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Sun Y, Li T, Lan L, Chen J, Zhu W, Xue S, Jin L. A Mini-Review on the Thermal Fatigue Properties of Copper Materials Applied at the Front-End of Synchrotron Radiation Facilities. ENTROPY (BASEL, SWITZERLAND) 2023; 25:e25050714. [PMID: 37238469 DOI: 10.3390/e25050714] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/28/2022] [Revised: 03/27/2023] [Accepted: 03/29/2023] [Indexed: 05/28/2023]
Abstract
Oxygen-free high-conductivity copper (OFHC), chromium-zirconium copper (CuCrZr), and Glidcop® AL-15 are widely used in the high heat load absorber elements at the front end of synchrotron radiation facilities. It is necessary to choose the most suitable material according to the actual engineering conditions (such as the specific heat load, material performance, and costs). In the long-term service period, the absorber elements have to bear hundreds or kilowatts of high heat load and its "load-unload" cyclic loading mode. Therefore, the thermal fatigue and thermal creep properties of the materials are critical and have been extensively studied. In this paper, based on the published pieces of the literature, the thermal fatigue theory, experimental principles, methods, test standards, test types of equipment, and key indicators of the thermal fatigue performance of typical copper metal materials used in the front end of synchrotrons radiation Facilities are reviewed, as well as the relevant studies carried out by the well-known synchrotron radiation institutions. In particular, the fatigue failure criteria for these materials and some effective methods for improving the thermal fatigue resistance performance of the high-heat load components are also presented.
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Affiliation(s)
- Yunfei Sun
- Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
- University of Chinese Academy of Sciences, Beijing 100049, China
| | - Tong Li
- Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
- University of Chinese Academy of Sciences, Beijing 100049, China
| | - Lan Lan
- Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
- University of Chinese Academy of Sciences, Beijing 100049, China
| | - Jiahua Chen
- Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
- Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China
| | - Wanqian Zhu
- Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
- Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China
| | - Song Xue
- Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
- Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China
| | - Limin Jin
- Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
- Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China
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Park JS, Horn C, Ramanathan P, Kenesei P, Veseli S. Data management and processing workflow for the Materials Physics and Engineering group beamlines at the Advanced Photon Source. JOURNAL OF SYNCHROTRON RADIATION 2019; 26:373-381. [PMID: 30855245 DOI: 10.1107/s1600577519000584] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/28/2018] [Accepted: 01/10/2019] [Indexed: 06/09/2023]
Abstract
The ability to store, organize, process and distribute experimental data effectively, efficiently and securely is particularly important for large user facilities like the Advanced Photon Source. In this article, the deployment of the APS Data Management System (DM) at the 1-ID and 6-BM beamlines of the APS is described. These two beamlines support a wide range of experimental techniques and generate data at relatively high rates, making them ideal candidates to illustrate the deployment and customization of the DM system and its tools. Using several usage examples at these beamlines, various capabilities of the DM system are described.
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Affiliation(s)
- Jun Sang Park
- Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA
| | - Connor Horn
- Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA
| | - Prithvi Ramanathan
- Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA
| | - Peter Kenesei
- Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA
| | - Siniša Veseli
- Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA
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Shade PA, Menasche DB, Bernier JV, Kenesei P, Park JS, Suter RM, Schuren JC, Turner TJ. Fiducial marker application method for position alignment of in situ multimodal X-ray experiments and reconstructions. J Appl Crystallogr 2016. [DOI: 10.1107/s1600576716001989] [Citation(s) in RCA: 21] [Impact Index Per Article: 2.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022] Open
Abstract
An evolving suite of X-ray characterization methods are presently available to the materials community, providing a great opportunity to gain new insight into material behavior and provide critical validation data for materials models. Two critical and related issues are sample repositioning during an in situ experiment and registration of multiple data sets after the experiment. To address these issues, a method is described which utilizes a focused ion-beam scanning electron microscope equipped with a micromanipulator to apply gold fiducial markers to samples for X-ray measurements. The method is demonstrated with a synchrotron X-ray experiment involving in situ loading of a titanium alloy tensile specimen.
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