by ~50%) with the addition of synchronized laser pulses as well as a significant reduction in deposit resistivity. Measured resistivities from platinum LAEBID structures (4 × 10(3)μΩ cm) are nearly 4 orders of magnitude lower than standard EBID platinum structures (2.2 × 10(7)μΩ cm) from the same precursor and are lower than the lowest reported EBID platinum resistivity with post-deposition annealing (1.4 × 10(4)μΩ cm). Finally the LAEBID process demonstrates improved deposit resolution by ~25% compared to EBID structures under the conditions investigated in this work.
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Balke N, Jesse S, Chu YH, Kalinin SV. High-frequency electromechanical imaging of ferroelectrics in a liquid environment. ACS NANO 2012; 6:5559-5565. [PMID: 22571634 DOI: 10.1021/nn301489g] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
Abstract
The coupling between electrical and mechanical phenomena is a ubiquitous feature of many information and energy storage materials and devices. In addition to involvement in performance and degradation mechanisms, electromechanical effects underpin a broad spectrum of nanoscale imaging and spectroscopies including piezoresponse force and electrochemical strain microscopies. Traditionally, these studies are conducted under ambient conditions. However, applications related to imaging energy storage and electrophysiological phenomena require operation in a liquid phase and therefore the development of electromechanical probing techniques suitable to liquid environments. Due to the relative high conductivity of most liquids and liquid decomposition at low voltages, the transfer of characterization techniques from ambient to liquid is not straightforward. Here we present a detailed study of ferroelectric domain imaging and manipulation in thin film BiFeO(3) using piezoresponse force microscopy in liquid environments as model systems for electromechanical phenomena in general. We explore the use of contact resonance enhancement and the application of multifrequency excitation and detection principles to overcome the experimental problems introduced by a liquid environment. Understanding electromechanical sample characterization in liquid is a key aspect not only for ferroelectric oxides but also for biological and electrochemical sample systems.
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Affiliation(s)
- Nina Balke
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
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Roberts NA, Noh JH, Lassiter MG, Guo S, Kalinin SV, Rack PD. Synthesis and electroplating of high resolution insulated carbon nanotube scanning probes for imaging in liquid solutions. NANOTECHNOLOGY 2012; 23:145301. [PMID: 22433664 PMCID: PMC3362830 DOI: 10.1088/0957-4484/23/14/145301] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [MESH Headings] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/22/2023]
Abstract
High resolution and isolated scanning probe microscopy (SPM) is in demand for continued development of energy storage and conversion systems involving chemical reactions at the nanoscale as well as an improved understanding of biological systems. Carbon nanotubes (CNTs) have large aspect ratios and, if leveraged properly, can be used to develop high resolution SPM probes. Isolation of SPM probes can be achieved by depositing a dielectric film and selectively etching at the apex of the probe. In this paper the fabrication of a high resolution and isolated SPM tip is demonstrated using electron beam induced etching of a dielectric film deposited onto an SPM tip with an attached CNT at the apex.
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Affiliation(s)
- N A Roberts
- Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN 37996, USA
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Brown KA, Westervelt RM. Triaxial AFM probes for noncontact trapping and manipulation. NANO LETTERS 2011; 11:3197-3201. [PMID: 21766811 DOI: 10.1021/nl201434t] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
Abstract
We show that a triaxial atomic force microscopy probe creates a noncontact trap for a single particle in a fluid via negative dielectrophoresis. A zero in the electric field profile traps the particle above the probe surface, avoiding adhesion, and the repulsive region surrounding the zero pushes other particles away, preventing clustering. Triaxial probes are promising for three-dimensional assembly and for selective imaging of a particular property of a sample using interchangeable functionalized particles.
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Affiliation(s)
- Keith A Brown
- School of Engineering and Applied Sciences, and Department of Physics, Harvard University, Cambridge, Massachusetts 02138, United States
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