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For: Kuchibhatla SVNT, Shutthanandan V, Prosa TJ, Adusumilli P, Arey B, Buxbaum A, Wang YC, Tessner T, Ulfig R, Wang CM, Thevuthasan S. Three-dimensional chemical imaging of embedded nanoparticles using atom probe tomography. Nanotechnology 2012;23:215704. [PMID: 22551877 DOI: 10.1088/0957-4484/23/21/215704] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
Number Cited by Other Article(s)
1
Atomically resolved tomographic reconstruction of nanoparticles from single projection: Influence of amorphous carbon support. Ultramicroscopy 2020;221:113177. [PMID: 33290981 DOI: 10.1016/j.ultramic.2020.113177] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/06/2020] [Revised: 11/15/2020] [Accepted: 11/21/2020] [Indexed: 11/22/2022]
2
Atom Probe Tomography for Catalysis Applications: A Review. APPLIED SCIENCES-BASEL 2019. [DOI: 10.3390/app9132721] [Citation(s) in RCA: 12] [Impact Index Per Article: 2.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/09/2023]
3
Kim SH, Lee JY, Ahn JP, Choi PP. Fabrication of Atom Probe Tomography Specimens from Nanoparticles Using a Fusible Bi-In-Sn Alloy as an Embedding Medium. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2019;25:438-446. [PMID: 30714553 DOI: 10.1017/s1431927618015556] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
4
Kim SH, Kang PW, Park OO, Seol JB, Ahn JP, Lee JY, Choi PP. A new method for mapping the three-dimensional atomic distribution within nanoparticles by atom probe tomography (APT). Ultramicroscopy 2018;190:30-38. [DOI: 10.1016/j.ultramic.2018.04.005] [Citation(s) in RCA: 37] [Impact Index Per Article: 6.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/24/2017] [Revised: 03/27/2018] [Accepted: 04/12/2018] [Indexed: 11/29/2022]
5
Multiscale correlative tomography: an investigation of creep cavitation in 316 stainless steel. Sci Rep 2017;7:7332. [PMID: 28779097 PMCID: PMC5544716 DOI: 10.1038/s41598-017-06976-5] [Citation(s) in RCA: 29] [Impact Index Per Article: 4.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/02/2017] [Accepted: 06/21/2017] [Indexed: 11/08/2022]  Open
6
Wang Z, Liu J, Zhou Y, Neeway JJ, Schreiber DK, Crum JV, Ryan JV, Wang XL, Wang F, Zhu Z. Nanoscale imaging of Li and B in nuclear waste glass, a comparison of ToF-SIMS, NanoSIMS, and APT. SURF INTERFACE ANAL 2016. [DOI: 10.1002/sia.6049] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
7
Devaraj A, Colby R, Vurpillot F, Thevuthasan S. Understanding Atom Probe Tomography of Oxide-Supported Metal Nanoparticles by Correlation with Atomic-Resolution Electron Microscopy and Field Evaporation Simulation. J Phys Chem Lett 2014;5:1361-1367. [PMID: 26269980 DOI: 10.1021/jz500259c] [Citation(s) in RCA: 15] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
8
Devaraj A, Colby R, Hess WP, Perea DE, Thevuthasan S. Role of Photoexcitation and Field Ionization in the Measurement of Accurate Oxide Stoichiometry by Laser-Assisted Atom Probe Tomography. J Phys Chem Lett 2013;4:993-8. [PMID: 26291366 DOI: 10.1021/jz400015h] [Citation(s) in RCA: 39] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
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