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Moradifar P, Liu Y, Shi J, Siukola Thurston ML, Utzat H, van Driel TB, Lindenberg AM, Dionne JA. Accelerating Quantum Materials Development with Advances in Transmission Electron Microscopy. Chem Rev 2023. [PMID: 37979189 DOI: 10.1021/acs.chemrev.2c00917] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/20/2023]
Abstract
Quantum materials are driving a technology revolution in sensing, communication, and computing, while simultaneously testing many core theories of the past century. Materials such as topological insulators, complex oxides, superconductors, quantum dots, color center-hosting semiconductors, and other types of strongly correlated materials can exhibit exotic properties such as edge conductivity, multiferroicity, magnetoresistance, superconductivity, single photon emission, and optical-spin locking. These emergent properties arise and depend strongly on the material's detailed atomic-scale structure, including atomic defects, dopants, and lattice stacking. In this review, we describe how progress in the field of electron microscopy (EM), including in situ and in operando EM, can accelerate advances in quantum materials and quantum excitations. We begin by describing fundamental EM principles and operation modes. We then discuss various EM methods such as (i) EM spectroscopies, including electron energy loss spectroscopy (EELS), cathodoluminescence (CL), and electron energy gain spectroscopy (EEGS); (ii) four-dimensional scanning transmission electron microscopy (4D-STEM); (iii) dynamic and ultrafast EM (UEM); (iv) complementary ultrafast spectroscopies (UED, XFEL); and (v) atomic electron tomography (AET). We describe how these methods could inform structure-function relations in quantum materials down to the picometer scale and femtosecond time resolution, and how they enable precision positioning of atomic defects and high-resolution manipulation of quantum materials. For each method, we also describe existing limitations to solve open quantum mechanical questions, and how they might be addressed to accelerate progress. Among numerous notable results, our review highlights how EM is enabling identification of the 3D structure of quantum defects; measuring reversible and metastable dynamics of quantum excitations; mapping exciton states and single photon emission; measuring nanoscale thermal transport and coupled excitation dynamics; and measuring the internal electric field and charge density distribution of quantum heterointerfaces- all at the quantum materials' intrinsic atomic and near atomic-length scale. We conclude by describing open challenges for the future, including achieving stable sample holders for ultralow temperature (below 10K) atomic-scale spatial resolution, stable spectrometers that enable meV energy resolution, and high-resolution, dynamic mapping of magnetic and spin fields. With atomic manipulation and ultrafast characterization enabled by EM, quantum materials will be poised to integrate into many of the sustainable and energy-efficient technologies needed for the 21st century.
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Affiliation(s)
- Parivash Moradifar
- Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States
| | - Yin Liu
- Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States
- Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695, United States
| | - Jiaojian Shi
- Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States
- SLAC National Accelerator Laboratory, 2575 Sand Hill Road MS69, Menlo Park, California 94025, United States
| | | | - Hendrik Utzat
- Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States
- Department of Chemistry, University of California Berkeley, Berkeley, California 94720, United States
| | - Tim B van Driel
- Linac Coherent Light Source, SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025, United States
| | - Aaron M Lindenberg
- Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States
- SLAC National Accelerator Laboratory, 2575 Sand Hill Road MS69, Menlo Park, California 94025, United States
| | - Jennifer A Dionne
- Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States
- Department of Radiology, Stanford University, Stanford, California 94305, United States
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Egerton R, Watanabe M. Spatial Resolution in Transmission Electron Microscopy. Micron 2022; 160:103304. [DOI: 10.1016/j.micron.2022.103304] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/28/2022] [Revised: 05/05/2022] [Accepted: 05/19/2022] [Indexed: 10/18/2022]
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OUP accepted manuscript. Microscopy (Oxf) 2022; 71:i174-i199. [DOI: 10.1093/jmicro/dfab050] [Citation(s) in RCA: 7] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/30/2021] [Revised: 11/20/2021] [Accepted: 01/28/2022] [Indexed: 11/14/2022] Open
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Venkatraman K, Crozier PA. Role of Convergence and Collection Angles in the Excitation of Long- and Short-Wavelength Phonons with Vibrational Electron Energy-Loss Spectroscopy. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2021; 27:1-9. [PMID: 34172104 DOI: 10.1017/s1431927621012034] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/13/2023]
Abstract
Current generation electron monochromators employed as attachments to scanning transmission electron microscopes (STEM) offer the ability to obtain vibrational information from materials using electron energy-loss spectroscopy (EELS). We show here that in crystals, long- and short-wavelength phonon modes can be probed simultaneously with on-axis vibrational STEM EELS. The long-wavelength phonons are probed via dipole scattering, while the short-wavelength modes are probed via impact scattering of the incident electrons. The localized character of the short-wavelength modes is demonstrated by scanning the electron beam across the edge of a hexagonal boron nitride nanoparticle. It is found that employing convergence angles that encompass multiple Brillouin zone boundaries enhances the short-wavelength phonon contribution to the vibrational energy-loss spectrum much more than that achieved by employing collection angles that encompass multiple Brillouin zone boundaries. Probing short-wavelength phonons at high spatial resolution with on-axis vibrational STEM EELS will help develop a fundamental connection between vibrational excitations and bonding arrangements at atomic-scale heterogeneities in materials.
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Affiliation(s)
- Kartik Venkatraman
- School for the Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ85287, USA
| | - Peter A Crozier
- School for the Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ85287, USA
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Yan X, Liu C, Gadre CA, Gu L, Aoki T, Lovejoy TC, Dellby N, Krivanek OL, Schlom DG, Wu R, Pan X. Single-defect phonons imaged by electron microscopy. Nature 2021; 589:65-69. [DOI: 10.1038/s41586-020-03049-y] [Citation(s) in RCA: 58] [Impact Index Per Article: 19.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/27/2019] [Accepted: 10/07/2020] [Indexed: 11/09/2022]
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Collins SM, Kepaptsoglou DM, Hou J, Ashling CW, Radtke G, Bennett TD, Midgley PA, Ramasse QM. Functional Group Mapping by Electron Beam Vibrational Spectroscopy from Nanoscale Volumes. NANO LETTERS 2020; 20:1272-1279. [PMID: 31944111 DOI: 10.1021/acs.nanolett.9b04732] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
Vibrational spectroscopies directly record details of bonding in materials, but spatially resolved methods have been limited to surface techniques for mapping functional groups at the nanoscale. Electron energy loss spectroscopy (EELS) in the scanning transmission electron microscope presents a route to functional group analysis from nanoscale volumes using transmitted subnanometer electron probes. Here, we now use vibrational EELS to map distinct carboxylate and imidazolate linkers in a metal-organic framework (MOF) crystal-glass composite material. Domains <100 nm in size are observed using vibrational EELS, with recorded spatial resolution <15 nm at interfaces in the composite. This nanoscale functional group mapping is confirmed by correlated EELS at core ionization edges as well as X-ray energy dispersive spectroscopy for elemental mapping of the metal centers of the two constituent MOFs. These results present a complete nanoscale analysis of the building blocks of the MOF composite and establish spatially resolved functional group analysis using electron beam spectroscopy for crystalline and amorphous organic and metal-organic solids.
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Affiliation(s)
- Sean M Collins
- Department of Materials Science and Metallurgy , University of Cambridge , 27 Charles Babbage Road , Cambridge CB3 0FS , United Kingdom
| | - Demie M Kepaptsoglou
- SuperSTEM Laboratory , SciTech Daresbury Campus , Daresbury WA4 4AD , United Kingdom
- Department of Physics , University of York , Heslington, York YO10 5DD , United Kingdom
| | - Jingwei Hou
- Department of Materials Science and Metallurgy , University of Cambridge , 27 Charles Babbage Road , Cambridge CB3 0FS , United Kingdom
| | - Christopher W Ashling
- Department of Materials Science and Metallurgy , University of Cambridge , 27 Charles Babbage Road , Cambridge CB3 0FS , United Kingdom
| | - Guillaume Radtke
- Sorbonne Université, Muséum National d'Histoire Naturelle, UMR CNRS 7590, IRD, Institut de Minéralogie, de Physique des Matériaux et de Cosmochimie, IMPMC , 75005 Paris , France
| | - Thomas D Bennett
- Department of Materials Science and Metallurgy , University of Cambridge , 27 Charles Babbage Road , Cambridge CB3 0FS , United Kingdom
| | - Paul A Midgley
- Department of Materials Science and Metallurgy , University of Cambridge , 27 Charles Babbage Road , Cambridge CB3 0FS , United Kingdom
| | - Quentin M Ramasse
- SuperSTEM Laboratory , SciTech Daresbury Campus , Daresbury WA4 4AD , United Kingdom
- School of Chemical and Process Engineering and School of Physics , University of Leeds , Leeds LS2 9JT , United Kingdom
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Zachman MJ, Hachtel JA, Idrobo JC, Chi M. Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials. Angew Chem Int Ed Engl 2019. [DOI: 10.1002/ange.201902993] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
Affiliation(s)
- Michael J. Zachman
- Center for Nanophase Materials Sciences Oak Ridge National Laboratory Oak Ridge TN 37831 USA
| | - Jordan A. Hachtel
- Center for Nanophase Materials Sciences Oak Ridge National Laboratory Oak Ridge TN 37831 USA
| | - Juan Carlos Idrobo
- Center for Nanophase Materials Sciences Oak Ridge National Laboratory Oak Ridge TN 37831 USA
| | - Miaofang Chi
- Center for Nanophase Materials Sciences Oak Ridge National Laboratory Oak Ridge TN 37831 USA
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Zachman MJ, Hachtel JA, Idrobo JC, Chi M. Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials. Angew Chem Int Ed Engl 2019; 59:1384-1396. [PMID: 31081976 DOI: 10.1002/anie.201902993] [Citation(s) in RCA: 10] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/10/2019] [Revised: 05/01/2019] [Indexed: 11/10/2022]
Abstract
Interfaces play a fundamental role in many areas of chemistry. However, their localized nature requires characterization techniques with high spatial resolution in order to fully understand their structure and properties. State-of-the-art atomic resolution or in situ scanning transmission electron microscopy and electron energy-loss spectroscopy are indispensable tools for characterizing the local structure and chemistry of materials with single-atom resolution, but they are not able to measure many properties that dictate function, such as vibrational modes or charge transfer, and are limited to room-temperature samples containing no liquids. Here, we outline emerging electron microscopy techniques that are allowing these limitations to be overcome and highlight several recent studies that were enabled by these techniques. We then provide a vision for how these techniques can be paired with each other and with in situ methods to deliver new insights into the static and dynamic behavior of functional interfaces.
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Affiliation(s)
- Michael J Zachman
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Jordan A Hachtel
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Juan Carlos Idrobo
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Miaofang Chi
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
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Konečná A, Neuman T, Aizpurua J, Hillenbrand R. Surface-Enhanced Molecular Electron Energy Loss Spectroscopy. ACS NANO 2018; 12:4775-4786. [PMID: 29641179 DOI: 10.1021/acsnano.8b01481] [Citation(s) in RCA: 17] [Impact Index Per Article: 2.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
Electron energy loss spectroscopy (EELS) in a scanning transmission electron microscope (STEM) is becoming an important technique in spatially resolved spectral characterization of optical and vibrational properties of matter at the nanoscale. EELS has played a significant role in understanding localized polaritonic excitations in nanoantennas and also allows for studying molecular excitations in nanoconfined samples. Here we theoretically describe the interaction of a localized electron beam with molecule-covered polaritonic nanoantennas, and propose the concept of surface-enhanced molecular EELS exploiting the electromagnetic coupling between the nanoantenna and the molecular sample. Particularly, we study plasmonic and infrared phononic antennas covered by molecular layers, exhibiting either an excitonic or vibrational response. We demonstrate that EEL spectra of these molecule-antenna coupled systems exhibit Fano-like or strong coupling features, similar to the ones observed in far-field optical and infrared spectroscopy. EELS offers the advantage to acquire spectral information with nanoscale spatial resolution, and importantly, to control the antenna-molecule coupling on demand. Considering ongoing instrumental developments, EELS in STEM shows the potential to become a powerful tool for fundamental studies of molecules that are naturally or intentionally located on nanostructures supporting localized plasmon or phonon polaritons. Surface-enhanced EELS might also enable STEM-EELS applications such as remote- and thus damage-free-sensing of the excitonic and vibrational response of molecules, quantum dots, or 2D materials.
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Affiliation(s)
- Andrea Konečná
- Materials Physics Center, CSIC-UPV/EHU , Donostia-San Sebastián , 20018 , Spain
| | - Tomáš Neuman
- Materials Physics Center, CSIC-UPV/EHU , Donostia-San Sebastián , 20018 , Spain
| | - Javier Aizpurua
- Materials Physics Center, CSIC-UPV/EHU , Donostia-San Sebastián , 20018 , Spain
- Donostia International Physics Center DIPC , Donostia-San Sebastián , 20018 , Spain
| | - Rainer Hillenbrand
- IKERBASQUE, Basque Foundation for Science , Bilbao , 48013 , Spain
- CIC NanoGUNE and UPV/EHU , Donostia-San Sebastián , 20018 , Spain
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