Quantitative annular dark-field imaging of single-layer graphene-II: atomic-resolution image contrast

Different atomic contrasts in HAADF images and EELS maps of rutile TiO2

High-angle annular dark-field (HAADF) imaging and elemental mapping at the atomic scale by scanning transmission electron microscopy (STEM) combined with electron energy-loss spectroscopy (EELS) are widely used for material characterization, in which quantitative understanding of the contrast of the image is required. Here, we report an unexpected image contrast in the elemental mapping of rutile TiO2, where the Ti L2,3 map shows an anisotropic elliptical shape that extends along the long axis in the octahedral structure, while the atomic contrast of Ti columns in the HAADF image is almost circular. Multi-slice simulation reveals that unique electron channeling related to the rutile structure and the difference of the potentials between HAADF and EELS cause the different atomic contrasts in the two images.

Atomic-Scale Dynamics at Solid-Liquid Nanointerfaces Induced by Electron-Beam Irradiation

We report electron-beam induced dynamics at PbS-Pb solid-liquid interfaces. We fabricated PbS-Pb solid-liquid nanointerfaces by heating PbS nanocrystals under vacuum to observe the entire process of structural evolution at the atomic scale. We investigated the dynamics using time-resolved high-angle annular dark-field imaging. Electron-beam irradiation caused layer-by-layer dissolution of PbS at the interface, resulting in the formation of the Pb nanodroplet. Ordered liquid layers were observed adjacent to the interface even under continuous electron-beam irradiation and followed the movement of the interface. Instantaneous epitaxial growth of PbS was observed as a reverse process of the dissolution. The resultant Pb nanodroplet provides indisputable evidence for selective sputtering of sulfur atoms via electron-beam irradiation. This paper demonstrates atomic resolution in situ observations of selective and complete sputtering. The observed dynamics can be explained by the intermittent phase transition via nonequilibrium states of the solid-liquid nanointerface triggered by selective sputtering.

High-Energy Electron Scattering in Thick Samples Evaluated by Bright-Field Transmission Electron Microscopy, Energy-Filtering Transmission Electron Microscopy, and Electron Tomography

Energy-filtering transmission electron microscopy (TEM) and bright-field TEM can be used to extract local sample thickness $t$ and to generate two-dimensional sample thickness maps. Electron tomography can be used to accurately verify the local $t$. The relations of log-ratio of zero-loss filtered energy-filtering TEM beam intensity ($I_{{\rm ZLP}}$) and unfiltered beam intensity ($I_{\rm u}$) versus sample thickness $t$ were measured for five values of collection angle in a microscope equipped with an energy filter. Furthermore, log-ratio of the incident (primary) beam intensity ($I_{\rm p}$) and the transmitted beam $I_{{\rm tr}}$ versus $t$ in bright-field TEM was measured utilizing a camera before the energy filter. The measurements were performed on a multilayer sample containing eight materials and thickness $t$ up to 800 nm. Local thickness $t$ was verified by electron tomography. The following results are reported:• The maximum thickness $t_{{\rm max}}$ yielding a linear relation of log-ratio, $\ln ( {I_{\rm u}}/{I_{{\rm ZLP}}})$ and $\ln ( {I_{\rm p}}/{I_{{\rm tr}}} )$, versus $t$.• Inelastic mean free path ($\lambda _{{\rm in}}$) for five values of collection angle.• Total mean free path ($\lambda _{{\rm total}}$) of electrons excluded by an angle-limiting aperture.• $\lambda _{{\rm in}}$ and $\lambda _{{\rm total}}$ are evaluated for the eight materials with atomic number from $\approx$10 to 79.The results can be utilized as a guide for upper limit of $t$ evaluation in energy-filtering TEM and bright-field TEM and for optimizing electron tomography experiments.

High-endurance micro-engineered LaB6 nanowire electron source for high-resolution electron microscopy

The size tunability and chemical versatility of nanostructures enable electron sources of high brightness and temporal coherence, both of which are important characteristics for high-resolution electron microscopy^1-3. Despite intensive research efforts in the field, so far, only conventional field emitters based on a bulk tungsten (W) needle have been able to yield atomic-resolution images. The absence of viable alternatives is in part caused by insufficient fabrication precision for nanostructured sources, which require an alignment precision of subdegree angular deviation of a nanometre-sized emission area with the macroscopic emitter axis⁴. To overcome this challenge, in this work we micro-engineered a LaB₆ nanowire-based electron source that emitted a highly collimated electron beam with good lateral and angular alignment. We integrated a passive collimator structure into the support needle tip for the LaB₆ nanowire emitter. The collimator formed an axially symmetric electric field around the emission tip of the nanowire. Furthermore, by means of micromanipulation, the support needle tip was bent to align the emitted electron beam with the emitter axis. After installation in an aberration-corrected transmission electron microscope, we characterized the performance of the electron source in a vacuum of 10^-8 Pa and achieved atomic resolution in both broad-beam and probe-forming modes at 60 kV beam energy. The natural, unmonochromated 0.20 eV electron energy loss spectroscopy resolution, 20% probe-forming efficiency and 0.4% probe current peak-to-peak noise ratio paired with modest vacuum requirements make the LaB₆ nanowire-based electron source an attractive alternative to the standard W-based sources for low-cost electron beam instruments.

Atomic-Scale Imaging of a Free-Standing Monolayer Clay Mineral Nanosheet Using Scanning Transmission Electron Microscopy

Although aberration-corrected scanning transmission electron microscope (STEM) enables the atomic-scale visualization of ultrathin 2D materials such as graphene, imaging of electron-beam sensitive 2D materials with structural complexity is an intricate problem. We here report the first atomic-scale imaging of a free-standing monolayer clay mineral nanosheet via the annular dark field (ADF) STEM. The monolayer clay nanosheet was stably observed under optimal conditions, and we confirmed that the hexagonal contrast pattern with a pore of ∼4 Å corresponds to the atomic structure of clay mineral that consisted of adjacent Si, Al, Mg, and O atoms by comparison with simulations. The findings offer the usefulness of ADF-STEM techniques for the atomic scale imaging of clay minerals and various 2D materials having electron-beam sensitivity and structural complexity than few-atom-thick graphene analogues.

Probing Compositional Order in Atomic Columns: STEM Simulations Beyond the Virtual Crystal Approximation

Taking advantage of recent advances in parallel computing, we studied compositional disorder along metal-oxygen atomic columns in a complex Mo,V-oxide bronze using multislice frozen-phonon calculations. Commonly, the virtual crystal approximation (VCA) is used to model compositional disorder at crystallographic sites in a unit cell for a number of different theoretical and experimental techniques. In the VCA, a weighted linear sum of atomic properties is used to approximate the model structure. When using the VCA, the extracted V content of Mo,V-O columns from experimental high-angle annular dark-field (HAADF) images will be about half the V content estimated from simulations, considering the distinct cation ordering. This discrepancy is larger than the spread of HAADF signals of different configurational orders at a given V concentration, which can be up to 20%. Certain "isophilic" atomic arrangements along the column can be distinguished from more random ones using HAADF-STEM imaging. The trends and ratios of the simulated intensity spreads due to different compositional ordering along 11 M-O columns along the c-axis of the Mo,V oxide bronze qualitatively match those observed in experimental HAADF-STEM data. Instrumental and sample-based noise adds to the variability but does not significantly distort the relative ratios of column intensity variation. We observed that we only required seven random configurations to represent the intensity variations along columns.

Distinctive stability of a free-standing monolayer clay mineral nanosheet via transmission electron microscopy

The distinctive stability of the monolayer clay mineral demonstrated by electron diffraction.

Differentiating Polymorphs in Molybdenum Disulfide via Electron Microscopy

The presence of rich polymorphs and stacking polytypes in molybdenum disulfide (MoS₂ ) endows it with a diverse range of electrical, catalytic, optical, and magnetic properties. This has stimulated a lot of interest in the unique properties associated with each polymorph. Most techniques used for polymorph identification in MoS₂ are macroscopic techniques that sample averaged properties due to their limited spatial resolution. A reliable way of differentiating the atomic structure of different polymorphs is needed in order to understand their growth dynamics and establish the correlation between structure and properties. Herein, the use of electron microscopy for identifying the atomic structures of several important polymorphs in MoS₂ , some of which are the subjects of mistaken assignment in the literature, is discussed. In particular, scanning transmission electron microscopy-annular dark field imaging has emerged as the most effective and reliable approach for identifying the different phases in MoS₂ and other 2D materials because its images can be directly correlated to the atomic structures. Examples of the identification of polymorphs grown under different conditions in molecular beam epitaxy or chemical vapor deposition, for example, 3R, 1T, 1T'-phases, and 1T'-edges, are presented, including their atomic structures, fascinating properties, growth methods, and corresponding thermodynamic stabilities.

Atomic number dependence of Z contrast in scanning transmission electron microscopy

Annular dark-field (ADF) imaging by scanning transmission electron microscopy (STEM) is a common technique for material characterization with high spatial resolution. It has been reported that ADF signal is proportional to the nth power of the atomic number Z, i.e., the Z contrast in textbooks and papers. Here we first demonstrate the deviation from the power-law model by quantitative experiments of a few 2D materials (graphene, MoS₂ and WS₂ monolayers). Then we elucidate ADF signal of single atoms using simulations to clarify the cause of the deviation. Two major causes of the deviation from the power-law model will be pointed out. The present study provides a practical guideline for the usage of the conventional power-law model for ADF imaging.

Rapid measurement of low-order aberrations using Fourier transforms of crystalline Ronchigrams

The aberrations of the objective lens should be measured and adjusted to realize high spatial resolution in scanning transmission electron microscopy (STEM). Here we report a method of measuring low-order aberrations using the Fourier transforms of Ronchigrams of an arbitrary crystal such as a specimen of interest. We have applied this technique to measure first- and second-order geometrical aberrations using typical standard specimens. Focus and twofold astigmatism are measured using two Ronchigrams obtained under different foci. Axial coma and threefold astigmatism are evaluated using the Fourier transforms of small subareas of a Ronchigram. The time dependences of focus and twofold astigmatism are examined using this technique for an aberration-corrected microscope.

Microscopic observation of dye molecules for solar cells on a titania surface

The lateral distribution and coverage of Ru-based dye molecules, which are used for dye-sensitized solar cells (DSCs), were directly examined on a titania surface using high-resolution scanning transmission electron microscopy (STEM). The clean surface of a free-standing titania nanosheet was first confirmed with atomic resolution, and then, the nanosheet was used as a substrate. A single dye molecule on the titania nanosheet was visualized for the first time. The quantitative STEM images revealed an inhomogeneous dye-molecule distribution at the early stage of its absorption, i.e., the aggregation of the dye molecules. The majority of the titania surface was not covered by dye molecules, suggesting that optimization of the dye molecule distribution could yield further improvement of the DSC conversion efficiencies.

Atomically resolved structure of ligand-protected Au9 clusters on TiO2 nanosheets using aberration-corrected STEM

Triphenylphosphine ligand-protected Au9 clusters deposited onto titania nanosheets show three different atomic configurations as observed by scanning transmission electron microscopy. The configurations observed are a 3-dimensional structure, corresponding to the previously proposed Au9 core of the clusters, and two pseudo-2-dimensional (pseudo-2D) structures, newly found by this work. With the help of density functional theory (DFT) calculations, the observed pseudo-2D structures are attributed to the low energy, de-ligated structures formed through interaction with the substrate. The combination of scanning transmission electron microscopy with DFT calculations thus allows identifying whether or not the deposited Au9 clusters have been de-ligated in the deposition process.