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Basyooni MA, Gaballah AEH, Tihtih M, Derkaoui I, Zaki SE, Eker YR, Ateş Ş. Thermionic Emission of Atomic Layer Deposited MoO 3/Si UV Photodetectors. MATERIALS (BASEL, SWITZERLAND) 2023; 16:2766. [PMID: 37049060 PMCID: PMC10095631 DOI: 10.3390/ma16072766] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 03/02/2023] [Revised: 03/24/2023] [Accepted: 03/28/2023] [Indexed: 06/19/2023]
Abstract
Ultrathin MoO3 semiconductor nanostructures have garnered significant interest as a promising nanomaterial for transparent nano- and optoelectronics, owing to their exceptional reactivity. Due to the shortage of knowledge about the electronic and optoelectronic properties of MoO3/n-Si via an ALD system of few nanometers, we utilized the preparation of an ultrathin MoO3 film at temperatures of 100, 150, 200, and 250 °C. The effect of the depositing temperatures on using bis(tbutylimido)bis(dimethylamino)molybdenum (VI) as a molybdenum source for highly stable UV photodetectors were reported. The ON-OFF and the photodetector dynamic behaviors of these samples under different applied voltages of 0, 0.5, 1, 2, 3, 4, and 5 V were collected. This study shows that the ultrasmooth and homogenous films of less than a 0.30 nm roughness deposited at 200 °C were used efficiently for high-performance UV photodetector behaviors with a high sheet carrier concentration of 7.6 × 1010 cm-2 and external quantum efficiency of 1.72 × 1011. The electronic parameters were analyzed based on thermionic emission theory, where Cheung and Nord's methods were utilized to determine the photodetector electronic parameters, such as the ideality factor (n), barrier height (Φ0), and series resistance (Rs). The n-factor values were higher in the low voltage region of the I-V diagram, potentially due to series resistance causing a voltage drop across the interfacial thin film and charge accumulation at the interface states between the MoO3 and Si surfaces.
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Affiliation(s)
- Mohamed A. Basyooni
- Department of Nanotechnology and Advanced Materials, Graduate School of Applied and Natural Science, Selçuk University, Konya 42030, Turkey
- Science and Technology Research and Application Center (BITAM), Necmettin Erbakan University, Konya 42090, Turkey
- Solar and Space Research Department, National Research Institute of Astronomy and Geophysics (NRIAG), Cairo 11421, Egypt
| | - A. E. H. Gaballah
- Photometry and Radiometry Division, National Institute of Standards (NIS), Tersa St, Al-Haram, Giza 12211, Egypt
| | - Mohammed Tihtih
- Institute of Ceramics and Polymer Engineering, University of Miskolc, H-3515 Miskolc, Hungary
| | - Issam Derkaoui
- Laboratory of Solid-State Physics, Faculty of Sciences Dhar el Mahraz, University Sidi Mohammed Ben Abdellah, P.O. Box 1796, Atlas Fez 30000, Morocco
| | - Shrouk E. Zaki
- Department of Nanotechnology and Advanced Materials, Graduate School of Applied and Natural Science, Selçuk University, Konya 42030, Turkey
- Theoretical Physics Department, National Research Center, Dokki, Cairo 12622, Egypt
| | - Yasin Ramazan Eker
- Science and Technology Research and Application Center (BITAM), Necmettin Erbakan University, Konya 42090, Turkey
- Department of Metallurgy and Material Engineering, Faculty of Engineering and Architecture, Necmettin Erbakan University, Konya 42060, Turkey
| | - Şule Ateş
- Department of Physics, Faculty of Science, Selçuk University, Konya 42075, Turkey
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Paul F, Paul S. To Be or Not to Be - Review of Electrical Bistability Mechanisms in Polymer Memory Devices. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2022; 18:e2106442. [PMID: 35132772 DOI: 10.1002/smll.202106442] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/22/2021] [Revised: 12/24/2021] [Indexed: 06/14/2023]
Abstract
Organic memory devices are a rapidly evolving field with much improvement in device performance, fabrication, and application. But the reports have been disparate in terms of the material behavior and the switching mechanisms in the devices. And, despite the advantages, the lack of agreement in regards to the switching behavior of the memory devices is the biggest challenge that the field must overcome to mature as a commercial competitor. This lack of consensus has been the motivation of this work wherein various works are compiled together to understand influencing factors in the memory devices. Different works are compared together to discover some clues about the nature of the switching occurring in the devices, along with some missing links that would require further investigation. The charge storage mechanism is critically analyzed alongside the various resistive switching mechanisms such as filamentary conduction, redox-based switching, metal oxide switching, and other proposed mechanisms. The factors that affect the switching process are also analyzed including the effect of nanoparticles, the effect of the choice of polymer, or even the effect of electrodes on the switching behavior and the performance parameters of the memory device.
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Affiliation(s)
- Febin Paul
- Emerging Technologies Research Centre, De Montfort University, The Gateway, Leicester, LE1 9BH, UK
| | - Shashi Paul
- Emerging Technologies Research Centre, De Montfort University, The Gateway, Leicester, LE1 9BH, UK
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Shen J, Xue F, Wang G, Li Y, Dong H, Zhang Q. Effective Transport Tunnels Achieved by 1,2,4,5-Tetrazine-Induced Intermolecular C-H...N Interaction and Anion Radicals for Stable ReRAM Performance. ACS APPLIED MATERIALS & INTERFACES 2022; 14:8218-8225. [PMID: 35107274 DOI: 10.1021/acsami.1c23654] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/14/2023]
Abstract
The D-A structured small-molecule-based resistive random-access memory (ReRAM) device has been well-researched in the last decade, and the switching mechanism was mainly induced by the intramolecular/intermolecular charge transfer processes from the donors to the acceptors. However, in the previous work, some small molecules with pristine electron acceptors in the backbone could still show the typical memory behaviors, of which the switching mechanism is still ambiguous. In this work, two 1,2,4,5-tetrazine based n-type small-molecular isomers, 2-DPTZ and 4-DPTZ, with the same electron acceptor, 1,2,4,5-tetrazine and pyridine, are chosen to investigate the isomeric effects on molecular packing, switching mechanism, and memory performance. Because of the abundant nitrogen atoms with a localized lone pair of electrons in the sp2 orbital, 2-DPTZ and 4-DPTZ compounds could self-assemble into a long-range ordered molecular packing through intermolecular C-H...N interactions, affording effective transporting tunnels for charge-carrier transport. As expected, the sandwich-structured ITO/2-DPTZ or 4-DPTZ/Al memory devices both showed binary memory characteristics, with 2-DPTZ based memory devices showing the write once read many times (WORM) memory behavior and 4-DPTZ based memory devices having the negative differential resistance (NDR) memory performance. These distinct ReRAM properties arose from the different morphologies of 2-DPTZ and 4-DPTZ films that were induced by the different packing styles between the adjacent molecules, as confirmed by X-ray diffraction (XRD) and tapping-mode atomic force microscopy (AFM) height images. Most importantly, the switching mechanism was thought to be attributed to the injected electrons that reduced the neutral molecules of 2-DPTZ and 4-DPTZ to their corresponding anion radicals. Thus, this present work helps us better understand the conducting mechanism of small molecules with pristine electron acceptors in the backbone and provides a supplementary guideline for designing multilevel small molecules to match the structure-stacking-property relationship.
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Affiliation(s)
- Junyu Shen
- School of Materials Engineering, Changshu Institute of Technology, Changshu, Jiangsu 215500, P.R. China
| | - Fei Xue
- School of Materials Engineering, Changshu Institute of Technology, Changshu, Jiangsu 215500, P.R. China
| | - Guan Wang
- College of Chemistry, Chemical Engineering and Materials Science, Soochow University, Suzhou 215123, P.R. China
| | - Yang Li
- School of Physical Science and Technology, Suzhou University of Science and Technology, Suzhou, Jiangsu 215009, China
| | - Huilong Dong
- School of Materials Engineering, Changshu Institute of Technology, Changshu, Jiangsu 215500, P.R. China
| | - Qijian Zhang
- School of Materials Engineering, Changshu Institute of Technology, Changshu, Jiangsu 215500, P.R. China
- College of Chemistry, Chemical Engineering and Materials Science, Soochow University, Suzhou 215123, P.R. China
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Zhang H, Zhao X, Huang J, Bai J, Hou Y, Wang C, Wang S, Bai X. Bistable non-volatile resistive memory devices based on ZnO nanoparticles embedded in polyvinylpyrrolidone. RSC Adv 2020; 10:14662-14669. [PMID: 35497168 PMCID: PMC9051947 DOI: 10.1039/d0ra00667j] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/21/2020] [Accepted: 03/24/2020] [Indexed: 11/22/2022] Open
Abstract
The resistive random access memory (RRAM) devices based on polyvinylpyrrolidone (PVP) and PVP:PVP:zinc oxide nanoparticle (ZnO NP) active layers have bistable electrical switching behavior. Herein, via a series of storage performance tests, it was proved that the ITO/PVP:ZnO/Al device has a higher ON/OFF current ratio and better memory performance than the ITO/PVP/Al device. Moreover, at 13 wt% concentration of ZnO NPs, optimal storage performance was obtained, the switch state current ratio significantly increased, and the threshold voltage obviously decreased. The conduction mechanism of the devices was further discussed. The device having inorganic nanoparticles embedded in the polymer has excellent storage performance, which has potential application value in data storage. The resistive random access memory (RRAM) devices based on polyvinylpyrrolidone (PVP) and PVP:PVP:zinc oxide nanoparticle (ZnO NP) active layers have bistable electrical switching behavior.![]()
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Affiliation(s)
- Hongyan Zhang
- School of Chemical Engineering and Materials, Heilongjiang University Harbin 150080 P. R. China
| | - Xiaofeng Zhao
- School of Electronic Engineering, Heilongjiang University Harbin 150080 P. R. China
| | - Jiahe Huang
- School of Chemical Engineering and Materials, Heilongjiang University Harbin 150080 P. R. China
| | - Ju Bai
- School of Chemical Engineering and Materials, Heilongjiang University Harbin 150080 P. R. China
| | - Yanjun Hou
- School of Chemical Engineering and Materials, Heilongjiang University Harbin 150080 P. R. China
| | - Cheng Wang
- School of Chemical Engineering and Materials, Heilongjiang University Harbin 150080 P. R. China .,South China Advanced Institute for Soft Matter Science and Technology, South China University of Technology Guangzhou 510640 P. R. China
| | - Shuhong Wang
- School of Chemical Engineering and Materials, Heilongjiang University Harbin 150080 P. R. China
| | - Xuduo Bai
- School of Chemical Engineering and Materials, Heilongjiang University Harbin 150080 P. R. China
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Kocherga M, Castaneda J, Walter MG, Zhang Y, Saleh NA, Wang L, Jones DS, Merkert J, Donovan-Merkert B, Li Y, Hofmann T, Schmedake TA. Si(bzimpy)2 – a hexacoordinate silicon pincer complex for electron transport and electroluminescence. Chem Commun (Camb) 2018; 54:14073-14076. [DOI: 10.1039/c8cc07681b] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
We demonstrate the feasibility of hexacoordinate silicon complexes with dianionic pincer ligands as electron transport and electroluminescent components of organic electronic devices.
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Affiliation(s)
- Margaret Kocherga
- University of North Carolina – Charlotte, Department of Chemistry
- Charlotte
- USA
| | - Jose Castaneda
- University of North Carolina – Charlotte, Department of Electrical and Computer Engineering
- Charlotte
- USA
| | - Michael G. Walter
- University of North Carolina – Charlotte, Department of Chemistry
- Charlotte
- USA
| | - Yong Zhang
- University of North Carolina – Charlotte, Department of Electrical and Computer Engineering
- Charlotte
- USA
| | - Nemah-Allah Saleh
- University of North Carolina – Charlotte, Department of Chemistry
- Charlotte
- USA
| | - Le Wang
- University of North Carolina – Charlotte, Department of Chemistry
- Charlotte
- USA
| | - Daniel S. Jones
- University of North Carolina – Charlotte, Department of Chemistry
- Charlotte
- USA
| | - Jon Merkert
- University of North Carolina – Charlotte, Department of Chemistry
- Charlotte
- USA
| | | | - Yanzeng Li
- University of North Carolina – Charlotte, Department of Physics and Optical Science
- Charlotte
- USA
| | - Tino Hofmann
- University of North Carolina – Charlotte, Department of Physics and Optical Science
- Charlotte
- USA
| | - Thomas A. Schmedake
- University of North Carolina – Charlotte, Department of Chemistry
- Charlotte
- USA
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