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For: Wu C, Ma K, Chen W, Li J, Liu M, Cheng P, Wang B, Li Q. Identification and Molecular Mapping of the Gene YrFL in Wheat Cultivar Flanders with Durable Resistance to Stripe Rust. Plant Dis 2023;107:2716-2723. [PMID: 36774583 DOI: 10.1094/pdis-11-22-2683-re] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/18/2023]
Number Cited by Other Article(s)
1
Wang H, Wang Y, Liu J, Zhang H, He R, Yang F, Guo Y, Bai B. A Combination of Resistance Genes Confers High and Durable Resistance Against Stripe Rust in Wheat Cultivar Lantian 26. PLANT DISEASE 2024;108:2550-2557. [PMID: 38587804 DOI: 10.1094/pdis-01-24-0137-re] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/09/2024]
2
Ren J, Chen L, Liu J, Zhou B, Sha Y, Hu G, Peng J. Transcriptomic insights into the molecular mechanism for response of wild emmer wheat to stripe rust fungus. FRONTIERS IN PLANT SCIENCE 2024;14:1320976. [PMID: 38235210 PMCID: PMC10791934 DOI: 10.3389/fpls.2023.1320976] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 10/13/2023] [Accepted: 12/07/2023] [Indexed: 01/19/2024]
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