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For: Nishiguchi K, Ono Y, Fujiwara A. Single-electron thermal noise. Nanotechnology 2014;25:275201. [PMID: 25093235 DOI: 10.1088/0957-4484/25/27/275201] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
Number Cited by Other Article(s)
1
Liu F, Ibukuro K, Husain MK, Li Z, Hillier J, Tomita I, Tsuchiya Y, Rutt H, Saito S. Manipulation of random telegraph signals in a silicon nanowire transistor with a triple gate. NANOTECHNOLOGY 2018;29:475201. [PMID: 30191886 DOI: 10.1088/1361-6528/aadfa6] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
2
Power generator driven by Maxwell's demon. Nat Commun 2017;8:15310. [PMID: 28508864 PMCID: PMC5440804 DOI: 10.1038/ncomms15301] [Citation(s) in RCA: 51] [Impact Index Per Article: 7.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/15/2016] [Accepted: 03/20/2017] [Indexed: 12/02/2022]  Open
3
Jalil J, Zhu Y, Ekanayake C, Ruan Y. Sensing of single electrons using micro and nano technologies: a review. NANOTECHNOLOGY 2017;28:142002. [PMID: 28273047 DOI: 10.1088/1361-6528/aa57aa] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
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