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For: Ge B, Larson S, Tu H, Zhao Y, Fei Y. Generalized ellipsometry characterization of Ag nanorod arrays prepared by oblique angle deposition. Nanotechnology 2020;31:075705. [PMID: 31675750 DOI: 10.1088/1361-6528/ab53ae] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
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Zhao Y, Kumar A, Yang Y. Unveiling practical considerations for reliable and standardized SERS measurements: lessons from a comprehensive review of oblique angle deposition-fabricated silver nanorod array substrates. Chem Soc Rev 2024;53:1004-1057. [PMID: 38116610 DOI: 10.1039/d3cs00540b] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/21/2023]
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