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San Gabriel ML, Qiu C, Yu D, Yaguchi T, Howe JY. Simultaneous secondary electron microscopy in the scanning transmission electron microscope with applications for in situ studies. Microscopy (Oxf) 2024; 73:169-183. [PMID: 38334743 DOI: 10.1093/jmicro/dfae007] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/15/2023] [Revised: 12/09/2023] [Accepted: 02/05/2024] [Indexed: 02/10/2024] Open
Abstract
Scanning/transmission electron microscopy (STEM) is a powerful characterization tool for a wide range of materials. Over the years, STEMs have been extensively used for in situ studies of structural evolution and dynamic processes. A limited number of STEM instruments are equipped with a secondary electron (SE) detector in addition to the conventional transmitted electron detectors, i.e. the bright-field (BF) and annular dark-field (ADF) detectors. Such instruments are capable of simultaneous BF-STEM, ADF-STEM and SE-STEM imaging. These methods can reveal the 'bulk' information from BF and ADF signals and the surface information from SE signals for materials <200 nm thick. This review first summarizes the field of in situ STEM research, followed by the generation of SE signals, SE-STEM instrumentation and applications of SE-STEM analysis. Combining with various in situ heating, gas reaction and mechanical testing stages based on microelectromechanical systems (MEMS), we show that simultaneous SE-STEM imaging has found applications in studying the dynamics and transient phenomena of surface reconstructions, exsolution of catalysts, lunar and planetary materials and mechanical properties of 2D thin films. Finally, we provide an outlook on the potential advancements in SE-STEM from the perspective of sample-related factors, instrument-related factors and data acquisition and processing.
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Affiliation(s)
- Mia L San Gabriel
- Department of Materials Science and Engineering, University of Toronto, 184 College St, Toronto, ON M5S 3E4,Canada
| | - Chenyue Qiu
- Department of Materials Science and Engineering, University of Toronto, 184 College St, Toronto, ON M5S 3E4,Canada
| | - Dian Yu
- Department of Materials Science and Engineering, University of Toronto, 184 College St, Toronto, ON M5S 3E4,Canada
| | - Toshie Yaguchi
- Electron Microscope Systems Design Department, Hitachi High-Tech Corporation, 552-53 shinko-cho, Hitachinaka-shi, Ibaraki-ken 312-8504, Japan
| | - Jane Y Howe
- Department of Materials Science and Engineering, University of Toronto, 184 College St, Toronto, ON M5S 3E4,Canada
- Department of Chemical Engineering, University of Toronto, 200 College St, Toronto, ON M5T 3E5, Canada
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2
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Egerton RF, Zhu Y. OUP accepted manuscript. Microscopy (Oxf) 2022; 72:66-77. [PMID: 35535685 DOI: 10.1093/jmicro/dfac022] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/02/2022] [Revised: 04/09/2022] [Accepted: 05/09/2022] [Indexed: 11/13/2022] Open
Abstract
We first review the significance of resolution and contrast in electron microscopy and the effect of the electron optics on these two quantities. We then outline the physics of the generation of secondary electrons (SEs) and their transport and emission from the surface of a specimen. Contrast and resolution are discussed for different kinds of SE imaging in scanning electron microscope (SEM) and scanning-transmission microscope instruments, with some emphasis on the observation of individual atoms and atomic columns in a thin specimen. The possibility of achieving atomic resolution from a bulk specimen at SEM energies is also considered.
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Affiliation(s)
- R F Egerton
- Physics Department, University of Alberta, Edmonton, Alberta T1W 2E2, Canada
| | - Y Zhu
- Electron Microscopy and Nanostructure Group, Condensed Matter Physics and Materials Science Division, Brookhaven National Laboratory, Upton, NY 11973, USA
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3
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Mejías FJR, López-Haro M, Gontard LC, Cala A, Fernández-Aparicio M, Molinillo JMG, Calvino JJ, Macías FA. A Novel Electron Microscopic Characterization of Core/Shell Nanobiostimulator Against Parasitic Plants. ACS APPLIED MATERIALS & INTERFACES 2018; 10:2354-2359. [PMID: 29261284 DOI: 10.1021/acsami.7b16873] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
Nanoencapsulation has proven to be an efficient route to increase significantly the solubility and bioavailability of organic compounds. This aspect of nanotechnology is illustrated for the case of phthalimide-lactone (PL), a recently synthesized strigolactone mimic whose very limited solubility in water, as a free chemical, precludes its practical use as an agrochemical in the fight against parasitic plants. Pluronic F-127 (P127) nanoparticles functionalized with PL have been synthesized and embedded in a polymeric matrix of poly(vinyl alcohol) (PVA). Low-voltage and medium voltage imaging and spectroscopic scanning electron microscopy (S(T)EM) techniques were combined to confirm the synthesis of multicore nanoparticles that were rich in nitrogen, a finding that is due to the successful encapsulation of PL. This PL@P127/PVA nanobiostimulator formulation has an impressive solubility in water, that is, 27 times higher than that of pure phthalimide-lactone. Also critical from the functional point of view, comparative bioassays clearly showed that the intrinsic stimulatory activity of this agrochemical is fully maintained in the nanoencapsulated formulation.
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Affiliation(s)
- Francisco J R Mejías
- Allelopathy Group, Department of Organic Chemistry, Institute of Biomolecules (INBIO), Campus CEIA3, School of Science, University of Cádiz , C/República Saharaui, 7, 11510, Puerto Real (Cádiz), Spain
| | - Miguel López-Haro
- Nanomaterials and Catalysis Lab, Department of Inorganic Chemistry, School of Science, University of Cádiz , C/República Saharaui, 7, 11510, Puerto Real (Cádiz), Spain
| | - Lionel C Gontard
- Nanomaterials and Catalysis Lab, Department of Inorganic Chemistry, School of Science, University of Cádiz , C/República Saharaui, 7, 11510, Puerto Real (Cádiz), Spain
| | - Antonio Cala
- Allelopathy Group, Department of Organic Chemistry, Institute of Biomolecules (INBIO), Campus CEIA3, School of Science, University of Cádiz , C/República Saharaui, 7, 11510, Puerto Real (Cádiz), Spain
| | | | - José M G Molinillo
- Allelopathy Group, Department of Organic Chemistry, Institute of Biomolecules (INBIO), Campus CEIA3, School of Science, University of Cádiz , C/República Saharaui, 7, 11510, Puerto Real (Cádiz), Spain
| | - José J Calvino
- Nanomaterials and Catalysis Lab, Department of Inorganic Chemistry, School of Science, University of Cádiz , C/República Saharaui, 7, 11510, Puerto Real (Cádiz), Spain
| | - Francisco A Macías
- Allelopathy Group, Department of Organic Chemistry, Institute of Biomolecules (INBIO), Campus CEIA3, School of Science, University of Cádiz , C/República Saharaui, 7, 11510, Puerto Real (Cádiz), Spain
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4
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Sato T, Orai Y, Suzuki Y, Ito H, Isshiki T, Fukui M, Nakamura K, Schamp CT. Surface morphology and dislocation characteristics near the surface of 4H-SiC wafer using multi-directional scanning transmission electron microscopy. Microscopy (Oxf) 2017; 66:337-347. [PMID: 29016923 DOI: 10.1093/jmicro/dfx022] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/26/2017] [Accepted: 05/31/2017] [Indexed: 06/07/2023] Open
Abstract
To improve the reliability of silicon carbide (SiC) electronic power devices, the characteristics of various kinds of crystal defects should be precisely understood. Of particular importance is understanding the correlation between the surface morphology and the near surface dislocations. In order to analyze the dislocations near the surface of 4H-SiC wafers, a dislocation analysis protocol has been developed. This protocol consists of the following process: (1) inspection of surface defects using low energy scanning electron microscopy (LESEM), (2) identification of small and shallow etch pits using KOH low temperature etching, (3) classification of etch pits using LESEM, (4) specimen preparation of several hundred nanometer thick sample using the in-situ focused ion beam micro-sampling® technique, (5) crystallographic analysis using the selected diffraction mode of the scanning transmission electron microscope (STEM), and (6) determination of the Burgers vector using multi-directional STEM (MD-STEM). The results show a correlation between the triangular terrace shaped surface defects and an hexagonal etch pit arising from threading dislocations, linear shaped surface defects and elliptical shaped etch pits arising from basal plane dislocations. Through the observation of the sample from two orthogonal directions via the MD-STEM technique, a basal plane dislocation is found to dissociate into an extended dislocation bound by two partial dislocations. A protocol developed and presented in this paper enables one to correlate near surface defects of a 4H-SiC wafer with the root cause dislocations giving rise to those surface defects.
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Affiliation(s)
- Takahiro Sato
- Hitachi High-Technologies Corp. 1040, Ichige, Hitachinaka-shi, Ibaraki, Japan
- Kyoto Institute of Technology, 1, Matsugasaki-hashikamicyo, Sakyo-ku, Kyoto, Japan
| | - Yoshihisa Orai
- Hitachi High-Technologies Corp. 1040, Ichige, Hitachinaka-shi, Ibaraki, Japan
| | - Yuya Suzuki
- Hitachi High-Technologies Corp. 1040, Ichige, Hitachinaka-shi, Ibaraki, Japan
| | - Hiroyuki Ito
- Hitachi High-Technologies Corp. 1040, Ichige, Hitachinaka-shi, Ibaraki, Japan
| | - Toshiyuki Isshiki
- Kyoto Institute of Technology, 1, Matsugasaki-hashikamicyo, Sakyo-ku, Kyoto, Japan
| | - Munetoshi Fukui
- Hitachi High-Technologies Corp. 1040, Ichige, Hitachinaka-shi, Ibaraki, Japan
| | - Kuniyasu Nakamura
- Hitachi High-Technologies Corp. 1040, Ichige, Hitachinaka-shi, Ibaraki, Japan
| | - C T Schamp
- Hitachi High-Technologies Corp. in America, 22610 Gateway Center Dr., Suite 100, Clarksburg, MD, USA
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5
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High-pressure vapor-phase hydrodeoxygenation of lignin-derived oxygenates to hydrocarbons by a PtMo bimetallic catalyst: Product selectivity, reaction pathway, and structural characterization. J Catal 2016. [DOI: 10.1016/j.jcat.2016.10.009] [Citation(s) in RCA: 48] [Impact Index Per Article: 6.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/18/2022]
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6
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Huang HH, Hong Z, Xin HL, Su D, Chen LQ, Huang G, Munroe PR, Valanoor N. Nanoscale Origins of Ferroelastic Domain Wall Mobility in Ferroelectric Multilayers. ACS NANO 2016; 10:10126-10134. [PMID: 27797485 DOI: 10.1021/acsnano.6b05180] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
The nanoscale origins of ferroelastic domain wall motion in ferroelectric multilayer thin films that lead to giant electromechanical responses are investigated. We present direct evidence for complex underpinning factors that result in ferroelastic domain wall mobility using a combination of atomic-level aberration corrected scanning transmission electron microscopy and phase-field simulations in model epitaxial (001) tetragonal (T) PbZrxTi1-xO3 (PZT)/rhombohedral (R) PbZrxTi1-xO3 (PZT) bilayer heterostructures. The local electric dipole distribution is imaged on an atomic scale for a ferroelastic domain wall that nucleates in the R-layer and cuts through the composition breaking the T/R interface. Our studies reveal a highly complex polarization rotation domain structure that is nearly on the knife-edge at the vicinity of this wall. Induced phases, namely tetragonal-like and rhombohedral-like monoclinic were observed close to the interface, and exotic domain arrangements, such as a half-4-fold closure structure, are observed. Phase field simulations show this is due to the minimization of the excessive elastic and electrostatic energies driven by the enormous strain gradient present at the location of the ferroelastic domain walls. Thus, in response to an applied stimulus, such as an electric field, any polarization reorientation must minimize the elastic and electrostatic discontinuities due to this strain gradient, which would induce a dramatic rearrangement of the domain structure. This insight into the origins of ferroelastic domain wall motion will allow researchers to better "craft" such multilayered ferroelectric systems with precisely tailored domain wall functionality and enhanced sensitivity, which can be exploited for the next generation of integrated piezoelectric technologies.
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Affiliation(s)
- Hsin-Hui Huang
- School of Materials Science and Engineering, University of New South Wales , Sydney, New South Wales 2052, Australia
| | - Zijian Hong
- Department of Materials Science and Engineering, Pennsylvania State University , University Park, Pennsylvania 16802-5006, United States
| | - Huolin L Xin
- Center for Functional Nanomaterials, Brookhaven National Laboratory , Upton, New York 11973, United States
| | - Dong Su
- Center for Functional Nanomaterials, Brookhaven National Laboratory , Upton, New York 11973, United States
| | - Long-Qing Chen
- Department of Materials Science and Engineering, Pennsylvania State University , University Park, Pennsylvania 16802-5006, United States
| | - Guanzhong Huang
- Center for Functional Nanomaterials, Brookhaven National Laboratory , Upton, New York 11973, United States
- Department of Materials Science and Engineering, Stony Brook University , Stony Brook, New York 11794-3400, United States
| | - Paul R Munroe
- School of Materials Science and Engineering, University of New South Wales , Sydney, New South Wales 2052, Australia
| | - Nagarajan Valanoor
- School of Materials Science and Engineering, University of New South Wales , Sydney, New South Wales 2052, Australia
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7
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Ciston J, Brown HG, D'Alfonso AJ, Koirala P, Ophus C, Lin Y, Suzuki Y, Inada H, Zhu Y, Allen LJ, Marks LD. Surface determination through atomically resolved secondary-electron imaging. Nat Commun 2015; 6:7358. [PMID: 26082275 PMCID: PMC4557350 DOI: 10.1038/ncomms8358] [Citation(s) in RCA: 33] [Impact Index Per Article: 3.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/03/2014] [Accepted: 04/29/2015] [Indexed: 11/30/2022] Open
Abstract
Unique determination of the atomic structure of technologically relevant surfaces is often limited by both a need for homogeneous crystals and ambiguity of registration between the surface and bulk. Atomically resolved secondary-electron imaging is extremely sensitive to this registration and is compatible with faceted nanomaterials, but has not been previously utilized for surface structure determination. Here we report a detailed experimental atomic-resolution secondary-electron microscopy analysis of the c(6 × 2) reconstruction on strontium titanate (001) coupled with careful simulation of secondary-electron images, density functional theory calculations and surface monolayer-sensitive aberration-corrected plan-view high-resolution transmission electron microscopy. Our work reveals several unexpected findings, including an amended registry of the surface on the bulk and strontium atoms with unusual seven-fold coordination within a typically high surface coverage of square pyramidal TiO5 units. Dielectric screening is found to play a critical role in attenuating secondary-electron generation processes from valence orbitals.
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Affiliation(s)
- J. Ciston
- National Center for Electron Microscopy, The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
| | - H. G. Brown
- School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
| | - A. J. D'Alfonso
- School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
| | - P. Koirala
- Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA
| | - C. Ophus
- National Center for Electron Microscopy, The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
| | - Y. Lin
- Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA
| | - Y. Suzuki
- Application Development Department, Hitachi High Technologies Corp., Ibaraki 312-8504, Japan
| | - H. Inada
- Advanced Microscope Design Department, Hitachi High Technologies Corp., Ibaraki 312-8504, Japan
| | - Y. Zhu
- Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, New York 11973, USA
| | - L. J. Allen
- School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
| | - L. D. Marks
- Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA
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8
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High Speed and Sensitive X-ray Analysis System with Automated Aberration Correction Scanning Transmission Electron Microscope. Appl Microsc 2015. [DOI: 10.9729/am.2015.45.1.1] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022] Open
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9
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Krumeich F, Wörle M, Reibisch P, Nesper R. Characterization of LiBC by phase-contrast scanning transmission electron microscopy. Micron 2014; 63:64-8. [DOI: 10.1016/j.micron.2013.10.012] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/22/2013] [Revised: 10/03/2013] [Accepted: 10/19/2013] [Indexed: 10/26/2022]
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10
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Duarte RB, Safonova OV, Krumeich F, van Bokhoven JA. Atomically dispersed rhodium on a support: the influence of a metal precursor and a support. Phys Chem Chem Phys 2014; 16:26553-60. [DOI: 10.1039/c4cp02596b] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/31/2023]
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11
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Akima H, Yoshida T. Measurement of large low-order aberrations by using a series of through-focus Ronchigrams. Microscopy (Oxf) 2014; 63:325-32. [PMID: 24740798 DOI: 10.1093/jmicro/dfu010] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022] Open
Abstract
A method for measuring large aberrations up to second order (defocus, 2-fold astigmatism and axial coma), which uses a through-focus series of Ronchigrams, is proposed. The method is based on the principle that line-focus conditions in Ronchigrams can be locally detected and low-order aberrations can thereby be measured. The proposed method provides auto-tuning of large low-order aberration; in particular, iterative aberration measurement and correction reduce low-order aberrations from several thousand nanometers to less than a few hundred nanometers, which can be handled by conventional fine-aberration tuning methods.
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Affiliation(s)
- Hisanao Akima
- Central Research Laboratory, Hitachi, Ltd, 1-280 Higashi-Koigakubo, Kokubunji-shi, Tokyo 185-8601, Japan Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
| | - Takaho Yoshida
- Central Research Laboratory, Hitachi, Ltd, 1-280 Higashi-Koigakubo, Kokubunji-shi, Tokyo 185-8601, Japan
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12
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Duarte RB, Krumeich F, van Bokhoven JA. Structure, Activity, and Stability of Atomically Dispersed Rh in Methane Steam Reforming. ACS Catal 2014. [DOI: 10.1021/cs400979q] [Citation(s) in RCA: 54] [Impact Index Per Article: 5.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/30/2023]
Affiliation(s)
- R. B. Duarte
- Institute
for Chemical and Bioengineering, ETH Zurich, 8093 Zurich, Switzerland
| | - F. Krumeich
- Institute
for Chemical and Bioengineering, ETH Zurich, 8093 Zurich, Switzerland
| | - J. A. van Bokhoven
- Institute
for Chemical and Bioengineering, ETH Zurich, 8093 Zurich, Switzerland
- Paul Scherrer Institute, 5232 Villigen, Switzerland
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13
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Krumeich F, Amrute AP, Mondelli C, Pérez-Ramírez J. Structural Changes of a U3O8/ZrO2Catalyst During HCl Oxidation - a HAADF-STEM Study. Z Anorg Allg Chem 2013. [DOI: 10.1002/zaac.201300490] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
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14
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Krumeich F, Müller E, Wepf R. Phase-contrast imaging in aberration-corrected scanning transmission electron microscopy. Micron 2013; 49:1-14. [DOI: 10.1016/j.micron.2013.03.006] [Citation(s) in RCA: 17] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/19/2012] [Revised: 01/17/2013] [Accepted: 03/19/2013] [Indexed: 10/27/2022]
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15
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Detector non-uniformity in scanning transmission electron microscopy. Ultramicroscopy 2013; 124:52-60. [DOI: 10.1016/j.ultramic.2012.09.001] [Citation(s) in RCA: 53] [Impact Index Per Article: 4.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/25/2012] [Revised: 08/24/2012] [Accepted: 09/03/2012] [Indexed: 11/23/2022]
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16
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Amrute AP, Krumeich F, Mondelli C, Pérez-Ramírez J. Depleted uranium catalysts for chlorine production. Chem Sci 2013. [DOI: 10.1039/c3sc22067b] [Citation(s) in RCA: 38] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022] Open
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17
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Wu L, Egerton R, Zhu Y. Image simulation for atomic resolution secondary electron image. Ultramicroscopy 2012; 123:66-73. [DOI: 10.1016/j.ultramic.2012.06.008] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/17/2011] [Revised: 06/11/2012] [Accepted: 06/11/2012] [Indexed: 10/28/2022]
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18
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Krumeich F, Müller E, Wepf R, Conrad M, Reich C, Harbrecht B, Nesper R. The structure of dodecagonal (Ta,V)1.6Te imaged by phase-contrast scanning transmission electron microscopy. J SOLID STATE CHEM 2012. [DOI: 10.1016/j.jssc.2012.04.050] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
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19
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Du W, Mackenzie KE, Milano DF, Deskins NA, Su D, Teng X. Palladium–Tin Alloyed Catalysts for the Ethanol Oxidation Reaction in an Alkaline Medium. ACS Catal 2012. [DOI: 10.1021/cs2005955] [Citation(s) in RCA: 225] [Impact Index Per Article: 18.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
Affiliation(s)
- Wenxin Du
- Department of Chemical Engineering, University of New Hampshire, Durham, New Hampshire
03824, United States
| | - Kayla E. Mackenzie
- Department of Chemical Engineering, University of New Hampshire, Durham, New Hampshire
03824, United States
| | - Daniel F. Milano
- Department of Chemical Engineering, University of New Hampshire, Durham, New Hampshire
03824, United States
| | - N. Aaron Deskins
- Department
of Chemical Engineering, Worcester Polytechnic Institute, Worcester, Massachusetts
01609, United States
| | - Dong Su
- Center
for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York 11973,
United States
| | - Xiaowei Teng
- Department of Chemical Engineering, University of New Hampshire, Durham, New Hampshire
03824, United States
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20
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Wang JX, Ma C, Choi Y, Su D, Zhu Y, Liu P, Si R, Vukmirovic MB, Zhang Y, Adzic RR. Kirkendall Effect and Lattice Contraction in Nanocatalysts: A New Strategy to Enhance Sustainable Activity. J Am Chem Soc 2011; 133:13551-7. [DOI: 10.1021/ja204518x] [Citation(s) in RCA: 236] [Impact Index Per Article: 18.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
Affiliation(s)
| | - Chao Ma
- Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China
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21
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Inada H, Su D, Egerton R, Konno M, Wu L, Ciston J, Wall J, Zhu Y. Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms. Ultramicroscopy 2011; 111:865-76. [DOI: 10.1016/j.ultramic.2010.10.002] [Citation(s) in RCA: 40] [Impact Index Per Article: 3.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/21/2010] [Revised: 09/16/2010] [Accepted: 10/12/2010] [Indexed: 10/18/2022]
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22
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Krumeich F, Marx S, Baiker A, Nesper R. Characterization of AuPd Nanoparticles by Probe-Corrected Scanning Transmission Electron Microscopy and X-ray Absorption Spectroscopy. Z Anorg Allg Chem 2011. [DOI: 10.1002/zaac.201100038] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
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23
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Krumeich F, Müller E, Wepf R, Nesper R. Abbildung und Analytik in einem Strahl-korrigierten STEM. Z Anorg Allg Chem 2010. [DOI: 10.1002/zaac.201008006] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
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24
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25
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Wen J, Mabon J, Lei C, Burdin S, Sammann E, Petrov I, Shah AB, Chobpattana V, Zhang J, Ran K, Zuo JM, Mishina S, Aoki T. The formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the University of Illinois. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2010; 16:183-193. [PMID: 20187990 DOI: 10.1017/s1431927610000085] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
Abstract
We evaluate the probe forming capability of a JEOL 2200FS transmission electron microscope equipped with a spherical aberration (Cs) probe corrector. The achievement of a real space sub-Angstrom (0.1 nm) probe for scanning transmission electron microscopy (STEM) imaging is demonstrated by acquisition and modeling of high-angle annular dark-field STEM images. We show that by optimizing the illumination system, large probe currents and large collection angles for electron energy loss spectroscopy (EELS) can be combined to yield EELS fine structure data spatially resolved to the atomic scale. We demonstrate the probe forming flexibility provided by the additional lenses in the probe corrector in several ways, including the formation of nanometer-sized parallel beams for nanoarea electron diffraction, and the formation of focused probes for convergent beam electron diffraction with a range of convergence angles. The different probes that can be formed using the probe corrected STEM opens up new applications for electron microscopy and diffraction.
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Affiliation(s)
- Jianguo Wen
- University of Illinois at Urbana-Champaign, 61801, USA.
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26
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Scanning moiré fringe imaging by scanning transmission electron microscopy. Ultramicroscopy 2010; 110:229-33. [DOI: 10.1016/j.ultramic.2009.11.015] [Citation(s) in RCA: 65] [Impact Index Per Article: 4.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/28/2009] [Revised: 11/10/2009] [Accepted: 11/18/2009] [Indexed: 11/18/2022]
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Han WQ, Su D, Wu L, Aoki T, Zhu Y. Tri- and quadri-metallic ultrathin nanowires synthesized by one-step phase-transfer approach. NANOTECHNOLOGY 2009; 20:495605. [PMID: 19893144 DOI: 10.1088/0957-4484/20/49/495605] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
Abstract
We synthesized, at room temperature, noble multi-metallic (Pt-Pd-Rh, and Pt-Pd-Au-Rh) ultrathin nanowires using a one-step phase-transfer approach. These multi-metallic nanowires then were characterized by x-ray diffraction, transmission electron microscopy, and scanning transmission electron microscopy. The diameters of the nanowires range from 2 to 2.7 nm, and their lengths from tens to hundreds of nanometers. The multi-metallic nanowires were determined to be face-centered cubic structures. The compositions of the nanowires are quite uniform from wire to wire. Our results verify that the phase-transfer is a robust method for synthesizing various multi-metallic nanowires, which are expected to have potential applications in catalysis, magnetic storage, and bio-sensors.
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Affiliation(s)
- Wei-Qiang Han
- Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY 11973, USA.
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Hitachi's Development of Cold-Field Emission Scanning Transmission Electron Microscopes. ACTA ACUST UNITED AC 2009. [DOI: 10.1016/s1076-5670(09)59004-0] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register]
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