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For: Baba N, Terayama K, Yoshimizu T, Ichise N, Tanaka N. An auto-tuning method for focusing and astigmatism correction in HAADF-STEM, based on the image contrast transfer function. J Electron Microsc (Tokyo) 2001;50:163-76. [PMID: 11469405 DOI: 10.1093/jmicro/50.3.163] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/13/2022]
Number Cited by Other Article(s)
1
Jones L, Nellist PD. Testing the accuracy of the two-dimensional object model in HAADF STEM. Micron 2014;63:47-51. [DOI: 10.1016/j.micron.2013.12.012] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/23/2013] [Revised: 12/10/2013] [Accepted: 12/17/2013] [Indexed: 11/28/2022]
2
Akima H, Yoshida T. Measurement of large low-order aberrations by using a series of through-focus Ronchigrams. Microscopy (Oxf) 2014;63:325-32. [PMID: 24740798 DOI: 10.1093/jmicro/dfu010] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022]  Open
3
Jones L, Nellist PD. Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscope. J Microsc 2014;254:47-64. [PMID: 24617853 DOI: 10.1111/jmi.12117] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/10/2013] [Accepted: 02/10/2014] [Indexed: 11/28/2022]
4
Binding J, Mikula S, Denk W. Low-dosage Maximum-A-Posteriori Focusing and Stigmation. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2013;19:38-55. [PMID: 23380003 DOI: 10.1017/s1431927612013852] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]
5
Compressed Sensing and Electron Microscopy. MODELING NANOSCALE IMAGING IN ELECTRON MICROSCOPY 2012. [DOI: 10.1007/978-1-4614-2191-7_4] [Citation(s) in RCA: 29] [Impact Index Per Article: 2.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/13/2022]
6
Moradi I, Behjati M. Six common errors cause dangerous mistakes in interpretation of electron micrographs. Microsc Res Tech 2011;75:677-82. [DOI: 10.1002/jemt.21111] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/05/2011] [Accepted: 09/29/2011] [Indexed: 11/09/2022]
7
A novel method for focus assessment in atomic resolution STEM HAADF experiments. Ultramicroscopy 2006. [DOI: 10.1016/j.ultramic.2006.03.005] [Citation(s) in RCA: 13] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/19/2022]
8
Ziese U, Kübel C, Verkleij A, Koster AJ. Three-dimensional localization of ultrasmall immuno-gold labels by HAADF-STEM tomography. J Struct Biol 2002;138:58-62. [PMID: 12160701 DOI: 10.1016/s1047-8477(02)00018-7] [Citation(s) in RCA: 45] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/25/2022]
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